乐胖代购免代理版

{"id":"https://openalex.org/W2127868148","doi":"https://doi.org/10.1109/iccd.1990.130173","title":"Design of robustly testable static CMOS parity trees derived from binary decision diagrams","display_name":"Design of robustly testable static CMOS parity trees derived from binary decision diagrams","publication_year":2002,"publication_date":"2002-12-04","ids":{"openalex":"https://openalex.org/W2127868148","doi":"https://doi.org/10.1109/iccd.1990.130173","mag":"2127868148"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.1990.130173","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086131079","display_name":"Niraj K. Jha","orcid":"https://orcid.org/0000-0002-1539-0369"},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"funder","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N.K. Jha","raw_affiliation_strings":["Dept. of Electr. Eng., Princeton Univ., NJ, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng., Princeton Univ., NJ, USA","institution_ids":["https://openalex.org/I20089843"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112594984","display_name":"Qiao Tong","orcid":null},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"funder","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Q. Tong","raw_affiliation_strings":["Dept. of Electr. Eng., Princeton Univ., NJ, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng., Princeton Univ., NJ, USA","institution_ids":["https://openalex.org/I20089843"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.187,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":2,"citation_normalized_percentile":{"value":0.409787,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":64,"max":68},"biblio":{"volume":null,"issue":null,"first_page":"103","last_page":"106"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/binary-decision-diagram","display_name":"Binary decision diagram","score":0.8743392},{"id":"https://openalex.org/keywords/parity","display_name":"Parity (physics)","score":0.6308801}],"concepts":[{"id":"https://openalex.org/C3309909","wikidata":"https://www.wikidata.org/wiki/Q864155","display_name":"Binary decision diagram","level":2,"score":0.8743392},{"id":"https://openalex.org/C2777151079","wikidata":"https://www.wikidata.org/wiki/Q141160","display_name":"Parity (physics)","level":2,"score":0.6308801},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.60569835},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.52794045},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5072662},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5021024},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.45917064},{"id":"https://openalex.org/C84525736","wikidata":"https://www.wikidata.org/wiki/Q831366","display_name":"Decision tree","level":2,"score":0.43302405},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.41631153},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4149586},{"id":"https://openalex.org/C197855036","wikidata":"https://www.wikidata.org/wiki/Q380172","display_name":"Binary tree","level":2,"score":0.41248485},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.41049248},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.39954644},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3753576},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.30369532},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.13795367},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.119305074},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10806483},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1049453},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.10038391},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C109214941","wikidata":"https://www.wikidata.org/wiki/Q18334","display_name":"Particle physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.1990.130173","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, justice, and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.79}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":16,"referenced_works":["https://openalex.org/W1980561377","https://openalex.org/W1983731190","https://openalex.org/W1994143452","https://openalex.org/W2028923063","https://openalex.org/W2043905562","https://openalex.org/W2046817879","https://openalex.org/W2051398574","https://openalex.org/W2094424823","https://openalex.org/W2104801821","https://openalex.org/W2129713724","https://openalex.org/W33238586","https://openalex.org/W4241698871","https://openalex.org/W4246189507","https://openalex.org/W4247592337","https://openalex.org/W4285719527","https://openalex.org/W74341030"],"related_works":["https://openalex.org/W86917440","https://openalex.org/W4309131146","https://openalex.org/W4300631294","https://openalex.org/W3196342125","https://openalex.org/W2898646080","https://openalex.org/W2472109360","https://openalex.org/W2390183607","https://openalex.org/W2188215366","https://openalex.org/W2122917767","https://openalex.org/W1819373035"],"abstract_inverted_index":{"A":[0,11],"robustly":[1],"testable":[2,100],"design":[3],"of":[4,25,37,67,96,105,114],"static":[5,42],"CMOS":[6,43],"parity":[7,39,97],"trees":[8,98],"is":[9,91,111,119],"presented.":[10],"test":[12,71,103],"set":[13,72,104],"for":[14],"such":[15,94],"a":[16,102,120],"tree":[17,40,62],"which":[18,47],"cannot":[19],"be":[20,33],"invalidated":[21],"in":[22,60],"the":[23,38,61,75,112],"presence":[24],"arbitrary":[26],"timing":[27],"skews":[28],"and/or":[29],"circuit":[30,121],"delays":[31],"can":[32,63],"derived.":[34],"The":[35,57,69],"constituents":[36],"are":[41,48,88,99],"EXCLUSIVE-OR":[44],"(EX-OR)":[45],"gates,":[46],"constructed":[49],"from":[50],"their":[51],"corresponding":[52],"binary":[53],"decision":[54],"diagrams":[55],"(BDDs).":[56],"EX-OR":[58],"gates":[59],"have":[64],"any":[65],"number":[66,113],"inputs.":[68],"robust":[70],"detects":[73],"all":[74],"single":[76],"stuck-open,":[77],"stuck-on,":[78],"and":[79,85,117],"stuck-at":[80],"faults":[81],"when":[82],"both":[83],"logic":[84],"current":[86],"monitoring":[87],"done.":[89],"It":[90],"shown":[92],"that":[93],"implementations":[95],"with":[101],"size":[106],"O(log/sub":[107],"k/n),":[108],"where":[109],"n":[110],"primary":[115],"inputs":[116],"k":[118],"parameter.<":[122],">":[125]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2127868148","counts_by_year":[],"updated_date":"2025-02-16T05:46:54.238144","created_date":"2016-06-24"}