乐胖代购免代理版

{"id":"https://openalex.org/W1963826203","doi":"https://doi.org/10.1109/ats.2013.18","title":"Test Generation of Path Delay Faults Induced by Defects in Power TSV","display_name":"Test Generation of Path Delay Faults Induced by Defects in Power TSV","publication_year":2013,"publication_date":"2013-11-01","ids":{"openalex":"https://openalex.org/W1963826203","doi":"https://doi.org/10.1109/ats.2013.18","mag":"1963826203"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2013.18","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024292663","display_name":"Chi-Jih Shih","orcid":null},"institutions":[],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chi-Jih Shih","raw_affiliation_strings":["Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038472871","display_name":"Shih-An Hsieh","orcid":null},"institutions":[],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shih-An Hsieh","raw_affiliation_strings":["Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040956103","display_name":"Yi-Chang Lu","orcid":"https://orcid.org/0000-0002-7638-0367"},"institutions":[],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Chang Lu","raw_affiliation_strings":["Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017361488","display_name":"James Chien-Mo Li","orcid":"https://orcid.org/0000-0002-4393-5186"},"institutions":[],"countries":["TW"],"is_corresponding":false,"raw_author_name":"James Chien-Mo Li","raw_affiliation_strings":["Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030643612","display_name":"Tzong\u2010Lin Wu","orcid":"https://orcid.org/0000-0002-3560-8898"},"institutions":[],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tzong-Lin Wu","raw_affiliation_strings":["Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NH, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NH, USA","institution_ids":["https://openalex.org/I170897317"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.331,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":2,"citation_normalized_percentile":{"value":0.413679,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":72,"max":76},"biblio":{"volume":null,"issue":null,"first_page":"43","last_page":"48"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9955,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9952,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.48480907},{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.46830404},{"id":"https://openalex.org/keywords/power-network-design","display_name":"Power network design","score":0.45687118}],"concepts":[{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5108218},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.51048505},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5085968},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5057368},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.48480907},{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.46830404},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4584176},{"id":"https://openalex.org/C164565468","wikidata":"https://www.wikidata.org/wiki/Q7236535","display_name":"Power network design","level":3,"score":0.45687118},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.42072836},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32237637},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24832997},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17800671},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.17184666},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.16716501},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09438887},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.07536951},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06983027},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2013.18","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.54}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":16,"referenced_works":["https://openalex.org/W1963499756","https://openalex.org/W1965451131","https://openalex.org/W1980043105","https://openalex.org/W2013679798","https://openalex.org/W2016089829","https://openalex.org/W2046890434","https://openalex.org/W2059835875","https://openalex.org/W2095790208","https://openalex.org/W2100516830","https://openalex.org/W2102304175","https://openalex.org/W2104451924","https://openalex.org/W2143502515","https://openalex.org/W2162547872","https://openalex.org/W2169862329","https://openalex.org/W2629157711","https://openalex.org/W4237442307"],"related_works":["https://openalex.org/W4386632162","https://openalex.org/W4256630426","https://openalex.org/W3047964545","https://openalex.org/W2932995367","https://openalex.org/W2811251486","https://openalex.org/W2596490588","https://openalex.org/W2171236961","https://openalex.org/W2030468620","https://openalex.org/W1981500796","https://openalex.org/W1952114904"],"abstract_inverted_index":{"This":[0,19,65,123],"paper":[1,20,66],"presents":[2],"a":[3,22,30,68],"novel":[4],"test":[5,69,121],"generation":[6,70],"technique":[7,84,124],"for":[8],"defective":[9,79],"power":[10,33,39,51,61,80,113],"TSV":[11,40,52,62,114],"induced":[12,77,111],"path":[13,74,108],"delay":[14,75,109],"faults":[15,76,110],"in":[16,29,38,50],"3D":[17,32,94],"IC.":[18],"provides":[21],"simple":[23],"close-form":[24],"analysis":[25],"to":[26,72],"show":[27],"that,":[28],"regular":[31],"grid":[34],"model,":[35],"open":[36],"defects":[37,49],"do":[41],"not":[42],"induce":[43],"serious":[44],"IR":[45],"drop.":[46],"However,":[47],"leakage":[48],"should":[53],"be":[54,116],"tested,":[55],"even":[56],"though":[57],"the":[58,98],"number":[59],"of":[60,100],"is":[63,85],"large.":[64],"proposes":[67],"flow":[71],"detect":[73],"by":[78,112,118],"TSV.":[81],"The":[82],"proposed":[83],"demonstrated":[86],"on":[87],"an":[88],"18-tier,":[89],"7":[90,92],"x":[91],"multi-core":[93],"IC":[95],"model.":[96],"In":[97],"experiment":[99],"b18":[101],"and":[102],"b19":[103],"benchmark":[104],"circuits,":[105],"all":[106],"detectable":[107],"can":[115],"tested":[117],"around":[119],"hundred":[120],"patterns.":[122],"requires":[125],"no":[126],"extra":[127],"DfT":[128],"hardware":[129],"overhead.":[130]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1963826203","counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2024-12-13T18:32:30.039434","created_date":"2016-06-24"}