{"id":"https://openalex.org/W4396949786","doi":"https://doi.org/10.1109/irps48228.2024.10529344","title":"Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited)","display_name":"Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited)","publication_year":2024,"publication_date":"2024-04-14","ids":{"openalex":"https://openalex.org/W4396949786","doi":"https://doi.org/10.1109/irps48228.2024.10529344"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48228.2024.10529344","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086771285","display_name":"Kasidit Toprasertpong","orcid":"https://orcid.org/0000-0003-4206-8698"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kasidit Toprasertpong","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060939937","display_name":"Eishin Nako","orcid":"https://orcid.org/0000-0002-2675-0315"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Eishin Nako","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003630133","display_name":"Shin-Yi Min","orcid":"https://orcid.org/0000-0001-7345-2516"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shin-Yi Min","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112600641","display_name":"Zuocheng Cai","orcid":null},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Zuocheng Cai","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109716856","display_name":"Seong-Kun Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Seong-Kun Cho","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016412890","display_name":"Rikuo Suzuki","orcid":"https://orcid.org/0009-0003-9335-6101"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Rikuo Suzuki","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085544355","display_name":"Ryosho Nakane","orcid":"https://orcid.org/0000-0002-9059-9349"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryosho Nakane","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025650947","display_name":"Mitsuru Takenaka","orcid":"https://orcid.org/0000-0002-9852-1474"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsuru Takenaka","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042410367","display_name":"Shinichi Takagi","orcid":"https://orcid.org/0000-0002-5601-2604"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shinichi Takagi","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.884,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.999574,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":84,"max":92},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12611","display_name":"Neural Networks and Reservoir Computing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12611","display_name":"Neural Networks and Reservoir Computing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness","score":0.8004659},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation","score":0.6447545}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.8004659},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6447545},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6318907},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6167501},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.26607358},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.17679551},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0975796},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0894191},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48228.2024.10529344","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":30,"referenced_works":["https://openalex.org/W1480485976","https://openalex.org/W1977664984","https://openalex.org/W2103179919","https://openalex.org/W2346962696","https://openalex.org/W2769364246","https://openalex.org/W2781121986","https://openalex.org/W2800070060","https://openalex.org/W2887258823","https://openalex.org/W3005761635","https://openalex.org/W3045396652","https://openalex.org/W3080194167","https://openalex.org/W3104491101","https://openalex.org/W3110170410","https://openalex.org/W3203367984","https://openalex.org/W4206200129","https://openalex.org/W4226340999","https://openalex.org/W4285260073","https://openalex.org/W4286571749","https://openalex.org/W4289932425","https://openalex.org/W4307965995","https://openalex.org/W4308243208","https://openalex.org/W4308998411","https://openalex.org/W4310267017","https://openalex.org/W4313503504","https://openalex.org/W4367663483","https://openalex.org/W4385212767","https://openalex.org/W4386493686","https://openalex.org/W4387350498","https://openalex.org/W4389104845","https://openalex.org/W4391096260"],"related_works":["https://openalex.org/W4396701345","https://openalex.org/W4396696052","https://openalex.org/W4395014643","https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2382290278","https://openalex.org/W2376932109","https://openalex.org/W2358668433","https://openalex.org/W2001405890"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W4396949786","counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-01-06T16:06:23.835054","created_date":"2024-05-17"}