乐胖代购免代理版

{"id":"https://openalex.org/W1906878821","doi":"https://doi.org/10.1109/iccve.2014.7297597","title":"On the use of bulk current injection for testing the immunity of CAN-bus lines","display_name":"On the use of bulk current injection for testing the immunity of CAN-bus lines","publication_year":2014,"publication_date":"2014-11-01","ids":{"openalex":"https://openalex.org/W1906878821","doi":"https://doi.org/10.1109/iccve.2014.7297597","mag":"1906878821"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccve.2014.7297597","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079370638","display_name":"Flavia Grassi","orcid":"https://orcid.org/0000-0001-6844-8766"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Grassi","raw_affiliation_strings":["Department of Electronics; Information and Bioengineering, Politecnico di Milano; Milan Italy"],"affiliations":[{"raw_affiliation_string":"Department of Electronics; Information and Bioengineering, Politecnico di Milano; Milan Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010506865","display_name":"Giordano Spadacini","orcid":"https://orcid.org/0000-0002-9778-693X"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Spadacini","raw_affiliation_strings":["Department of Electronics; Information and Bioengineering, Politecnico di Milano; Milan Italy"],"affiliations":[{"raw_affiliation_string":"Department of Electronics; Information and Bioengineering, Politecnico di Milano; Milan Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010923388","display_name":"Sergio A. Pignari","orcid":"https://orcid.org/0000-0002-6657-1530"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. A. Pignari","raw_affiliation_strings":["Department of Electronics; Information and Bioengineering, Politecnico di Milano; Milan Italy"],"affiliations":[{"raw_affiliation_string":"Department of Electronics; Information and Bioengineering, Politecnico di Milano; Milan Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046063368","display_name":"Cyrous Rostamzadeh","orcid":"https://orcid.org/0000-0003-3585-4439"},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"C. Rostamzadeh","raw_affiliation_strings":["BOSCH Automotive Group, Robert Bosch LLC, Plymouth, MI, United States"],"affiliations":[{"raw_affiliation_string":"BOSCH Automotive Group, Robert Bosch LLC, Plymouth, MI, United States","institution_ids":["https://openalex.org/I889804353"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":1,"citation_normalized_percentile":{"value":0.232675,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":66,"max":73},"biblio":{"volume":null,"issue":null,"first_page":"50","last_page":"55"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge Protection in Integrated Circuits","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Reverberation Chambers in Electromagnetic Testing","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.8508562},{"id":"https://openalex.org/keywords/emi-testing","display_name":"EMI Testing","score":0.52621},{"id":"https://openalex.org/keywords/wireless-device-testing","display_name":"Wireless Device Testing","score":0.50452},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.48242816}],"concepts":[{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.8508562},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.77120084},{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.5366058},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4831004},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.48242816},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4813974},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.46845245},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.43073118},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29867315},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21496487},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccve.2014.7297597","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.55,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":10,"referenced_works":["https://openalex.org/W1645418907","https://openalex.org/W1836044394","https://openalex.org/W1919344697","https://openalex.org/W1981415815","https://openalex.org/W1983649538","https://openalex.org/W2018517920","https://openalex.org/W2045477069","https://openalex.org/W2085188310","https://openalex.org/W2131038353","https://openalex.org/W2134121173"],"related_works":["https://openalex.org/W2535925839","https://openalex.org/W2170868587","https://openalex.org/W2160921373","https://openalex.org/W2124450871","https://openalex.org/W2077896430","https://openalex.org/W2076345965","https://openalex.org/W2071764837","https://openalex.org/W2041511579","https://openalex.org/W1986241886","https://openalex.org/W1921091955"],"abstract_inverted_index":{"In":[0],"this":[1,36],"work,":[2],"an":[3,38],"immunity":[4],"test":[5,13,128],"based":[6],"on":[7],"the":[8,18,22,29,42,64,74,86,99,103,107,111,116,127,140,144,154],"Bulk":[9],"Current":[10],"Injection":[11],"(BCI)":[12],"procedure":[14],"is":[15,45,81],"simulated,":[16],"with":[17,47,59,143],"objective":[19],"to":[20,83,91,110,124,131],"predict":[21],"radio-frequency":[23],"(RF)":[24],"noise":[25],"currents":[26],"injected":[27,108],"into":[28],"terminations":[30],"of":[31,41,63,88,97,106,113,115,153],"a":[32,60,95],"CAN-bus":[33],"line.":[34],"To":[35],"end,":[37],"accurate":[39,151],"model":[40,68],"injection":[43,49],"probe":[44],"combined":[46],"typical":[48],"profiles":[50],"recommended":[51],"by":[52],"automotive":[53],"Electromagnetic":[54],"Compatibility":[55],"(EMC)":[56],"Standards,":[57],"and":[58,119],"distributed-parameter":[61],"representation":[62],"wiring":[65],"harness.":[66],"The":[67],"also":[69],"includes":[70],"possible":[71,133],"imbalance":[72,114],"affecting":[73],"bus":[75,89],"terminal":[76,117,155],"sections,":[77,118],"whose":[78],"non-ideal":[79],"behavior":[80],"recognized":[82],"be":[84],"at":[85],"basis":[87],"susceptibility":[90,134],"electromagnetic":[92],"interference.":[93],"As":[94],"matter":[96],"fact,":[98],"obtained":[100],"predictions":[101],"prove":[102],"great":[104],"sensitivity":[105],"current":[109],"degree":[112],"indicate":[120],"that,":[121],"in":[122],"order":[123],"derive":[125],"from":[126],"consistent":[129],"information":[130],"fix":[132],"problems,":[135],"statistical":[136],"models":[137],"accounting":[138],"for":[139],"uncertainty":[141],"associated":[142],"involved":[145],"circuit":[146],"components":[147],"are":[148],"preferable,":[149],"unless":[150],"characterization":[152],"sections":[156],"were":[157],"available.":[158]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1906878821","counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2024-12-03T02:11:56.951744","created_date":"2016-06-24"}