{"id":"https://openalex.org/W2096562543","doi":"https://doi.org/10.1109/icecs.2007.4511217","title":"Signal Integrity Analysis of a High Precision D/A Converter","display_name":"Signal Integrity Analysis of a High Precision D/A Converter","publication_year":2007,"publication_date":"2007-12-01","ids":{"openalex":"https://openalex.org/W2096562543","doi":"https://doi.org/10.1109/icecs.2007.4511217","mag":"2096562543"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2007.4511217","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072948570","display_name":"Olivier Valorge","orcid":null},"institutions":[{"id":"https://openalex.org/I29607241","display_name":"\u00c9cole Normale Sup\u00e9rieure - PSL","ror":"https://ror.org/05a0dhs15","country_code":"FR","type":"other","lineage":["https://openalex.org/I2746051580","https://openalex.org/I29607241"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Olivier Valorge","raw_affiliation_strings":["Ecole Polytech. de Montreal, Montreal#TAB#"],"affiliations":[{"raw_affiliation_string":"Ecole Polytech. de Montreal, Montreal#TAB#","institution_ids":["https://openalex.org/I29607241"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017693534","display_name":"D. Marche","orcid":null},"institutions":[{"id":"https://openalex.org/I29607241","display_name":"\u00c9cole Normale Sup\u00e9rieure - PSL","ror":"https://ror.org/05a0dhs15","country_code":"FR","type":"other","lineage":["https://openalex.org/I2746051580","https://openalex.org/I29607241"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"David Marche","raw_affiliation_strings":["Ecole Polytech. de Montreal, Montreal#TAB#"],"affiliations":[{"raw_affiliation_string":"Ecole Polytech. de Montreal, Montreal#TAB#","institution_ids":["https://openalex.org/I29607241"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062764768","display_name":"Alain Lacourse","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alain Lacourse","raw_affiliation_strings":["LTRIM Technologies Inc, 440 Armand-Frappier, Suite 140, Laval (QC) H7V4B4"],"affiliations":[{"raw_affiliation_string":"LTRIM Technologies Inc, 440 Armand-Frappier, Suite 140, Laval (QC) H7V4B4","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108539847","display_name":"Mohamad Sawan","orcid":null},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"funder","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mohamad Sawan","raw_affiliation_strings":["Electrical Engineering Department, \u00c9cole Polytechnique de Montr\u00e9al"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, \u00c9cole Polytechnique de Montr\u00e9al","institution_ids":["https://openalex.org/I45683168"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038488044","display_name":"Yvon Savaria","orcid":"https://orcid.org/0000-0002-3404-9959"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"funder","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Yvon Savaria","raw_affiliation_strings":["Electrical Engineering Department, \u00c9cole Polytechnique de Montr\u00e9al"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, \u00c9cole Polytechnique de Montr\u00e9al","institution_ids":["https://openalex.org/I45683168"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":63},"biblio":{"volume":null,"issue":null,"first_page":"1224","last_page":"1227"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9992,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9989,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/glitch","display_name":"Glitch","score":0.9015263},{"id":"https://openalex.org/keywords/ringing","display_name":"Ringing","score":0.8394085},{"id":"https://openalex.org/keywords/current-source","display_name":"Current source","score":0.5337606},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.43538475}],"concepts":[{"id":"https://openalex.org/C191287063","wikidata":"https://www.wikidata.org/wiki/Q543281","display_name":"Glitch","level":3,"score":0.9015263},{"id":"https://openalex.org/C30684385","wikidata":"https://www.wikidata.org/wiki/Q176509","display_name":"Ringing","level":3,"score":0.8394085},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5749894},{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.5337606},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.525356},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.52130294},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.5074956},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.4967671},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.48162693},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.46554434},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43628755},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.43538475},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43529966},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4266848},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32384396},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26819283},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.23450527},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.16770235},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2007.4511217","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.43,"display_name":"Peace, justice, and strong institutions","id":"https://metadata.un.org/sdg/16"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":5,"referenced_works":["https://openalex.org/W2097977713","https://openalex.org/W2120275429","https://openalex.org/W2129140656","https://openalex.org/W2150555103","https://openalex.org/W2164243714"],"related_works":["https://openalex.org/W4229488911","https://openalex.org/W2533577392","https://openalex.org/W2394351004","https://openalex.org/W2377381684","https://openalex.org/W2359211325","https://openalex.org/W2151975639","https://openalex.org/W2140328632","https://openalex.org/W2136022462","https://openalex.org/W1975101660","https://openalex.org/W1535727410"],"abstract_inverted_index":{"The":[0,22,137],"purpose":[1],"of":[2,10,86,149],"this":[3],"paper":[4],"is":[5,29,114],"to":[6,31,106,122,134,146],"investigate":[7],"the":[8,72,79,88,102,112,163],"significance":[9],"different":[11],"coupling":[12],"mechanisms":[13],"that":[14,92,129],"occur":[15,93],"in":[16,37,83],"a":[17,144],"high":[18],"precision":[19],"D/A":[20,34],"converter.":[21],"standard":[23],"Integrated":[24],"Circuit":[25],"Emission":[26],"Model":[27],"approach":[28],"applied":[30],"an":[32],"existing":[33],"converter":[35],"built":[36],"TSMC":[38],"CMOS":[39],"0.25":[40],"\u03bcm":[41],"technology.":[42],"Aggressors,":[43],"propagation":[44],"media":[45],"and":[46,50,59,63,66,118,152],"victims":[47,60],"are":[48,61,153],"defined":[49],"modelled":[51],"using":[52],"classical":[53],"CAD":[54],"tools.":[55],"Potential":[56],"noise":[57,73,81],"sources":[58],"identified":[62],"some":[64],"frequency":[65],"time":[67],"domain":[68],"simulation":[69],"results":[70],"reveal":[71],"source":[74,82],"signatures.":[75],"This":[76],"study":[77],"highlights":[78],"main":[80],"such":[84,130],"kind":[85],"converters:":[87],"charging/discharging":[89],"switch":[90,165],"current":[91,123,164],"at":[94],"each":[95],"sampling":[96],"period.":[97],"Based":[98],"on":[99,111],"detailed":[100],"simulations,":[101],"60":[103],"mV":[104],"peak":[105,107,145,147],"voltage":[108,148],"glitch":[109],"observed":[110],"output":[113],"explained":[115],"by":[116,162],"power":[117],"ground":[119],"ringing":[120],"due":[121,133],"switches,":[124],"whereas":[125],"previous":[126],"studies":[127],"suggested":[128],"glitches":[131,142,160],"were":[132],"substrate":[135,139],"coupling.":[136],"simulated":[138],"propagated":[140],"digital":[141],"have":[143],"5":[150],"mV,":[151],"more":[154],"than":[155,159],"ten":[156],"times":[157],"lower":[158],"induced":[161],"activities.":[166]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2096562543","counts_by_year":[],"updated_date":"2025-02-03T09:32:01.814736","created_date":"2016-06-24"}