乐胖代购免代理版

{"id":"https://openalex.org/W4246473927","doi":"https://doi.org/10.1109/icsrs.2017.8272832","title":"Accelerated-compensated degradation modeling based on synthesized-stress enhancement test data","display_name":"Accelerated-compensated degradation modeling based on synthesized-stress enhancement test data","publication_year":2017,"publication_date":"2017-12-01","ids":{"openalex":"https://openalex.org/W4246473927","doi":"https://doi.org/10.1109/icsrs.2017.8272832"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs.2017.8272832","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101281184","display_name":"Nina Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"funder","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nina Yang","raw_affiliation_strings":["College of Information System and Management, National University of Defense Technology, Changsha, Hunan, China"],"affiliations":[{"raw_affiliation_string":"College of Information System and Management, National University of Defense Technology, Changsha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101964445","display_name":"Jing Feng","orcid":"https://orcid.org/0000-0002-4814-8907"},"institutions":[{"id":"https://openalex.org/I4210156400","display_name":"Hunan Provincial Science and Technology Department","ror":"https://ror.org/04qgr7x96","country_code":"CN","type":"government","lineage":["https://openalex.org/I4210156400"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Feng","raw_affiliation_strings":["Hunan Ginkgo Reliability Technology Institute Co. Ltd., Changsha, Hunan, China"],"affiliations":[{"raw_affiliation_string":"Hunan Ginkgo Reliability Technology Institute Co. Ltd., Changsha, Hunan, China","institution_ids":["https://openalex.org/I4210156400"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102740648","display_name":"Tianyu Liu","orcid":"https://orcid.org/0000-0003-2253-5594"},"institutions":[],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianyu Liu","raw_affiliation_strings":["Troops 78092 of PLA, Chengdu, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"Troops 78092 of PLA, Chengdu, Sichuan, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101441642","display_name":"Zhengqiang Pan","orcid":"https://orcid.org/0000-0002-8715-7830"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"funder","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengqiang Pan","raw_affiliation_strings":["College of Information System and Management, National University of Defense Technology, Changsha, Hunan, China"],"affiliations":[{"raw_affiliation_string":"College of Information System and Management, National University of Defense Technology, Changsha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109163820","display_name":"Jieru Meng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210160629","display_name":"China Information Technology Security Evaluation Center","ror":"https://ror.org/053cexp66","country_code":"CN","type":"government","lineage":["https://openalex.org/I4210160629"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jieru Meng","raw_affiliation_strings":["The Evaluation Certification Center of Information Safety, Beijing, China"],"affiliations":[{"raw_affiliation_string":"The Evaluation Certification Center of Information Safety, Beijing, China","institution_ids":["https://openalex.org/I4210160629"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":63},"biblio":{"volume":"s1","issue":null,"first_page":"261","last_page":"269"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9992,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9992,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9903,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.975,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation","score":0.68707585}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.74566543},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.68707585},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6074435},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.60319066},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.54845196},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5458078},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.44541505},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.41741666},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21451092},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.16569132},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14120585},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs.2017.8272832","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":6,"referenced_works":["https://openalex.org/W1929473834","https://openalex.org/W1972668145","https://openalex.org/W2083333086","https://openalex.org/W2371858551","https://openalex.org/W2756949044","https://openalex.org/W957261528"],"related_works":["https://openalex.org/W4289655666","https://openalex.org/W3195353062","https://openalex.org/W3186268266","https://openalex.org/W3004580327","https://openalex.org/W2621126165","https://openalex.org/W2534928293","https://openalex.org/W2152540334","https://openalex.org/W2150099345","https://openalex.org/W1815542355","https://openalex.org/W1490077415"],"abstract_inverted_index":{"At":[0],"present,":[1],"the":[2,13,20,28,60,83,96,100,108,112,133,136,142,147],"reliability":[3,84,139],"enhancement":[4,85,113],"test":[5,48,86,114],"(RET)":[6],"data":[7,30,64,87,115,127],"are":[8,16,38,66],"not":[9,121],"used":[10,105],"adequately":[11],"in":[12,24,40],"field,":[14],"and":[15,72,145],"utilized":[17],"to":[18,58,106,116],"determine":[19],"limits":[21],"of":[22,36,47,62,88,92,126,149],"stress":[23,42,71],"most":[25],"cases.":[26],"However,":[27],"RET":[29,63],"which":[31,65],"may":[32],"contain":[33],"abundant":[34],"information":[35],"products":[37],"obtained":[39],"complex":[41],"environment":[43],"with":[44],"a":[45,89],"duration":[46],"time.":[49],"Thus,":[50],"an":[51],"accelerated-compensated":[52],"degradation":[53,119,150],"modeling":[54],"method":[55,103],"is":[56,79,104],"proposed":[57,78],"describe":[59],"feature":[61],"collected":[67],"under":[68],"temperature":[69],"step":[70],"vibration":[73],"constant":[74],"stress.":[75],"The":[76],"model":[77,109],"validated":[80],"by":[81],"using":[82],"certain":[90],"type":[91],"servo":[93],"system.":[94],"For":[95],"small":[97],"sample":[98],"problem,":[99],"parameter":[101],"bootstrap":[102],"verify":[107],"validity.":[110],"Using":[111],"carry":[117],"out":[118],"modeling,":[120],"only":[122],"makes":[123],"full":[124],"use":[125],"mining":[128],"information,":[129],"but":[130],"also":[131],"lays":[132],"foundation":[134],"for":[135],"subsequent":[137],"product":[138],"assessment,":[140],"shortens":[141],"development":[143],"time":[144],"saves":[146],"cost":[148],"test.":[151]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W4246473927","counts_by_year":[],"updated_date":"2025-02-02T03:24:04.457477","created_date":"2022-05-12"}