乐胖代购免代理版

{"id":"https://openalex.org/W2756960775","doi":"https://doi.org/10.1109/iolts.2017.8046194","title":"BPPT \u2014 Bulk potential protection technique for hardened sequentials","display_name":"BPPT \u2014 Bulk potential protection technique for hardened sequentials","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2756960775","doi":"https://doi.org/10.1109/iolts.2017.8046194","mag":"2756960775"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046194","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030017724","display_name":"Issam Nofal","orcid":"https://orcid.org/0000-0002-1726-9589"},"institutions":[],"countries":["FR"],"is_corresponding":false,"raw_author_name":"I. Nofal","raw_affiliation_strings":["IROC Technologies Grenoble, France"],"affiliations":[{"raw_affiliation_string":"IROC Technologies Grenoble, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028414036","display_name":"Adrian Evans","orcid":"https://orcid.org/0000-0002-2617-5007"},"institutions":[],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Evans","raw_affiliation_strings":["IROC Technologies Grenoble, France"],"affiliations":[{"raw_affiliation_string":"IROC Technologies Grenoble, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000171141","display_name":"Aixiang He","orcid":"https://orcid.org/0000-0002-6673-5830"},"institutions":[{"id":"https://openalex.org/I4210096139","display_name":"China Institute of Atomic Energy","ror":"https://ror.org/00v5gqm66","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210096139"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"A.-L. He","raw_affiliation_strings":["China Institute of Atomic Energy Beijing, China"],"affiliations":[{"raw_affiliation_string":"China Institute of Atomic Energy Beijing, China","institution_ids":["https://openalex.org/I4210096139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039747768","display_name":"Gang Guo","orcid":"https://orcid.org/0000-0002-1714-9034"},"institutions":[{"id":"https://openalex.org/I4210096139","display_name":"China Institute of Atomic Energy","ror":"https://ror.org/00v5gqm66","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210096139"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"G. Guo","raw_affiliation_strings":["China Institute of Atomic Energy Beijing, China"],"affiliations":[{"raw_affiliation_string":"China Institute of Atomic Energy Beijing, China","institution_ids":["https://openalex.org/I4210096139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100672528","display_name":"Yuan\u2010Qing Li","orcid":"https://orcid.org/0000-0002-0478-0177"},"institutions":[{"id":"https://openalex.org/I254029264","display_name":"European University Viadrina","ror":"https://ror.org/02msan859","country_code":"DE","type":"education","lineage":["https://openalex.org/I254029264"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Yuanqing Li","raw_affiliation_strings":["Formerly at the Department of Electrical and Computer Engineering, University of Saskatchewan, Frankfurt (Oder), Germany"],"affiliations":[{"raw_affiliation_string":"Formerly at the Department of Electrical and Computer Engineering, University of Saskatchewan, Frankfurt (Oder), Germany","institution_ids":["https://openalex.org/I254029264"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100379239","display_name":"Li Chen","orcid":"https://orcid.org/0000-0002-3769-1488"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"L. Chen","raw_affiliation_strings":["Department of Communication and Electronic Engineering, Hanyang University, Ansan, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Communication and Electronic Engineering, Hanyang University, Ansan, Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014101284","display_name":"R. Liu","orcid":"https://orcid.org/0009-0006-6357-1603"},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"R. Liu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100408835","display_name":"Haibin Wang","orcid":"https://orcid.org/0000-0002-9269-1229"},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"H.-B. Wang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048916756","display_name":"M. Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"M. Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028169407","display_name":"Sanghyeon Baeg","orcid":"https://orcid.org/0000-0002-6990-1312"},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"S. H. Baeg","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025156540","display_name":"Shi-Jie Wen","orcid":"https://orcid.org/0009-0002-7478-2351"},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.-J. Wen","raw_affiliation_strings":["Cisco Systems Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079841586","display_name":"Richard Wong","orcid":"https://orcid.org/0000-0002-8040-7083"},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Wong","raw_affiliation_strings":["Cisco Systems Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]}]}],"institution_assertions":[],"countries_distinct_count":6,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":63},"biblio":{"volume":null,"issue":null,"first_page":"28","last_page":"32"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9974,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7929375},{"id":"https://openalex.org/keywords/hardening","display_name":"Hardening (computing)","score":0.5631943},{"id":"https://openalex.org/keywords/alpha-particle","display_name":"Alpha particle","score":0.4918125},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.44708756},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4155873}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7929375},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.590371},{"id":"https://openalex.org/C2988362075","wikidata":"https://www.wikidata.org/wiki/Q12416032","display_name":"Heavy ion","level":3,"score":0.5678247},{"id":"https://openalex.org/C44255700","wikidata":"https://www.wikidata.org/wiki/Q978423","display_name":"Hardening (computing)","level":3,"score":0.5631943},{"id":"https://openalex.org/C66385817","wikidata":"https://www.wikidata.org/wiki/Q103517","display_name":"Alpha particle","level":2,"score":0.4918125},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.481416},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47287816},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.44708756},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4155873},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40634266},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.40422815},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40265864},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31295168},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28960556},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.20914596},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.20326778},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20225987},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.19643313},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17078239},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.13014522},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.11348012},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046194","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":9,"referenced_works":["https://openalex.org/W1972197928","https://openalex.org/W2048751700","https://openalex.org/W2050431855","https://openalex.org/W2099569658","https://openalex.org/W2153751624","https://openalex.org/W2165678574","https://openalex.org/W2519196746","https://openalex.org/W2613938152","https://openalex.org/W3149410719"],"related_works":["https://openalex.org/W4241240665","https://openalex.org/W4221121827","https://openalex.org/W4211237868","https://openalex.org/W3159753693","https://openalex.org/W2622269177","https://openalex.org/W2165400042","https://openalex.org/W2122334461","https://openalex.org/W2102538861","https://openalex.org/W2086616086","https://openalex.org/W1523508240"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"present":[4],"a":[5,42],"method":[6,40],"for":[7],"hardening":[8],"memory":[9],"and":[10,56,58],"sequential":[11],"cells":[12],"against":[13],"soft":[14],"errors.":[15],"The":[16,38,48],"effect":[17],"of":[18,45],"the":[19,23,30,36],"ionizing":[20],"particle":[21],"on":[22],"bulk":[24],"potential":[25],"is":[26,50],"exploited":[27],"to":[28,52],"prevent":[29],"induced":[31],"SET":[32],"from":[33],"propagating":[34],"in":[35],"circuit.":[37],"proposed":[39],"requires":[41],"minimum":[43],"number":[44],"extra":[46],"transistors.":[47],"solution":[49],"applied":[51],"D":[53],"Flip-Flop":[54],"design,":[55],"alpha":[57],"heavy-ions":[59],"test":[60],"results":[61],"are":[62],"presented.":[63]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2756960775","counts_by_year":[],"updated_date":"2024-12-15T18:34:52.636553","created_date":"2017-10-06"}