乐胖代购免代理版

{"id":"https://openalex.org/W1575359301","doi":"https://doi.org/10.1109/iscas.1994.409343","title":"Principles of nonlinearity cancellation in linear MOS systems using MRC circuits","display_name":"Principles of nonlinearity cancellation in linear MOS systems using MRC circuits","publication_year":2002,"publication_date":"2002-12-17","ids":{"openalex":"https://openalex.org/W1575359301","doi":"https://doi.org/10.1109/iscas.1994.409343","mag":"1575359301"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.1994.409343","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109541195","display_name":"Z. Czarnul","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Z. Czarnul","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019467704","display_name":"S. Takagi","orcid":"https://orcid.org/0000-0002-2087-6937"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Takagi","raw_affiliation_strings":["Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065044584","display_name":"Nobuo Fujii","orcid":"https://orcid.org/0009-0002-2960-2964"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N. Fujii","raw_affiliation_strings":["Tokyo Institute of Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Tokyo Institute of Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083243872","display_name":"Takuya Iida","orcid":"https://orcid.org/0000-0003-1313-7025"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Iida","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025926397","display_name":"Takufumi Yanagisawa","orcid":"https://orcid.org/0000-0002-2057-0612"},"institutions":[{"id":"https://openalex.org/I171481255","display_name":"Shibaura Institute of Technology","ror":"https://ror.org/020wjcq07","country_code":"JP","type":"education","lineage":["https://openalex.org/I171481255"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Yanagisawa","raw_affiliation_strings":["Shibaura Institute of Technology, Omiya, Japan"],"affiliations":[{"raw_affiliation_string":"Shibaura Institute of Technology, Omiya, Japan","institution_ids":["https://openalex.org/I171481255"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.378,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":2,"citation_normalized_percentile":{"value":0.284151,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":64,"max":68},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9984,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9984,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9661,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9648,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.46337572}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.600834},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5403396},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.52979535},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.46337572},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43946096},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24052384},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23768306},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.084056854},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.1994.409343","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":10,"referenced_works":["https://openalex.org/W1533614470","https://openalex.org/W1988577797","https://openalex.org/W2029232649","https://openalex.org/W2050648445","https://openalex.org/W2063569974","https://openalex.org/W2099614023","https://openalex.org/W2103925328","https://openalex.org/W2141251689","https://openalex.org/W2154326304","https://openalex.org/W2297021476"],"related_works":["https://openalex.org/W4241196849","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2382290278","https://openalex.org/W2376932109","https://openalex.org/W2375192119","https://openalex.org/W2358668433","https://openalex.org/W2350741829","https://openalex.org/W2125292608","https://openalex.org/W2001405890"],"abstract_inverted_index":{"The":[0,14],"general":[1],"principles":[2],"of":[3,16],"nonlinearity":[4],"cancellation":[5],"in":[6],"MOS":[7],"systems":[8],"with":[9],"MRC":[10],"circuits":[11],"are":[12],"presented.":[13],"application":[15],"this":[17],"technique":[18],"is":[19],"investigated":[20],"for":[21],"MOST-only":[22],"digital-analog":[23],"converter":[24],"implementation.<":[25],">":[28]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1575359301","counts_by_year":[],"updated_date":"2025-01-18T23:40:30.238133","created_date":"2016-06-24"}