{"id":"https://openalex.org/W1987010883","doi":"https://doi.org/10.1109/iolts.2013.6604095","title":"Challenges of RF and mixed signal design under process variability","display_name":"Challenges of RF and mixed signal design under process variability","publication_year":2013,"publication_date":"2013-07-01","ids":{"openalex":"https://openalex.org/W1987010883","doi":"https://doi.org/10.1109/iolts.2013.6604095","mag":"1987010883"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2013.6604095","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074954167","display_name":"Georgios Panagopoulos","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Georgios Panagopoulos","raw_affiliation_strings":["Intel Corporation, Munich, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Munich, Germany#TAB#","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055877155","display_name":"Phillipp Riess","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Phillipp Riess","raw_affiliation_strings":["Intel Corporation, Munich, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Munich, Germany#TAB#","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049918570","display_name":"Peter Baumgartner","orcid":"https://orcid.org/0000-0003-3111-1494"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter Baumgartner","raw_affiliation_strings":["Intel Corporation, Munich, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Munich, Germany#TAB#","institution_ids":["https://openalex.org/I1343180700"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":65},"biblio":{"volume":null,"issue":null,"first_page":"251","last_page":"251"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9605,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9605,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9545,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9423,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.67543936},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5338458}],"concepts":[{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.67543936},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.59119946},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.58659196},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5846429},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5567945},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5536818},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5338458},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.5306966},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.37760413},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31474292},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2520718},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.14471602},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08239961},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2013.6604095","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4385556635","https://openalex.org/W4242383160","https://openalex.org/W3209221379","https://openalex.org/W3174096205","https://openalex.org/W2375192119","https://openalex.org/W2356354970","https://openalex.org/W2161335888","https://openalex.org/W2071235072","https://openalex.org/W2031235560","https://openalex.org/W1496339695"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2],"given.":[3],"The":[4],"continuous":[5],"device":[6],"shrinking,":[7],"towards":[8],"nano-scaled":[9],"technology":[10,22],"nodes,":[11],"has":[12],"been":[13,37],"resulted":[14],"in":[15,31,40],"yield":[16],"and":[17,29,44,70,78],"reliability":[18],"challenges":[19,51],"due":[20,85],"to":[21,53,86],"process":[23],"variations":[24],"for":[25],"active":[26],"FEOL":[27],"devices":[28],"passives":[30],"the":[32,55],"BEOL.":[33],"These":[34],"effects":[35],"have":[36],"modelled":[38],"extensively":[39],"terms":[41],"of":[42,50,59,68],"global":[43],"local":[45],"variations.":[46],"However,":[47],"a":[48],"lot":[49],"remain":[52],"capture":[54],"medium":[56],"range":[57],"mismatch":[58],"these":[60],"devices.":[61],"This":[62],"presentation":[63],"will":[64],"give":[65],"some":[66],"examples":[67],"RF":[69],"mixed":[71],"signal":[72],"circuits":[73],"such":[74],"as":[75],"LNAs,":[76],"PAs":[77],"VCOs":[79],"where":[80],"their":[81],"performance":[82],"is":[83],"degraded":[84],"this":[87],"additional":[88],"variability.":[89]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1987010883","counts_by_year":[],"updated_date":"2024-12-07T06:56:07.234835","created_date":"2016-06-24"}