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{"id":"https://openalex.org/W2141375945","doi":"https://doi.org/10.1109/ats.2003.1250839","title":"March SL: a test for all static linked memory faults","display_name":"March SL: a test for all static linked memory faults","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W2141375945","doi":"https://doi.org/10.1109/ats.2003.1250839","mag":"2141375945"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250839","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067993330","display_name":"Hamdioui","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"funder","lineage":["https://openalex.org/I1343180700"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"funder","lineage":["https://openalex.org/I98358874"]}],"countries":["NL","US"],"is_corresponding":false,"raw_author_name":"None Hamdioui","raw_affiliation_strings":["Faculty of Information Technology and Systems, Computer Engineering Laboratory, Delft University of Technnology, Delft, Netherlands","Intel Corporation, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Faculty of Information Technology and Systems, Computer Engineering Laboratory, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006954355","display_name":"Al-Ars","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"funder","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"None Al-Ars","raw_affiliation_strings":["Faculty of Information Technology and Systems, Computer Engineering Laboratory, Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Information Technology and Systems, Computer Engineering Laboratory, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037970821","display_name":"van de Goor","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"funder","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"None van de Goor","raw_affiliation_strings":["Faculty of Information Technology and Systems, Computer Engineering Laboratory, Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Information Technology and Systems, Computer Engineering Laboratory, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035031298","display_name":"Rodgers","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"funder","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"None Rodgers","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.808,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":6,"citation_normalized_percentile":{"value":0.598528,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":76,"max":77},"biblio":{"volume":null,"issue":null,"first_page":"372","last_page":"377"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6428232},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.55760086},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.54761577},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.49132338},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.48976946},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.48222885},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.42680284},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.42164952},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.41705725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16467038},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12201169},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.10970035},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10320592},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.07788953},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.05845177},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.05097118},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250839","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":16,"referenced_works":["https://openalex.org/W1667843264","https://openalex.org/W1677852443","https://openalex.org/W1696527132","https://openalex.org/W1982562477","https://openalex.org/W2007093221","https://openalex.org/W2077389615","https://openalex.org/W2078063367","https://openalex.org/W2100287799","https://openalex.org/W2106246015","https://openalex.org/W2106518380","https://openalex.org/W2106935654","https://openalex.org/W2128999275","https://openalex.org/W2144828465","https://openalex.org/W2151318384","https://openalex.org/W4236231374","https://openalex.org/W7487116"],"related_works":["https://openalex.org/W4301628046","https://openalex.org/W2951627661","https://openalex.org/W2408214455","https://openalex.org/W2383699822","https://openalex.org/W2170587542","https://openalex.org/W2129713538","https://openalex.org/W2055589924","https://openalex.org/W2047903206","https://openalex.org/W2031574699","https://openalex.org/W1991935474"],"abstract_inverted_index":{"The":[0,21,36,54],"analysis":[1],"of":[2,26,58],"linked":[3,34,51],"faults":[4,48],"has":[5],"proven":[6],"to":[7,30],"be":[8],"a":[9,24,41],"source":[10],"for":[11],"new":[12,28],"memory":[13],"tests,":[14],"characterized":[15],"by":[16],"an":[17,59],"increased":[18],"fault":[19,52],"coverage.":[20],"paper":[22],"gives":[23],"set":[25],"five":[27],"tests":[29,37],"target":[31],"all":[32,47],"possible":[33],"faults.":[35,77],"are":[38,64],"merged":[39],"into":[40],"single":[42],"test,":[43],"March":[44,69],"SL,":[45],"detecting":[46],"in":[49],"the":[50],"space.":[53],"preliminary":[55],"test":[56],"results":[57],"experiment":[60],"done":[61],"at":[62],"Intel":[63],"reported;":[65],"they":[66],"show":[67],"that":[68],"SL":[70],"scores":[71],"high":[72],"and":[73],"detects":[74],"some":[75],"unique":[76]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2141375945","counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-04-16T11:40:01.028491","created_date":"2016-06-24"}