{"id":"https://openalex.org/W1579744993","doi":"https://doi.org/10.1109/iscas.1994.409400","title":"Interlaced sampling for noise reduction","display_name":"Interlaced sampling for noise reduction","publication_year":2002,"publication_date":"2002-12-17","ids":{"openalex":"https://openalex.org/W1579744993","doi":"https://doi.org/10.1109/iscas.1994.409400","mag":"1579744993"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.1994.409400","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044987841","display_name":"V. Uhlemann","orcid":null},"institutions":[{"id":"https://openalex.org/I4923324","display_name":"Fraunhofer Society","ror":"https://ror.org/05hkkdn48","country_code":"DE","type":"government","lineage":["https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"V. Uhlemann","raw_affiliation_strings":["Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany#TAB#","institution_ids":["https://openalex.org/I4923324"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042676691","display_name":"B.J. Hosticka","orcid":null},"institutions":[{"id":"https://openalex.org/I4923324","display_name":"Fraunhofer Society","ror":"https://ror.org/05hkkdn48","country_code":"DE","type":"government","lineage":["https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B.J. Hosticka","raw_affiliation_strings":["Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany#TAB#","institution_ids":["https://openalex.org/I4923324"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008175199","display_name":"W. Brockherde","orcid":"https://orcid.org/0000-0002-1952-5646"},"institutions":[{"id":"https://openalex.org/I4923324","display_name":"Fraunhofer Society","ror":"https://ror.org/05hkkdn48","country_code":"DE","type":"government","lineage":["https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W. Brockherde","raw_affiliation_strings":["Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany#TAB#","institution_ids":["https://openalex.org/I4923324"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":57},"biblio":{"volume":"5","issue":null,"first_page":"425","last_page":"428"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9994,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.998,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/realization","display_name":"Realization (probability)","score":0.7086774}],"concepts":[{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.7443498},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.72298753},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.71959746},{"id":"https://openalex.org/C2781089630","wikidata":"https://www.wikidata.org/wiki/Q21856745","display_name":"Realization (probability)","level":2,"score":0.7086774},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6834238},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.59695184},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5017791},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44735065},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.39709494},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.32172406},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.31483793},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2966501},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26795143},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.16392562},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1616508},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15182716},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13015664},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.1994.409400","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.61,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":8,"referenced_works":["https://openalex.org/W1486196596","https://openalex.org/W1564201208","https://openalex.org/W1964733699","https://openalex.org/W2037608697","https://openalex.org/W2060112945","https://openalex.org/W2147954194","https://openalex.org/W2160005606","https://openalex.org/W3147616483"],"related_works":["https://openalex.org/W4235249401","https://openalex.org/W3014521742","https://openalex.org/W2769996735","https://openalex.org/W2394097730","https://openalex.org/W2389800961","https://openalex.org/W2331305369","https://openalex.org/W2260963831","https://openalex.org/W2043523297","https://openalex.org/W2022544890","https://openalex.org/W1995389502"],"abstract_inverted_index":{"New":[0],"algorithms":[1],"called":[2],"interlaced-correlated-double":[3],"and":[4],"triple-sampling":[5],"are":[6,17],"presented":[7],"that":[8],"perform":[9],"noise":[10,26],"reduction":[11,27],"in":[12],"analog":[13],"discrete-time":[14],"circuits.":[15],"Both":[16],"based":[18],"on":[19],"multiple":[20],"correlated-double-sampling":[21],"principle.":[22],"Theoretical":[23],"improvement":[24],"of":[25,40],"has":[28],"been":[29],"verified":[30],"using":[31],"computer":[32],"simulations.":[33],"The":[34],"contribution":[35],"also":[36],"discusses":[37],"CMOS":[38],"realization":[39],"the":[41],"proposed":[42],"method.<":[43],">":[46]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1579744993","counts_by_year":[],"updated_date":"2024-12-13T02:01:13.362060","created_date":"2016-06-24"}