{"id":"https://openalex.org/W2145152656","doi":"https://doi.org/10.1109/iolts.2008.29","title":"False Error Study of On-line Soft Error Detection Mechanisms","display_name":"False Error Study of On-line Soft Error Detection Mechanisms","publication_year":2008,"publication_date":"2008-07-01","ids":{"openalex":"https://openalex.org/W2145152656","doi":"https://doi.org/10.1109/iolts.2008.29","mag":"2145152656"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2008.29","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111956491","display_name":"M. Kiran Kumar Reddy","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"M. Kiran Kumar Reddy","raw_affiliation_strings":["[Department of ECE, Indian Institute of Science, Bangalore]"],"affiliations":[{"raw_affiliation_string":"[Department of ECE, Indian Institute of Science, Bangalore]","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091221053","display_name":"Bharadwaj Amrutur","orcid":"https://orcid.org/0009-0007-5062-6174"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Bharadwaj S. Amrutur","raw_affiliation_strings":["Dept. of ECE., Indian Inst. of Sci., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Dept. of ECE., Indian Inst. of Sci., Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028519358","display_name":"Rubin Parekhji","orcid":"https://orcid.org/0009-0000-6625-2786"},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rubin A. Parekhji","raw_affiliation_strings":["Texas Instruments (India) Pvt Ltd, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments (India) Pvt Ltd, Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.801,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":5,"citation_normalized_percentile":{"value":0.636035,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":78,"max":79},"biblio":{"volume":null,"issue":null,"first_page":"53","last_page":"58"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9964,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.48315138},{"id":"https://openalex.org/keywords/statistical-power","display_name":"Statistical power","score":0.43104056}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7271913},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6851425},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5907983},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5260793},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.48315138},{"id":"https://openalex.org/C96608239","wikidata":"https://www.wikidata.org/wiki/Q1199823","display_name":"Statistical power","level":2,"score":0.43104056},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43024203},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4018758},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.18054253},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.17429811},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17148125},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.16941917},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.119365156},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2008.29","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.77,"display_name":"Life below water","id":"https://metadata.un.org/sdg/14"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":19,"referenced_works":["https://openalex.org/W1524791468","https://openalex.org/W1541483005","https://openalex.org/W1967835393","https://openalex.org/W1979668030","https://openalex.org/W2023856022","https://openalex.org/W2043318181","https://openalex.org/W2100250713","https://openalex.org/W2108209035","https://openalex.org/W2117570404","https://openalex.org/W2119490044","https://openalex.org/W2132834300","https://openalex.org/W2133742769","https://openalex.org/W2148954455","https://openalex.org/W2151802820","https://openalex.org/W2161549238","https://openalex.org/W2163671548","https://openalex.org/W2167002145","https://openalex.org/W2169213530","https://openalex.org/W2544676522"],"related_works":["https://openalex.org/W975040225","https://openalex.org/W2394408226","https://openalex.org/W2167002145","https://openalex.org/W2149051075","https://openalex.org/W2149032943","https://openalex.org/W2110991008","https://openalex.org/W2106281713","https://openalex.org/W2061536619","https://openalex.org/W2041615232","https://openalex.org/W2000201823"],"abstract_inverted_index":{"With":[0],"technology":[1],"scaling,":[2],"vulnerability":[3],"to":[4,115,146],"soft":[5],"errors":[6],"in":[7,70],"random":[8],"logic":[9,23],"is":[10,13,32,72],"increasing.":[11],"There":[12],"a":[14,154],"need":[15],"for":[16,22,36,46],"on-line":[17,38],"error":[18,30,47,59,94],"detection":[19,39,48,60,87,119,185],"and":[20,57,75,78,106,108,127,140,151],"protection":[21],"gates":[24],"even":[25],"at":[26,122],"sea":[27],"level.":[28],"The":[29,130,159],"checker":[31,68],"the":[33,50,65,73,92,100,138,142,147,170],"key":[34],"element":[35],"an":[37,123],"mechanism.":[40],"We":[41,62,96],"compare":[42],"three":[43],"different":[44],"checkers":[45],"from":[49,83],"point":[51],"of":[52,54,89,103,186],"view":[53],"area,":[55,125],"power":[56,79,126,143,166],"false":[58,86,118],"rates.":[61,95],"find":[63,98],"that":[64,99],"double":[66,173],"sampling":[67,105,132],"(used":[69],"Razor),":[71],"simplest":[74],"most":[76],"area":[77,139,171],"efficient,":[80],"but":[81,121,175],"suffers":[82],"very":[84],"high":[85],"rates":[88],"1.15":[90],"times":[91,137,169],"actual":[93],"also":[97,152],"alternate":[101],"approaches":[102],"triple":[104,131],"integrate":[107],"sample":[109],"method":[110,133,150,161],"(I&S)":[111],"can":[112],"be":[113],"designed":[114],"have":[116],"zero":[117],"rates,":[120],"increased":[124],"implementation":[128,180],"complexity.":[129],"has":[134],"about":[135,163],"1.74":[136],"twice":[141],"as":[144,172,182],"compared":[145],"Double":[148],"Sampling":[149],"needs":[153,162],"complex":[155],"clock":[156],"generation":[157],"scheme.":[158],"I&S":[160],"16%":[164],"more":[165,178],"with":[167,177],"0.58":[168],"sampling,":[174],"comes":[176],"stringent":[179],"constraints":[181],"it":[183],"requires":[184],"small":[187],"voltage":[188],"swings.":[189]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2145152656","counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2025-01-09T02:39:01.503003","created_date":"2016-06-24"}