乐胖代购免代理版

{"id":"https://openalex.org/W2169286703","doi":"https://doi.org/10.1109/iscsct.2008.133","title":"Winner Trace Marking in Self-Organizing Neural Network for Classification","display_name":"Winner Trace Marking in Self-Organizing Neural Network for Classification","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W2169286703","doi":"https://doi.org/10.1109/iscsct.2008.133","mag":"2169286703"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscsct.2008.133","pdf_url":null,"source":{"id":"https://openalex.org/S4306420116","display_name":"International Symposium on Computer Science and Computational Technology","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100319195","display_name":"Yonghui Wang","orcid":"https://orcid.org/0000-0001-9995-5904"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yonghui Wang","raw_affiliation_strings":["[Northeastern Univ., Shenyang, China]"],"affiliations":[{"raw_affiliation_string":"[Northeastern Univ., Shenyang, China]","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043667109","display_name":"Yunhui Yan","orcid":"https://orcid.org/0000-0001-7121-2367"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunhui Yan","raw_affiliation_strings":["[Northeastern Univ., Shenyang, China]"],"affiliations":[{"raw_affiliation_string":"[Northeastern Univ., Shenyang, China]","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030530349","display_name":"Yanping Wu","orcid":"https://orcid.org/0000-0002-9003-1577"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanping Wu","raw_affiliation_strings":["[Northeastern Univ., Shenyang, China]"],"affiliations":[{"raw_affiliation_string":"[Northeastern Univ., Shenyang, China]","institution_ids":["https://openalex.org/I9224756"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.716,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":4,"citation_normalized_percentile":{"value":0.479122,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":76,"max":78},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9927,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9927,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","score":0.9921,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9905,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trace","display_name":"TRACE (psycholinguistics)","score":0.60399455},{"id":"https://openalex.org/keywords/contextual-image-classification","display_name":"Contextual image classification","score":0.43584758}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7928276},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.6045692},{"id":"https://openalex.org/C75291252","wikidata":"https://www.wikidata.org/wiki/Q1315756","display_name":"TRACE (psycholinguistics)","level":2,"score":0.60399455},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6038335},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.57966065},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5526416},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.48226672},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.46126822},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.44264215},{"id":"https://openalex.org/C75294576","wikidata":"https://www.wikidata.org/wiki/Q5165192","display_name":"Contextual image classification","level":3,"score":0.43584758},{"id":"https://openalex.org/C33676613","wikidata":"https://www.wikidata.org/wiki/Q13415176","display_name":"Dimension (graph theory)","level":2,"score":0.42666894},{"id":"https://openalex.org/C70518039","wikidata":"https://www.wikidata.org/wiki/Q16000077","display_name":"Dimensionality reduction","level":2,"score":0.41429868},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.35934725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1156733},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.11286536},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscsct.2008.133","pdf_url":null,"source":{"id":"https://openalex.org/S4306420116","display_name":"International Symposium on Computer Science and Computational Technology","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":19,"referenced_works":["https://openalex.org/W1522183152","https://openalex.org/W1588022612","https://openalex.org/W1964739103","https://openalex.org/W2001366125","https://openalex.org/W2023087857","https://openalex.org/W2039964137","https://openalex.org/W2048071570","https://openalex.org/W2061469806","https://openalex.org/W2081571690","https://openalex.org/W2089347015","https://openalex.org/W2093901628","https://openalex.org/W2101961008","https://openalex.org/W2118348777","https://openalex.org/W2154780917","https://openalex.org/W2160544350","https://openalex.org/W2357948141","https://openalex.org/W2374036475","https://openalex.org/W49585132","https://openalex.org/W65738273"],"related_works":["https://openalex.org/W4247954915","https://openalex.org/W3176621072","https://openalex.org/W2357130048","https://openalex.org/W2336747664","https://openalex.org/W2273754158","https://openalex.org/W2162970382","https://openalex.org/W2131958170","https://openalex.org/W2061122711","https://openalex.org/W2005234362","https://openalex.org/W1997235926"],"abstract_inverted_index":{"The":[0,27,55,91,122,131,141],"classification":[1],"for":[2],"similar":[3],"features":[4],"classes":[5],"is":[6,20,25,47,58,94,117,124],"quite":[7],"difficult":[8],"task":[9],"in":[10,35,71],"many":[11],"existing":[12],"pattern-recognition":[13],"systems.":[14],"When":[15],"the":[16,43,51,73,103],"amount":[17],"of":[18],"samples":[19],"insufficient,":[21],"neural":[22],"networking":[23],"training":[24,104],"hard.":[26],"dimension":[28],"reduction,":[29],"classification,":[30],"clustering":[31],"etc":[32],"serial":[33],"steps":[34],"recognition":[36],"process":[37],"takes":[38],"such":[39],"much":[40],"time":[41,53,129],"that":[42],"practical":[44],"recognizing":[45,106],"application":[46],"ease":[48],"to":[49],"meet":[50],"real":[52],"requirement.":[54],"new":[56],"method":[57],"looking":[59],"forward":[60],"to.":[61],"This":[62],"paper":[63],"presents":[64],"a":[65,114],"fast,":[66],"simple":[67],"and":[68,78,105,110],"robust":[69],"classifier,":[70],"which":[72],"winner":[74],"has":[75],"been":[76],"traced":[77],"marked":[79],"during":[80],"entire":[81],"training.":[82],"We":[83],"named":[84],"it":[85],"as":[86],"Winner":[87],"Trace":[88],"Marking":[89],"(WTM).":[90],"basic":[92],"structure":[93],"based":[95],"on":[96],"self":[97],"organizing":[98],"feather":[99],"map":[100],"(SOFM),":[101],"but":[102],"rules":[107],"are":[108,139,143],"changed":[109],"optimized.":[111],"By":[112],"WTM,":[113],"significant":[115],"improvement":[116],"reached":[118],"about":[119],"above":[120],"problems.":[121],"accuracy":[123],"highly":[125],"increased":[126],"with":[127],"less":[128],"consumption.":[130],"experiment":[132],"classifying":[133],"strip":[134],"surface":[135],"defects":[136],"by":[137],"WTM":[138],"presented.":[140],"results":[142],"satisfactory.":[144]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2169286703","counts_by_year":[{"year":2022,"cited_by_count":3}],"updated_date":"2024-12-13T04:26:13.274391","created_date":"2016-06-24"}