{"id":"https://openalex.org/W2033093129","doi":"https://doi.org/10.1109/iolts.2014.6873695","title":"Novel self-test methods to reduce on-chip memory requirements and improved test coverage","display_name":"Novel self-test methods to reduce on-chip memory requirements and improved test coverage","publication_year":2014,"publication_date":"2014-07-01","ids":{"openalex":"https://openalex.org/W2033093129","doi":"https://doi.org/10.1109/iolts.2014.6873695","mag":"2033093129"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2014.6873695","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032131912","display_name":"Prakash Narayanan","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"funder","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Prakash Narayanan","raw_affiliation_strings":["Texas Instruments India Pvt. Ltd., India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments India Pvt. Ltd., India","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059170594","display_name":"Satish Ravichandran","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"funder","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Satish Ravichandran","raw_affiliation_strings":["Cadence Design Systems, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, USA#TAB#","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088745813","display_name":"Balaji Ramayanam","orcid":null},"institutions":[],"countries":["US"],"is_corresponding":false,"raw_author_name":"Balaji Ramayanam","raw_affiliation_strings":["Mirafra Technol., USA"],"affiliations":[{"raw_affiliation_string":"Mirafra Technol., USA","institution_ids":[]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":66},"biblio":{"volume":null,"issue":null,"first_page":"198","last_page":"199"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9955,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bridge","display_name":"Bridge (graph theory)","score":0.44293487},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.44057268}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8263098},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6960935},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6267096},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6192303},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.55825055},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.44293487},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.44057268},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.41855764},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35685652},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26091015},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.10934317},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.082423896},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06949493},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2014.6873695","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.46}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":9,"referenced_works":["https://openalex.org/W1592824829","https://openalex.org/W1863819993","https://openalex.org/W2114838198","https://openalex.org/W2118133071","https://openalex.org/W2136204473","https://openalex.org/W2144033909","https://openalex.org/W2147220573","https://openalex.org/W2151094122","https://openalex.org/W2162874773"],"related_works":["https://openalex.org/W4256030018","https://openalex.org/W2913077774","https://openalex.org/W2535245920","https://openalex.org/W2147400189","https://openalex.org/W2147058777","https://openalex.org/W2145089576","https://openalex.org/W2091833418","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W1600468096"],"abstract_inverted_index":{"Self-Test":[0,62],"is":[1,39],"one":[2],"of":[3,11,43,71,90],"the":[4,24,81,95,117,122],"most":[5],"important":[6],"requirements":[7,21,87],"for":[8,23],"automotive":[9,15],"class":[10],"devices.":[12],"The":[13],"different":[14,18,28],"devices":[16],"have":[17,65,85],"fault":[19],"coverage":[20,82,118],"(90%-95%)":[22],"cores":[25],"as":[26],"per":[27],"Automotive":[29],"Safety":[30],"Integrity":[31],"Level":[32],"(e.g.":[33],"ASIL-B,":[34],"ASIL-C,":[35],"etc.).":[36],"Logic":[37,60],"self-test":[38],"achieved":[40],"by":[41,58],"way":[42,114],"either":[44],"random":[45],"patterns":[46,55],"or":[47],"deterministic":[48,106],"automatic":[49],"test":[50],"pattern":[51,97],"generation":[52],"(ATPG).":[53],"Random":[54],"are":[56],"generated":[57,96],"using":[59],"Built-in":[61],"(LBIST),":[63],"which":[64],"their":[66],"own":[67],"limitations":[68],"in":[69,88,111],"terms":[70,89],"achievable":[72],"coverage.":[73],"Deterministic":[74],"ATPG":[75,107],"has":[76],"been":[77],"used":[78,110],"to":[79,93,115],"bridge":[80,116],"gap":[83,119],"but":[84],"additional":[86],"on-chip":[91,123],"memory":[92,124],"store":[94],"sets.":[98],"In":[99],"this":[100],"work":[101],"we":[102],"will":[103],"show":[104],"how":[105],"can":[108],"be":[109],"a":[112],"novel":[113],"while":[120],"reducing":[121],"requirements.":[125]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2033093129","counts_by_year":[],"updated_date":"2025-02-01T23:04:35.835025","created_date":"2016-06-24"}