{"id":"https://openalex.org/W2059557268","doi":"https://doi.org/10.1109/iolts.2014.6873684","title":"Improving the significance of probabilistic circuit fault emulations","display_name":"Improving the significance of probabilistic circuit fault emulations","publication_year":2014,"publication_date":"2014-07-01","ids":{"openalex":"https://openalex.org/W2059557268","doi":"https://doi.org/10.1109/iolts.2014.6873684","mag":"2059557268"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2014.6873684","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010194320","display_name":"David May","orcid":null},"institutions":[],"countries":["DE"],"is_corresponding":false,"raw_author_name":"David May","raw_affiliation_strings":["Tech. Univ. Munchen, Mu\u0308nchen, Germany"],"affiliations":[{"raw_affiliation_string":"Tech. Univ. Munchen, Mu\u0308nchen, Germany","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005732789","display_name":"Walter Stechele","orcid":"https://orcid.org/0000-0002-7455-8483"},"institutions":[],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Walter Stechele","raw_affiliation_strings":["Tech. Univ. Munchen, Mu\u0308nchen, Germany"],"affiliations":[{"raw_affiliation_string":"Tech. Univ. Munchen, Mu\u0308nchen, Germany","institution_ids":[]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.329,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":1,"citation_normalized_percentile":{"value":0.227472,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":66,"max":73},"biblio":{"volume":null,"issue":null,"first_page":"128","last_page":"133"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.79757726}],"concepts":[{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.79757726},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.74677414},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.62873363},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.53894836},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.46154502},{"id":"https://openalex.org/C26490066","wikidata":"https://www.wikidata.org/wiki/Q17006835","display_name":"Circuit extraction","level":4,"score":0.4227788},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.39016426},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3462397},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.34494555},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.23830098},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.17572132},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1460343},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1300863},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12925968},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2014.6873684","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":14,"referenced_works":["https://openalex.org/W1555374769","https://openalex.org/W1976116805","https://openalex.org/W2020217519","https://openalex.org/W2035236061","https://openalex.org/W2041395308","https://openalex.org/W2072122809","https://openalex.org/W2098952866","https://openalex.org/W2143105503","https://openalex.org/W2144038574","https://openalex.org/W2154509298","https://openalex.org/W2168650271","https://openalex.org/W2169352387","https://openalex.org/W3149134903","https://openalex.org/W4235799760"],"related_works":["https://openalex.org/W4292182797","https://openalex.org/W4285047337","https://openalex.org/W4246262701","https://openalex.org/W3216447180","https://openalex.org/W2532989920","https://openalex.org/W2304374807","https://openalex.org/W2053072356","https://openalex.org/W2044303612","https://openalex.org/W1519058190","https://openalex.org/W1491101179"],"abstract_inverted_index":{"Recent":[0],"trends":[1],"go":[2],"into":[3,74],"the":[4,19,24,43,47,75,80,87,90,107,132,162,168,176,189,193,204,212,221,224,263],"direction":[5],"to":[6,27,34,61,97,115,123,134,150,160,186,197,208,219,233,240,245,258],"tolerate":[7],"a":[8,39,116,180,247,267],"certain":[9],"number":[10],"of":[11,42,46,119,128,167,179,223,266],"faults":[12],"in":[13,59,126,148,175,195,243],"integrated":[14],"circuits,":[15],"at":[16,68],"locations":[17],"where":[18],"error":[20,72,227],"remains":[21],"unnoticed":[22],"by":[23,85],"user,":[25],"trying":[26],"further":[28],"extend":[29],"Moore's":[30],"law.":[31],"In":[32,139],"order":[33,60,149,196,244],"enable":[35],"such":[36],"an":[37],"approach,":[38],"comprehensive":[40],"analysis":[41],"probabilistic":[44,264],"behavior":[45,265],"circuit":[48,56,81,120],"is":[49,83,112,184],"required.":[50],"We":[51,229],"focus":[52],"on":[53,71,79],"FPGA-based":[54],"probability-aware":[55],"fault":[57],"emulation":[58],"do":[62],"this":[63,140,152],"analysis.":[64],"Faults":[65],"are":[66,256],"injected":[67],"run-time,":[69],"based":[70],"probabilities,":[73],"circuit.":[76,92,109,169,181,268],"The":[77,93],"influence":[78],"outputs":[82],"observed":[84],"comparing":[86],"fault-free":[88],"with":[89],"faulty":[91],"probability-awareness":[94],"allows":[95],"us":[96],"model,":[98],"for":[99],"instance,":[100],"different":[101],"voltage-domains":[102],"or":[103],"channel":[104],"widths,":[105],"within":[106],"same":[108],"Previous":[110],"work":[111,141],"usually":[113],"restricted":[114],"non-probabilistic":[117],"treatment":[118],"faults,":[121],"due":[122],"its":[124],"complexity":[125],"terms":[127],"resource":[129],"requirements":[130],"and":[131,164],"difficulty":[133],"generate":[135,259],"statistical":[136],"significant":[137],"results.":[138],"we":[142,156,215,255],"will":[143,157,216,230],"present":[144,158,217,231],"two":[145],"fundamental":[146],"strategies,":[147],"tackle":[151],"latter":[153],"issue.":[154],"First,":[155],"methods":[159,254],"separate":[161],"data":[163,177],"control":[165,190,205],"path":[166,178,191,206],"Errors":[170],"can":[171],"only":[172],"be":[173,209,241],"tolerated":[174],"Hence,":[182],"it":[183,199],"necessary":[185],"reliably":[187],"identify":[188],"inside":[192],"netlist,":[194],"make":[198],"robust":[200],"against":[201],"faults.":[202],"Consequently,":[203],"hast":[207],"excluded":[210],"from":[211],"emulations.":[213],"Secondly,":[214],"algorithms":[218],"score":[220],"stability":[222],"measured":[225],"output":[226],"probability.":[228],"ways":[232],"determine":[234],"how":[235],"many":[236],"clock":[237],"cycles":[238],"have":[239],"emulated":[242],"get":[246],"stable":[248],"simulation":[249],"result.":[250],"By":[251],"applying":[252],"those":[253],"able":[257],"trustworthy":[260],"information":[261],"about":[262]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2059557268","counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2025-04-17T03:35:44.606200","created_date":"2016-06-24"}