{"id":"https://openalex.org/W2903650344","doi":"https://doi.org/10.1109/iccais.2018.8570453","title":"Multiple Fault Diagnosis Methods Based on Multilevel Multi-Granularity PCA","display_name":"Multiple Fault Diagnosis Methods Based on Multilevel Multi-Granularity PCA","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2903650344","doi":"https://doi.org/10.1109/iccais.2018.8570453","mag":"2903650344"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccais.2018.8570453","pdf_url":null,"source":{"id":"https://openalex.org/S4363608071","display_name":"2021 International Conference on Control, Automation and Information Sciences (ICCAIS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091134284","display_name":"Lan Wu","orcid":"https://orcid.org/0000-0002-2497-6556"},"institutions":[{"id":"https://openalex.org/I36152291","display_name":"Henan University of Technology","ror":"https://ror.org/05sbgwt55","country_code":"CN","type":"funder","lineage":["https://openalex.org/I36152291"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lan Wu","raw_affiliation_strings":["College of Electrical Engineering, Henan University of Technology, Zhengzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Henan University of Technology, Zhengzhou, China","institution_ids":["https://openalex.org/I36152291"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021516247","display_name":"Sheyan Su","orcid":null},"institutions":[{"id":"https://openalex.org/I36152291","display_name":"Henan University of Technology","ror":"https://ror.org/05sbgwt55","country_code":"CN","type":"funder","lineage":["https://openalex.org/I36152291"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sheyan Su","raw_affiliation_strings":["College of Electrical Engineering, Henan University of Technology, Zhengzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Henan University of Technology, Zhengzhou, China","institution_ids":["https://openalex.org/I36152291"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086718724","display_name":"Chenglin Wen","orcid":"https://orcid.org/0000-0003-2471-2849"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"funder","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenglin Wen","raw_affiliation_strings":["College of Electrical Engineering, Hangzhou Dianzi University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":1,"citation_normalized_percentile":{"value":0.290821,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":62,"max":70},"biblio":{"volume":null,"issue":null,"first_page":"566","last_page":"570"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9906,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.971,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.81752414}],"concepts":[{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.8908974},{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.81752414},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.72069705},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.643354},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.55849653},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.52266043},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5047735},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.48772606},{"id":"https://openalex.org/C161584116","wikidata":"https://www.wikidata.org/wiki/Q1952580","display_name":"Multivariate statistics","level":2,"score":0.44919726},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.44915715},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.2517255},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccais.2018.8570453","pdf_url":null,"source":{"id":"https://openalex.org/S4363608071","display_name":"2021 International Conference on Control, Automation and Information Sciences (ICCAIS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":11,"referenced_works":["https://openalex.org/W1541770510","https://openalex.org/W2000767513","https://openalex.org/W2077791644","https://openalex.org/W2103110513","https://openalex.org/W2158331489","https://openalex.org/W2789846142","https://openalex.org/W2793832636","https://openalex.org/W2797016435","https://openalex.org/W2799289987","https://openalex.org/W2803211482","https://openalex.org/W2804368419"],"related_works":["https://openalex.org/W936373746","https://openalex.org/W4226090359","https://openalex.org/W2999756192","https://openalex.org/W2975817033","https://openalex.org/W2931688134","https://openalex.org/W2474947501","https://openalex.org/W2378857091","https://openalex.org/W2377919138","https://openalex.org/W2059697060","https://openalex.org/W103652678"],"abstract_inverted_index":{"Principal":[0],"Component":[1],"Analysis":[2],"(PCA)":[3],"is":[4],"a":[5,52,61],"basic":[6],"method":[7,68],"of":[8,42,54],"fault":[9,28,37],"diagnosis":[10,29,38],"based":[11],"on":[12,47,51],"multivariate":[13],"statistical":[14],"analysis.":[15],"It":[16],"utilizes":[17],"the":[18,40,71],"linear":[19],"correlation":[20],"between":[21],"multiple":[22],"process":[23,27],"variables":[24],"to":[25,69],"implement":[26],"and":[30,63],"has":[31],"been":[32],"widely":[33],"used.":[34],"Traditional":[35],"PCA":[36],"ignores":[39],"impact":[41],"faults":[43],"with":[44],"different":[45],"magnitudes":[46],"detection":[48,72],"accuracy.":[49],"Based":[50],"variety":[53],"data":[55],"processing":[56],"methods,":[57],"this":[58],"paper":[59],"proposes":[60],"multi-level":[62],"multi-granularity":[64],"principal":[65],"component":[66],"analysis":[67],"make":[70],"results":[73],"more":[74],"accurate.":[75]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2903650344","counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-04-18T08:29:46.960124","created_date":"2018-12-22"}