乐胖代购免代理版

{"id":"https://openalex.org/W3159838738","doi":"https://doi.org/10.1109/ddecs52668.2021.9417073","title":"Prevention and Detection Methods of Systematic Failures in the Implementation of SoC Safety Mechanisms not Covered by Regular Functional Tests","display_name":"Prevention and Detection Methods of Systematic Failures in the Implementation of SoC Safety Mechanisms not Covered by Regular Functional Tests","publication_year":2021,"publication_date":"2021-04-07","ids":{"openalex":"https://openalex.org/W3159838738","doi":"https://doi.org/10.1109/ddecs52668.2021.9417073","mag":"3159838738"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs52668.2021.9417073","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079919263","display_name":"Denis Dutey","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Denis Dutey","raw_affiliation_strings":["Automotive Digital Solutions RnD department, STMicroelectronics, Grenoble, FRANCE"],"affiliations":[{"raw_affiliation_string":"Automotive Digital Solutions RnD department, STMicroelectronics, Grenoble, FRANCE","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022686253","display_name":"St\u00e9phane Martin","orcid":"https://orcid.org/0000-0003-4764-8886"},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Stephane Martin","raw_affiliation_strings":["Automotive Digital Solutions RnD department, STMicroelectronics, Grenoble, FRANCE"],"affiliations":[{"raw_affiliation_string":"Automotive Digital Solutions RnD department, STMicroelectronics, Grenoble, FRANCE","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088932469","display_name":"Anne Merlande","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Anne Merlande","raw_affiliation_strings":["Automotive Digital Solutions RnD department, STMicroelectronics, Grenoble, FRANCE"],"affiliations":[{"raw_affiliation_string":"Automotive Digital Solutions RnD department, STMicroelectronics, Grenoble, FRANCE","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070637987","display_name":"Om Ranjan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Om Ranjan","raw_affiliation_strings":["Automotive Digital Solutions RnD department, STMicroelectronics, Greater Noida, INDIA"],"affiliations":[{"raw_affiliation_string":"Automotive Digital Solutions RnD department, STMicroelectronics, Greater Noida, INDIA","institution_ids":["https://openalex.org/I4210094169"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.215,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.759712,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":67,"max":72},"biblio":{"volume":null,"issue":null,"first_page":"87","last_page":"92"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9986,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9986,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9827,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9592,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.79597485},{"id":"https://openalex.org/keywords/functional-testing","display_name":"Functional testing","score":0.5783905},{"id":"https://openalex.org/keywords/functional-verification","display_name":"Functional verification","score":0.48549297},{"id":"https://openalex.org/keywords/functional-requirement","display_name":"Functional requirement","score":0.45634565}],"concepts":[{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.84713006},{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.79597485},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6878303},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6128103},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5912905},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5842422},{"id":"https://openalex.org/C80823478","wikidata":"https://www.wikidata.org/wiki/Q4493432","display_name":"Functional testing","level":3,"score":0.5783905},{"id":"https://openalex.org/C62460635","wikidata":"https://www.wikidata.org/wiki/Q5508853","display_name":"Functional verification","level":3,"score":0.48549297},{"id":"https://openalex.org/C62235348","wikidata":"https://www.wikidata.org/wiki/Q3264234","display_name":"Functional requirement","level":2,"score":0.45634565},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.44534954},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.412535},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21691084},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.1844458},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.09938693},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs52668.2021.9417073","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.52,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"grants":[{"funder":"https://openalex.org/F4320322569","funder_display_name":"STMicroelectronics","award_id":null}],"datasets":[],"versions":[],"referenced_works_count":2,"referenced_works":["https://openalex.org/W2170203810","https://openalex.org/W2346966353"],"related_works":["https://openalex.org/W3159838738","https://openalex.org/W2990636847","https://openalex.org/W2898774465","https://openalex.org/W2212449581","https://openalex.org/W2121331887","https://openalex.org/W1994896487","https://openalex.org/W198947382","https://openalex.org/W1967381861","https://openalex.org/W1948102893","https://openalex.org/W140071659"],"abstract_inverted_index":{"Hardware":[0],"functional":[1,15,26,37],"safety":[2,16,27],"requirements":[3,28],"are":[4],"covered":[5,34],"by":[6,12,35,46],"verification":[7,98],"and":[8,59,95,99],"validation":[9],"methods":[10,39],"defined":[11],"ISO":[13],"26262":[14],"standard":[17],"for":[18,29,91],"automotive":[19,93],"electronic":[20,30],"systems.":[21],"The":[22],"implementation":[23,63,68,100],"of":[24,87],"most":[25],"devices":[31],"can":[32],"be":[33,73],"typical":[36],"test":[38],"at":[40],"Register":[41],"Transfer":[42],"Level":[43],"(RTL),":[44],"complemented":[45],"formal":[47],"proof":[48],"to":[49,56,60,105],"ensure":[50],"that":[51,102],"the":[52,57,61,81,85,92,97],"RTL":[53],"is":[54],"equivalent":[55],"netlist":[58],"physical":[62],"levels":[64],"beyond.":[65],"However,":[66],"some":[67],"failures":[69],"(systematic":[70],"errors)":[71],"cannot":[72],"detected":[74],"using":[75],"this":[76,107],"method.":[77],"This":[78],"paper":[79],"reports":[80],"cases":[82],"faced":[83],"during":[84],"development":[86],"a":[88],"complex":[89],"System-on-Chip":[90],"industry":[94],"discusses":[96],"checks":[101],"were":[103],"performed":[104],"fill":[106],"gap.":[108]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W3159838738","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2024-12-11T10:31:58.525200","created_date":"2021-05-10"}