乐胖代购免代理版

{"id":"https://openalex.org/W2100999250","doi":"https://doi.org/10.1109/ias.2009.5324818","title":"Of International Terminology and Wiring Methods Used in the Matter of Bonding and Earthing of Low-Voltage Power Systems","display_name":"Of International Terminology and Wiring Methods Used in the Matter of Bonding and Earthing of Low-Voltage Power Systems","publication_year":2009,"publication_date":"2009-10-01","ids":{"openalex":"https://openalex.org/W2100999250","doi":"https://doi.org/10.1109/ias.2009.5324818","mag":"2100999250"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2009.5324818","pdf_url":null,"source":{"id":"https://openalex.org/S4306418636","display_name":"IEEE Industry Applications Society Annual Meeting","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009632723","display_name":"Massimo Mitolo","orcid":"https://orcid.org/0000-0003-2107-6859"},"institutions":[{"id":"https://openalex.org/I4210136318","display_name":"New York Life Insurance Company (United States)","ror":"https://ror.org/03a4nen96","country_code":"US","type":"company","lineage":["https://openalex.org/I4210136318"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Massimo Mitolo","raw_affiliation_strings":["Chu & Gassman, New York, NY, USA"],"affiliations":[{"raw_affiliation_string":"Chu & Gassman, New York, NY, USA","institution_ids":["https://openalex.org/I4210136318"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113476184","display_name":"Michele Tartaglia","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Michele Tartaglia","raw_affiliation_strings":["Ing. Elettr., Politec. di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Ing. Elettr., Politec. di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050936075","display_name":"Sergio Panetta","orcid":"https://orcid.org/0000-0001-8791-0442"},"institutions":[],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Sergio Panetta","raw_affiliation_strings":["I-GARD Corp., Mississauga, ON, Canada"],"affiliations":[{"raw_affiliation_string":"I-GARD Corp., Mississauga, ON, Canada","institution_ids":[]}]}],"institution_assertions":[],"countries_distinct_count":3,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.394,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":5,"citation_normalized_percentile":{"value":0.64854,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":79,"max":80},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Detection and Localization of Arc Faults in Electrical Systems","score":0.9954,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Detection and Localization of Arc Faults in Electrical Systems","score":0.9954,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10787","display_name":"Global Lightning Distribution and Physics","score":0.9909,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility in Electronics","score":0.9806,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/aircraft-wiring","display_name":"Aircraft Wiring","score":0.495096},{"id":"https://openalex.org/keywords/earthing-system","display_name":"Earthing system","score":0.47579396}],"concepts":[{"id":"https://openalex.org/C168993435","wikidata":"https://www.wikidata.org/wiki/Q6501125","display_name":"Ground","level":2,"score":0.8511523},{"id":"https://openalex.org/C547195049","wikidata":"https://www.wikidata.org/wiki/Q1725664","display_name":"Terminology","level":2,"score":0.72021914},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.4783982},{"id":"https://openalex.org/C78779171","wikidata":"https://www.wikidata.org/wiki/Q432571","display_name":"Earthing system","level":3,"score":0.47579396},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43620148},{"id":"https://openalex.org/C2775922551","wikidata":"https://www.wikidata.org/wiki/Q7135033","display_name":"Parallels","level":2,"score":0.4273916},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37328106},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34306163},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.34268516},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.34062678},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.29798502},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.132056},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.10392311},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/ias.2009.5324818","pdf_url":null,"source":{"id":"https://openalex.org/S4306418636","display_name":"IEEE Industry Applications Society Annual Meeting","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/17","display_name":"Partnerships for the goals","score":0.42}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":9,"referenced_works":["https://openalex.org/W2011192091","https://openalex.org/W2104604942","https://openalex.org/W2110657855","https://openalex.org/W2111000441","https://openalex.org/W2142365729","https://openalex.org/W2570429665","https://openalex.org/W3141079596","https://openalex.org/W3158947360","https://openalex.org/W42130918"],"related_works":["https://openalex.org/W3198592614","https://openalex.org/W3119649758","https://openalex.org/W2379604501","https://openalex.org/W2372939808","https://openalex.org/W2354775716","https://openalex.org/W2159780915","https://openalex.org/W2147569308","https://openalex.org/W2132954488","https://openalex.org/W2125566117","https://openalex.org/W2054767487"],"abstract_inverted_index":{"The":[0,51],"worldwide":[1],"global":[2],"market":[3,49],"requires":[4,58],"electrical":[5],"engineers":[6,160],"to":[7,29,135,153],"have":[8],"a":[9,155],"deep":[10],"understanding":[11],"of":[12,42,54,61,96,104,132,143,164,168],"the":[13,23,40,55,59,66,77,85,94,117,138,151,162,182],"bonding":[14,165],"and":[15,33,37,110,140,166,181],"earthing":[16,67,167],"practices":[17],"adopted":[18,146,177],"in":[19,76,84,98,122,147,161,178],"different":[20],"countries":[21],"around":[22],"world.":[24,87],"This":[25,88,113],"knowledge":[26],"is":[27,90],"essential":[28],"obtain":[30],"effective":[31],"design":[32],"high":[34],"safety":[35],"standards,":[36,149],"can":[38,46],"promote":[39],"elimination":[41],"technical":[43,63,80],"obstacles":[44],"that":[45],"still":[47],"create":[48,154],"barriers.":[50],"full":[52],"comprehension":[53],"\"grounding\"":[56],"theory":[57],"command":[60],"key":[62],"concepts":[64],"regarding":[65],"methods,":[68],"which":[69],"may":[70],"be":[71],"cause":[72],"confusion":[73],"when":[74],"used":[75],"North":[78,183],"American":[79,184],"realm":[81],"rather":[82],"than":[83],"IEC":[86,148,179],"issue":[89],"further":[91],"worsened":[92],"by":[93,115,129],"lack":[95],"literature":[97],"this":[99],"matter,":[100],"as":[101,103],"well":[102],"harmonization":[105],"documents":[106],"between":[107,174],"national":[108],"codes":[109],"international":[111],"standards.":[112],"paper,":[114],"analyzing":[116],"protection":[118],"against":[119],"indirect":[120],"contact":[121],"A.C":[123],"(50/60":[124],"Hz)":[125],"low-voltage":[126],"power":[127,169],"systems":[128],"automatic":[130],"disconnection":[131],"supply,":[133],"seeks":[134],"clarify":[136],"both":[137],"terminology":[139],"each":[141],"type":[142],"grounding":[144],"system":[145],"with":[150],"intent":[152],"common":[156],"reference":[157],"for":[158],"practicing":[159],"matter":[163],"systems.":[170],"Major":[171],"differences":[172],"encountered":[173],"sizing":[175],"procedures":[176],"standards":[180],"National":[185],"Electrical":[186],"Code":[187],"are":[188],"also":[189],"examined.":[190]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2100999250","counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2024-11-20T06:38:39.541296","created_date":"2016-06-24"}