{"id":"https://openalex.org/W1522786673","doi":"https://doi.org/10.1109/iscas.1994.409300","title":"Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements","display_name":"Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements","publication_year":2002,"publication_date":"2002-12-17","ids":{"openalex":"https://openalex.org/W1522786673","doi":"https://doi.org/10.1109/iscas.1994.409300","mag":"1522786673"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.1994.409300","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076153845","display_name":"D.K. Papakostas","orcid":null},"institutions":[{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"D.K. Papakostas","raw_affiliation_strings":["[Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece]","institution_ids":["https://openalex.org/I21370196"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009584271","display_name":"Alkis A. Hatzopoulos","orcid":"https://orcid.org/0000-0002-4030-8355"},"institutions":[{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"A.A. Hatzopoulos","raw_affiliation_strings":["[Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece]"],"affiliations":[{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece]","institution_ids":["https://openalex.org/I21370196"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.561,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":6,"citation_normalized_percentile":{"value":0.529263,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":75,"max":76},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6030368},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.59004676},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5848958},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.54705125},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.49700597},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.49558103},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4771385},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46599948},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35113657},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32340872},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28196138},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17850512},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13481528},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09133199},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.1994.409300","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.82,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":8,"referenced_works":["https://openalex.org/W1988407149","https://openalex.org/W2003654230","https://openalex.org/W2063588247","https://openalex.org/W2064288918","https://openalex.org/W2091353536","https://openalex.org/W2106816366","https://openalex.org/W2111156521","https://openalex.org/W4232637718"],"related_works":["https://openalex.org/W4368618351","https://openalex.org/W4318692582","https://openalex.org/W4244464241","https://openalex.org/W2384573129","https://openalex.org/W2358945257","https://openalex.org/W2351224547","https://openalex.org/W2006863447","https://openalex.org/W1993133085","https://openalex.org/W1982412832","https://openalex.org/W1897942310"],"abstract_inverted_index":{"Fault":[0],"detection":[1],"in":[2,35,56],"linear":[3,37],"bipolar":[4],"integrated":[5],"circuits":[6],"using":[7],"power":[8,44],"supply":[9,45],"current":[10,46,64],"measurements":[11,50],"is":[12,33],"investigated.":[13],"The":[14,31],"most":[15],"prevalent,":[16],"catastrophic":[17],"and":[18,38,47],"parametric":[19],"faults,":[20],"have":[21],"been":[22],"modelled":[23],"for":[24],"the":[25,54,60,63],"representative":[26],"(741":[27],"type)":[28],"op":[29],"amp.":[30],"circuit":[32],"simulated":[34],"both":[36],"non-linear":[39],"operations.":[40],"Comparative":[41],"results":[42],"between":[43],"output":[48],"voltage":[49],"are":[51],"given,":[52],"showing":[53],"improvement":[55],"fault":[57],"coverage":[58],"by":[59],"use":[61],"of":[62],"sensing":[65],"method.<":[66],">":[69]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1522786673","counts_by_year":[],"updated_date":"2025-01-18T11:34:19.532754","created_date":"2016-06-24"}