乐胖代购免代理版

{"id":"https://openalex.org/W2139788277","doi":"https://doi.org/10.1109/dftvs.1996.572039","title":"Recovery schemes for mesh arrays utilizing dedicated spares","display_name":"Recovery schemes for mesh arrays utilizing dedicated spares","publication_year":2002,"publication_date":"2002-12-23","ids":{"openalex":"https://openalex.org/W2139788277","doi":"https://doi.org/10.1109/dftvs.1996.572039","mag":"2139788277"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.1996.572039","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086532279","display_name":"S. Goldberg","orcid":null},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]},{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.R. Goldberg","raw_affiliation_strings":["Department of Electrical & Computer Eng, State University of New York, University at Buffalo, Buffalo, NY, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical & Computer Eng, State University of New York, University at Buffalo, Buffalo, NY, USA","institution_ids":["https://openalex.org/I57206974","https://openalex.org/I63190737"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031947971","display_name":"Shambhu Upadhyaya","orcid":"https://orcid.org/0000-0002-0596-1703"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]},{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.J. Upadhyaya","raw_affiliation_strings":["Department of Electrical & Computer Eng, State University of New York, University at Buffalo, Buffalo, NY, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical & Computer Eng, State University of New York, University at Buffalo, Buffalo, NY, USA","institution_ids":["https://openalex.org/I57206974","https://openalex.org/I63190737"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111719185","display_name":"W.K. Fuchs","orcid":null},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W.K. Fuchs","raw_affiliation_strings":["School of Electrical & Computer Eng, Purdue University, West Lafayette, IN, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical & Computer Eng, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.187,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":1,"citation_normalized_percentile":{"value":0.265984,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":57,"max":64},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9987,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9977,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.7936494},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5316257}],"concepts":[{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.7936494},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.7527728},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7318963},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6982682},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5316257},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5254996},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.5227763},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4701108},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.44344768},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.42939386},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.4191438},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.41827175},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.38855436},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.16074508},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15510646},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.111411214},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.1996.572039","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.65,"display_name":"Decent work and economic growth","id":"https://metadata.un.org/sdg/8"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":8,"referenced_works":["https://openalex.org/W2016889832","https://openalex.org/W2035330061","https://openalex.org/W2073240183","https://openalex.org/W2086934045","https://openalex.org/W2127098656","https://openalex.org/W2139637245","https://openalex.org/W2146885799","https://openalex.org/W2148628237"],"related_works":["https://openalex.org/W2912704652","https://openalex.org/W2897533804","https://openalex.org/W2890506991","https://openalex.org/W2381161177","https://openalex.org/W2376859990","https://openalex.org/W2319226115","https://openalex.org/W2136799148","https://openalex.org/W2116314988","https://openalex.org/W2099111379","https://openalex.org/W1862835629"],"abstract_inverted_index":{"Error":[0],"recovery":[1,130],"capability":[2],"is":[3,26,146,162],"examined":[4],"in":[5,73,89,100,107,122,126,132,141,177,183,196,202],"processing":[6,186],"arrays":[7,179],"that":[8,42,59,154,180],"employ":[9],"spare":[10],"nodes":[11],"for":[12],"fault":[13,18,57],"tolerance.":[14],"Spares":[15,119,164],"can":[16,77,94],"provide":[17,60],"tolerance":[19,58],"to":[20,29,56,80,116],"high-performance":[21],"single-package":[22],"arrays,":[23],"where":[24],"it":[25],"not":[27,47],"feasible":[28],"repair":[30],"faulty":[31],"subsystems.":[32],"The":[33],"cost":[34,99],"of":[35,102,129,143,151,170,193,198],"such":[36,108],"a":[37,110,152],"fault-tolerance":[38],"solution,":[39],"redundant":[40],"hardware":[41,54],"idles":[43],"until":[44],"needed,":[45],"may":[46,112],"be":[48,52,78,95,114],"practical.":[49],"Manufacturers":[50],"must":[51],"offered":[53],"solutions":[55],"useful":[61],"work":[62],"at":[63],"all":[64],"times.":[65],"In":[66],"this":[67],"paper,":[68],"new":[69],"schemes":[70,195],"are":[71,181],"presented":[72],"which":[74],"idling":[75],"spares":[76],"utilized":[79],"improve":[81],"error":[82,86,144],"recovery.":[83],"Without":[84],"expedient":[85],"recovery,":[87],"computation":[88],"environments":[90,142,203],"experiencing":[91,134],"frequent":[92],"errors":[93],"burdened":[96,204],"with":[97,148,205],"extra":[98],"terms":[101,197],"job":[103,111,139,199],"completion":[104,140,200],"time.":[105],"Further,":[106],"environments,":[109],"never":[113],"able":[115],"reach":[117],"completion.":[118],"will":[120,165],"aid":[121,150],"the":[123,127,149,168,191],"validation":[124],"and":[125],"selection":[128],"points":[131],"systems":[133],"randomly":[135],"distributed":[136],"errors.":[137,207],"Successful":[138],"bursts":[145],"performed":[147],"scheme":[153],"identifies":[155],"reliable":[156,171],"data":[157],"when":[158],"periodic":[159],"on-line":[160],"testing":[161],"available.":[163],"help":[166],"identify":[167],"boundaries":[169],"data.":[172],"We":[173],"consider":[174],"these":[175],"features":[176],"mesh":[178],"used":[182],"digital":[184],"signal":[185],"applications.":[187],"Preliminary":[188],"simulations":[189],"highlight":[190],"overhead":[192],"our":[194],"times":[201],"transient":[206]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2139788277","counts_by_year":[],"updated_date":"2024-12-10T09:14:12.428585","created_date":"2016-06-24"}