{"id":"https://openalex.org/W1576682724","doi":"https://doi.org/10.1109/iecon.2014.7049001","title":"An automated thermographic image segmentation method for induction motor fault diagnosis","display_name":"An automated thermographic image segmentation method for induction motor fault diagnosis","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W1576682724","doi":"https://doi.org/10.1109/iecon.2014.7049001","mag":"1576682724"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2014.7049001","pdf_url":null,"source":{"id":"https://openalex.org/S4363608618","display_name":"IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058278718","display_name":"Petros Karvelis","orcid":"https://orcid.org/0000-0002-0483-4868"},"institutions":[{"id":"https://openalex.org/I4210159397","display_name":"Technological Educational Institute of Epirus","ror":"https://ror.org/04brn7x66","country_code":"GR","type":"education","lineage":["https://openalex.org/I4210159397"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Petros Karvelis","raw_affiliation_strings":["Laboratory of Knowledge and Intelligent Computing, Technological Educational Institute of Epirus, Department of Computer Engineering, Arta, Greece"],"affiliations":[{"raw_affiliation_string":"Laboratory of Knowledge and Intelligent Computing, Technological Educational Institute of Epirus, Department of Computer Engineering, Arta, Greece","institution_ids":["https://openalex.org/I4210159397"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022376997","display_name":"George Georgoulas","orcid":"https://orcid.org/0000-0001-9701-4203"},"institutions":[{"id":"https://openalex.org/I4210159397","display_name":"Technological Educational Institute of Epirus","ror":"https://ror.org/04brn7x66","country_code":"GR","type":"education","lineage":["https://openalex.org/I4210159397"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"George Georgoulas","raw_affiliation_strings":["Laboratory of Knowledge and Intelligent Computing, Technological Educational Institute of Epirus, Department of Computer Engineering, Arta, Greece"],"affiliations":[{"raw_affiliation_string":"Laboratory of Knowledge and Intelligent Computing, Technological Educational Institute of Epirus, Department of Computer Engineering, Arta, Greece","institution_ids":["https://openalex.org/I4210159397"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111458856","display_name":"Chsysostomos D. Stylios","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159397","display_name":"Technological Educational Institute of Epirus","ror":"https://ror.org/04brn7x66","country_code":"GR","type":"education","lineage":["https://openalex.org/I4210159397"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Chsysostomos D. Stylios","raw_affiliation_strings":["Laboratory of Knowledge and Intelligent Computing, Technological Educational Institute of Epirus, Department of Computer Engineering, Arta, Greece"],"affiliations":[{"raw_affiliation_string":"Laboratory of Knowledge and Intelligent Computing, Technological Educational Institute of Epirus, Department of Computer Engineering, Arta, Greece","institution_ids":["https://openalex.org/I4210159397"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008959856","display_name":"Ioannis P. Tsoumas","orcid":"https://orcid.org/0000-0003-1176-2564"},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"funder","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ioannis P. Tsoumas","raw_affiliation_strings":["Larges Drives Products R&D Department, Siemens Industry Sector - Drive Technologies, Nuremberg, Germany"],"affiliations":[{"raw_affiliation_string":"Larges Drives Products R&D Department, Siemens Industry Sector - Drive Technologies, Nuremberg, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066633137","display_name":"Jose A. Antonino\u2010Daviu","orcid":"https://orcid.org/0000-0003-1898-2228"},"institutions":[{"id":"https://openalex.org/I60053951","display_name":"Universitat Polit\u00e8cnica de Val\u00e8ncia","ror":"https://ror.org/01460j859","country_code":"ES","type":"funder","lineage":["https://openalex.org/I60053951"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jose Alfonso Antonino-Daviu","raw_affiliation_strings":["Instituto de Ingenier\u00eda Energ\u00e9tica, Universitat Polit\u00e8cnica de Valencia, Valencia, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Ingenier\u00eda Energ\u00e9tica, Universitat Polit\u00e8cnica de Valencia, Valencia, Spain","institution_ids":["https://openalex.org/I60053951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047914767","display_name":"Maria Jose Picazo Rodenas","orcid":null},"institutions":[{"id":"https://openalex.org/I60053951","display_name":"Universitat Polit\u00e8cnica de Val\u00e8ncia","ror":"https://ror.org/01460j859","country_code":"ES","type":"funder","lineage":["https://openalex.org/I60053951"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Maria Jose Picazo Rodenas","raw_affiliation_strings":["Instituto de Ingenier\u00eda Energ\u00e9tica, Universitat Polit\u00e8cnica de Valencia, Valencia, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Ingenier\u00eda Energ\u00e9tica, Universitat Polit\u00e8cnica de Valencia, Valencia, Spain","institution_ids":["https://openalex.org/I60053951"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039686647","display_name":"Vicente Climente-Alarc\u00f3n","orcid":"https://orcid.org/0000-0002-1273-8454"},"institutions":[{"id":"https://openalex.org/I9927081","display_name":"Aalto University","ror":"https://ror.org/020hwjq30","country_code":"FI","type":"funder","lineage":["https://openalex.org/I9927081"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Vicente Climente-Alarcon","raw_affiliation_strings":["Department of Electrical Engineering and Automation, Aalto University, Espoo, Finland#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Automation, Aalto University, Espoo, Finland#TAB#","institution_ids":["https://openalex.org/I9927081"]}]}],"institution_assertions":[],"countries_distinct_count":4,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.795,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":36,"citation_normalized_percentile":{"value":0.996394,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"3396","last_page":"3402"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9958,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9958,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9878,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9403,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thermography","display_name":"Thermography","score":0.5319144},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition Monitoring","score":0.51181334}],"concepts":[{"id":"https://openalex.org/C80962145","wikidata":"https://www.wikidata.org/wiki/Q207450","display_name":"Induction motor","level":3,"score":0.62757415},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.62250996},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.60111594},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.57871884},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.57480085},{"id":"https://openalex.org/C2779222261","wikidata":"https://www.wikidata.org/wiki/Q624587","display_name":"Thermography","level":3,"score":0.5319144},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.51181334},{"id":"https://openalex.org/C2776529397","wikidata":"https://www.wikidata.org/wiki/Q190312","display_name":"Stator","level":2,"score":0.490192},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.47740856},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.47250757},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4679329},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4574501},{"id":"https://openalex.org/C17281054","wikidata":"https://www.wikidata.org/wiki/Q193466","display_name":"Rotor (electric)","level":2,"score":0.4514127},{"id":"https://openalex.org/C199978012","wikidata":"https://www.wikidata.org/wiki/Q1273815","display_name":"Bearing (navigation)","level":2,"score":0.43132335},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.41910875},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3262002},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.32442537},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31179},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.08194104},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.06706777},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2014.7049001","pdf_url":null,"source":{"id":"https://openalex.org/S4363608618","display_name":"IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":31,"referenced_works":["https://openalex.org/W1542270631","https://openalex.org/W1561442812","https://openalex.org/W1565377632","https://openalex.org/W1570448133","https://openalex.org/W2000048778","https://openalex.org/W2018831479","https://openalex.org/W2020135792","https://openalex.org/W2026550072","https://openalex.org/W2027734878","https://openalex.org/W2033343132","https://openalex.org/W2050462101","https://openalex.org/W2096077837","https://openalex.org/W2096210433","https://openalex.org/W2101260915","https://openalex.org/W2111605520","https://openalex.org/W2111933145","https://openalex.org/W2121552484","https://openalex.org/W2124386111","https://openalex.org/W2124829216","https://openalex.org/W2125055259","https://openalex.org/W2130351296","https://openalex.org/W2133990480","https://openalex.org/W2151103935","https://openalex.org/W2155823613","https://openalex.org/W2158054222","https://openalex.org/W2170547958","https://openalex.org/W2181744257","https://openalex.org/W4243684872","https://openalex.org/W4245055982","https://openalex.org/W4292003313","https://openalex.org/W608314793"],"related_works":["https://openalex.org/W2902511954","https://openalex.org/W2786447778","https://openalex.org/W2620662450","https://openalex.org/W2386294322","https://openalex.org/W2368607384","https://openalex.org/W2069527050","https://openalex.org/W2036218083","https://openalex.org/W1980179937","https://openalex.org/W176109747","https://openalex.org/W174278852"],"abstract_inverted_index":{"Eventual":[0],"failures":[1,191],"in":[2,10,192,225],"induction":[3,143],"machines":[4],"may":[5],"lead":[6],"to":[7,28,75,81,110,142,172,176,188,219],"catastrophic":[8],"consequences":[9],"terms":[11],"of":[12,20,33,38,63,69,84,99,151,156,216],"economic":[13],"costs":[14],"for":[15,23,96,128],"the":[16,60,64,67,70,85,90,97,119,123,149,154,162,177,214,217,222,226],"companies.":[17],"The":[18,105,211],"development":[19],"reliable":[21,157],"systems":[22],"fault":[24,158,223],"detection":[25],"that":[26,116,170],"enable":[27],"diagnose":[29],"a":[30,36,77,168,174,180],"wide":[31],"range":[32],"faults":[34,86,101,145,198],"is":[35,186],"motivation":[37],"many":[39],"researchers":[40],"worldwide.":[41],"In":[42],"this":[43],"context,":[44],"non-invasive":[45,79,114],"condition":[46],"monitoring":[47],"strategies":[48],"have":[49],"drawn":[50],"special":[51],"attention":[52],"since":[53],"they":[54],"do":[55],"not":[56],"require":[57],"interfering":[58],"with":[59,122],"operation":[61],"process":[62],"machine.":[65,227],"Though":[66],"analysis":[68],"motor":[71,124,144],"currents":[72],"has":[73,108],"proven":[74,109],"be":[76,111],"reliable,":[78],"methodology":[80,169],"detect":[82,189],"some":[83,129,136],"(especially":[87],"when":[88],"assessing":[89],"rotor":[91,205],"condition),":[92],"it":[93],"lacks":[94],"reliability":[95],"diagnosis":[98,120],"other":[100],"(e.g.":[102],"bearing":[103,201],"faults).":[104],"infrared":[106,163],"thermography":[107],"an":[112,193],"excellent,":[113],"tool":[115],"can":[117],"complement":[118],"reached":[121],"current":[125],"analysis,":[126],"especially":[127],"specific":[130,197],"faults.":[131],"However,":[132],"there":[133],"are":[134,199],"still":[135],"pending":[137],"issues":[138],"regarding":[139],"its":[140],"application":[141],"diagnosis,":[146],"such":[147],"as":[148],"lack":[150],"automation":[152],"or":[153],"extraction":[155],"indicators":[159],"based":[160,182],"on":[161,183],"data.":[164],"This":[165],"paper":[166],"proposes":[167],"intends":[171],"provide":[173],"solution":[175],"first":[178],"issue:":[179],"method":[181],"image":[184],"segmentation":[185],"employed":[187],"several":[190],"automated":[194],"way.":[195],"Four":[196],"analyzed:":[200],"faults,":[202],"fan":[203],"failures,":[204],"bar":[206],"breakages":[207],"and":[208],"stator":[209],"unbalance.":[210],"results":[212],"show":[213],"potential":[215],"technique":[218],"automatically":[220],"identify":[221],"present":[224]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1576682724","counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":1}],"updated_date":"2025-04-08T16:12:40.637415","created_date":"2016-06-24"}