{"id":"https://openalex.org/W2114172921","doi":"https://doi.org/10.1109/dsn.2007.8","title":"A Framework for Architecture-Level Lifetime Reliability Modeling","display_name":"A Framework for Architecture-Level Lifetime Reliability Modeling","publication_year":2007,"publication_date":"2007-06-01","ids":{"openalex":"https://openalex.org/W2114172921","doi":"https://doi.org/10.1109/dsn.2007.8","mag":"2114172921"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsn.2007.8","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052489263","display_name":"Jeonghee Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeonghee Shin","raw_affiliation_strings":["Computer Engineering Department, University of Southern California, USA","IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"Computer Engineering Department, University of Southern California, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072328031","display_name":"Victor Zyuban","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Victor Zyuban","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060922308","display_name":"Zhigang Hu","orcid":"https://orcid.org/0000-0002-5265-3535"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhigang Hu","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022486346","display_name":"Jude A. Rivers","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jude A. Rivers","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009866527","display_name":"Pradip Bose","orcid":"https://orcid.org/0000-0002-1380-5671"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pradip Bose","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":8.183,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":66,"citation_normalized_percentile":{"value":0.973417,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"534","last_page":"543"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microarchitecture","display_name":"Microarchitecture","score":0.5121212}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.782694},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7081869},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6905499},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.6320504},{"id":"https://openalex.org/C107598950","wikidata":"https://www.wikidata.org/wiki/Q259864","display_name":"Microarchitecture","level":2,"score":0.5121212},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.43610016},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3577198},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17202523},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.14671504},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsn.2007.8","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":16,"referenced_works":["https://openalex.org/W1973039798","https://openalex.org/W2007719944","https://openalex.org/W2007792906","https://openalex.org/W2027849669","https://openalex.org/W2036537371","https://openalex.org/W2041424982","https://openalex.org/W2064957549","https://openalex.org/W2067528876","https://openalex.org/W2097129252","https://openalex.org/W2122757690","https://openalex.org/W2125169487","https://openalex.org/W2134067926","https://openalex.org/W2157732684","https://openalex.org/W2158811675","https://openalex.org/W2165071510","https://openalex.org/W4231523873"],"related_works":["https://openalex.org/W3216201951","https://openalex.org/W3209466718","https://openalex.org/W2524718329","https://openalex.org/W2372318178","https://openalex.org/W2355543518","https://openalex.org/W2337334590","https://openalex.org/W2267274201","https://openalex.org/W2143925077","https://openalex.org/W206301406","https://openalex.org/W1530507059"],"abstract_inverted_index":{"This":[0,95],"paper":[1],"tackles":[2],"the":[3,11,25,35,47,67,92,109],"issue":[4],"of":[5,39,50,69,91,102,115,142],"modeling":[6,130],"chip":[7],"lifetime":[8,21],"reliability":[9,22,58,129,139],"at":[10,24],"architecture":[12],"level.":[13],"We":[14],"propose":[15],"a":[16,63,99,103,120],"new":[17,64,128],"and":[18,34,88,123,144],"robust":[19],"structure-aware":[20],"model":[23],"architecture-level,":[26],"where":[27],"devices":[28,41],"only":[29],"vulnerable":[30],"to":[31,77,83,107,135],"failure":[32,48,79,117],"mechanisms":[33,118],"effective":[36],"stress":[37],"condition":[38],"these":[40],"are":[42,133],"taken":[43],"into":[44,85],"account":[45],"for":[46,112,119],"rate":[49],"microarchitecture":[51],"structures.":[52],"In":[53],"addition,":[54],"we":[55],"present":[56],"this":[57,127],"analysis":[59,140],"framework":[60],"based":[61],"on":[62],"concept,":[65],"called":[66],"FIT":[68],"reference":[70,104,110],"circuit":[71,105],"or":[72],"FORC,":[73],"which":[74],"allows":[75],"architects":[76,132],"quantify":[78,108],"rates":[80],"without":[81],"having":[82],"delve":[84],"low-level":[86],"circuit-":[87],"technology-specific":[89],"details":[90],"implemented":[93],"architecture.":[94],"is":[96],"done":[97],"through":[98],"onetime":[100],"characterization":[101],"needed":[106],"FITs":[111],"each":[113],"class":[114],"modeled":[116],"given":[121],"technology":[122],"implementation":[124],"style.":[125],"With":[126],"framework,":[131],"empowered":[134],"proceed":[136],"with":[137],"architecture-level":[138],"independent":[141],"technological":[143],"environmental":[145],"parameters.":[146]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2114172921","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":6}],"updated_date":"2025-01-18T20:25:14.874222","created_date":"2016-06-24"}