{"id":"https://openalex.org/W2968511773","doi":"https://doi.org/10.1109/icicdt.2019.8790863","title":"Soft-Error-Tolerant Ultralow-Leakage 12T SRAM Bitcell Design","display_name":"Soft-Error-Tolerant Ultralow-Leakage 12T SRAM Bitcell Design","publication_year":2019,"publication_date":"2019-06-01","ids":{"openalex":"https://openalex.org/W2968511773","doi":"https://doi.org/10.1109/icicdt.2019.8790863","mag":"2968511773"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2019.8790863","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057556916","display_name":"Jianwei Jiang","orcid":"https://orcid.org/0000-0002-0071-413X"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianwei Jiang","raw_affiliation_strings":["University of Chinese Academy of Sciences, Beijing 100049, China"],"affiliations":[{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057164232","display_name":"Dianpeng Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dianpeng Lin","raw_affiliation_strings":["University of Chinese Academy of Sciences, Beijing 100049, China"],"affiliations":[{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101852787","display_name":"Jun Xiao","orcid":"https://orcid.org/0009-0005-2767-3218"},"institutions":[],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Xiao","raw_affiliation_strings":["Shanghai Huahong Grace Semiconductor Manufacturing Corporation, Shanghai 201203, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Huahong Grace Semiconductor Manufacturing Corporation, Shanghai 201203, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108468717","display_name":"Shichang Zou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shichang Zou","raw_affiliation_strings":["Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China","institution_ids":["https://openalex.org/I4210147322"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.332,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":2,"citation_normalized_percentile":{"value":0.521656,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":70,"max":74},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Fault Tolerance in Electronic Systems","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Fault Tolerance in Electronic Systems","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"Very Large Scale Integration Testing","score":0.9918,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-Power VLSI Circuit Design and Optimization","score":0.9912,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.85954213},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8438742},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.67991054},{"id":"https://openalex.org/keywords/soft-errors","display_name":"Soft Errors","score":0.585287},{"id":"https://openalex.org/keywords/leakage-reduction","display_name":"Leakage Reduction","score":0.548296},{"id":"https://openalex.org/keywords/low-power-testing","display_name":"Low-Power Testing","score":0.54091},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault Tolerance","score":0.519771}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.85954213},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8438742},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.67991054},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.67292136},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5555892},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.49880385},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.400361},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3261549},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.26717418},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23155397},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17427862},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.13974866},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2019.8790863","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":7,"referenced_works":["https://openalex.org/W2005422545","https://openalex.org/W2033453286","https://openalex.org/W2099569658","https://openalex.org/W2124071587","https://openalex.org/W2153751624","https://openalex.org/W2737640031","https://openalex.org/W3149410719"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W2968511773","https://openalex.org/W2620706469","https://openalex.org/W2548582980","https://openalex.org/W2363504003","https://openalex.org/W2297319780","https://openalex.org/W2088929465","https://openalex.org/W2066033226","https://openalex.org/W2052914698","https://openalex.org/W1500230652"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3],"novel":[4],"soft-error-tolerant":[5],"ultralow-leakage":[6,54],"12T":[7],"bitcell.":[8],"Compared":[9],"with":[10],"all":[11],"the":[12,16,33,43,57],"other":[13],"considered":[14],"bitcells,":[15],"proposed":[17],"cell":[18],"saves":[19],"90.76%":[20],"leakage":[21],"power":[22],"and":[23,36],"18.43%":[24],"write":[25],"access":[26],"time":[27],"on":[28],"average.":[29],"Simulation":[30],"results":[31],"verify":[32],"basic":[34],"functions":[35],"single":[37],"event":[38],"upset":[39],"(SEU)":[40],"tolerance":[41],"of":[42,59],"proposed.":[44],"Hence,":[45],"it":[46],"is":[47],"an":[48],"excellent":[49],"choice":[50],"for":[51],"highly":[52],"reliable":[53],"applications":[55],"like":[56],"Internet":[58],"Things":[60],"(IoT).":[61]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2968511773","counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2024-11-28T03:27:29.135198","created_date":"2019-08-22"}