{"id":"https://openalex.org/W3111790011","doi":"https://doi.org/10.1109/access.2020.3043817","title":"Research on Double Edge Detection Method of Midsole Based on Improved Otsu Method","display_name":"Research on Double Edge Detection Method of Midsole Based on Improved Otsu Method","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3111790011","doi":"https://doi.org/10.1109/access.2020.3043817","mag":"3111790011"},"language":"en","primary_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3043817","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09290011.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},"type":"article","type_crossref":"journal-article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09290011.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100760521","display_name":"Ruizhi Li","orcid":"https://orcid.org/0000-0003-2915-8242"},"institutions":[{"id":"https://openalex.org/I2799449666","display_name":"State Ethnic Affairs Commission","ror":"https://ror.org/01p9g6b97","country_code":"CN","type":"government","lineage":["https://openalex.org/I2799449666"]},{"id":"https://openalex.org/I145897649","display_name":"Minzu University of China","ror":"https://ror.org/0044e2g62","country_code":"CN","type":"education","lineage":["https://openalex.org/I145897649"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruizhi Li","raw_affiliation_strings":["Key Laboratory of Green Manufacturing of Super-Light Elastomer Materials of State Ethnic Affairs Commission (Hubei Minzu University), Enshi, China","School of Mathematics and Statistics, Hubei Minzu University, Enshi, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Green Manufacturing of Super-Light Elastomer Materials of State Ethnic Affairs Commission (Hubei Minzu University), Enshi, China","institution_ids":["https://openalex.org/I2799449666"]},{"raw_affiliation_string":"School of Mathematics and Statistics, Hubei Minzu University, Enshi, China","institution_ids":["https://openalex.org/I145897649"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101929695","display_name":"Tian Fang","orcid":"https://orcid.org/0000-0002-5871-3455"},"institutions":[{"id":"https://openalex.org/I145897649","display_name":"Minzu University of China","ror":"https://ror.org/0044e2g62","country_code":"CN","type":"education","lineage":["https://openalex.org/I145897649"]},{"id":"https://openalex.org/I2799449666","display_name":"State Ethnic Affairs Commission","ror":"https://ror.org/01p9g6b97","country_code":"CN","type":"government","lineage":["https://openalex.org/I2799449666"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fang Tian","raw_affiliation_strings":["Key Laboratory of Green Manufacturing of Super-Light Elastomer Materials of State Ethnic Affairs Commission (Hubei Minzu University), Enshi, China","School of Advanced Materials and Mechatronic Engineering, Hubei Minzu University, Enshi, China"],"affiliations":[{"raw_affiliation_string":"School of Advanced Materials and Mechatronic Engineering, Hubei Minzu University, Enshi, China","institution_ids":["https://openalex.org/I145897649"]},{"raw_affiliation_string":"Key Laboratory of Green Manufacturing of Super-Light Elastomer Materials of State Ethnic Affairs Commission (Hubei Minzu University), Enshi, China","institution_ids":["https://openalex.org/I2799449666"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022725269","display_name":"Shiqiang Chen","orcid":"https://orcid.org/0000-0002-2171-5350"},"institutions":[{"id":"https://openalex.org/I145897649","display_name":"Minzu University of China","ror":"https://ror.org/0044e2g62","country_code":"CN","type":"education","lineage":["https://openalex.org/I145897649"]},{"id":"https://openalex.org/I2799449666","display_name":"State Ethnic Affairs Commission","ror":"https://ror.org/01p9g6b97","country_code":"CN","type":"government","lineage":["https://openalex.org/I2799449666"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiqiang Chen","raw_affiliation_strings":["Key Laboratory of Green Manufacturing of Super-Light Elastomer Materials of State Ethnic Affairs Commission (Hubei Minzu University), Enshi, China","School of Advanced Materials and Mechatronic Engineering, Hubei Minzu University, Enshi, China"],"affiliations":[{"raw_affiliation_string":"School of Advanced Materials and Mechatronic Engineering, Hubei Minzu University, Enshi, China","institution_ids":["https://openalex.org/I145897649"]},{"raw_affiliation_string":"Key Laboratory of Green Manufacturing of Super-Light Elastomer Materials of State Ethnic Affairs Commission (Hubei Minzu University), Enshi, China","institution_ids":["https://openalex.org/I2799449666"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850,"provenance":"doaj"},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850,"provenance":"doaj"},"fwci":0.642,"has_fulltext":true,"fulltext_origin":"pdf","cited_by_count":6,"citation_normalized_percentile":{"value":0.805905,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":81,"max":82},"biblio":{"volume":"8","issue":null,"first_page":"221539","last_page":"221552"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9963,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10052","display_name":"Medical Image Segmentation Techniques","score":0.9888,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/otsus-method","display_name":"Otsu's method","score":0.7049308},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.5488029}],"concepts":[{"id":"https://openalex.org/C21729346","wikidata":"https://www.wikidata.org/wiki/Q2444417","display_name":"Otsu's method","level":4,"score":0.7049308},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.67819417},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.6122601},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5618828},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.5488029},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.48856363},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.48775297},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.47425428},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.45198098},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.44808167},{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.42741656},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.40330818},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.27535897},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.0},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3043817","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09290011.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},{"is_oa":false,"landing_page_url":"https://doaj.org/article/b03d85ffcfeb4b54b22edfc33185a76d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.3043817","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09290011.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},"sustainable_development_goals":[{"display_name":"Peace, justice, and strong institutions","score":0.58,"id":"https://metadata.un.org/sdg/16"},{"display_name":"Reduced inequalities","score":0.44,"id":"https://metadata.un.org/sdg/10"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":39,"referenced_works":["https://openalex.org/W1687480514","https://openalex.org/W1909031205","https://openalex.org/W1947430577","https://openalex.org/W1972544340","https://openalex.org/W1976047850","https://openalex.org/W1980541774","https://openalex.org/W2017745767","https://openalex.org/W2030747196","https://openalex.org/W2043937508","https://openalex.org/W2048335335","https://openalex.org/W2048869244","https://openalex.org/W2054831422","https://openalex.org/W2060768811","https://openalex.org/W2103546675","https://openalex.org/W2110158442","https://openalex.org/W2116040950","https://openalex.org/W2133003941","https://openalex.org/W2137514693","https://openalex.org/W2145023731","https://openalex.org/W2146208579","https://openalex.org/W2155487652","https://openalex.org/W2163729532","https://openalex.org/W2165893502","https://openalex.org/W2239224477","https://openalex.org/W2245148488","https://openalex.org/W2495348128","https://openalex.org/W2566356915","https://openalex.org/W2900685287","https://openalex.org/W2901127025","https://openalex.org/W2928793639","https://openalex.org/W2945259249","https://openalex.org/W2945270739","https://openalex.org/W2963723365","https://openalex.org/W3003592301","https://openalex.org/W3081164467","https://openalex.org/W3102326502","https://openalex.org/W344203161","https://openalex.org/W4234377959","https://openalex.org/W4256068510"],"related_works":["https://openalex.org/W4306937392","https://openalex.org/W3162267746","https://openalex.org/W2981960317","https://openalex.org/W2541611006","https://openalex.org/W2377426844","https://openalex.org/W2371320458","https://openalex.org/W2360695088","https://openalex.org/W2071534821","https://openalex.org/W2015185374","https://openalex.org/W1614535104"],"abstract_inverted_index":{"The":[0,156,187,198],"midsole":[1,19,50,84],"is":[2,113,124,141,190,196],"an":[3,57],"important":[4],"part":[5],"of":[6,17,33,48,72,130,167,184],"the":[7,14,18,31,45,49,77,83,93,100,107,111,117,120,128,131,134,145,153,162,181,185,192,202],"shoe,":[8],"but":[9],"in":[10,86,205],"its":[11,53],"industrial":[12,34],"production,":[13],"surface":[15,41],"quality":[16],"currently":[20],"relies":[21],"on":[22],"manual":[23],"testing.":[24],"It":[25,89],"cost":[26],"high":[27],"and":[28,99,119,148,161,178,212],"cannot":[29],"meet":[30],"needs":[32],"online":[35,40],"real-time":[36],"detection.":[37],"To":[38,126],"realize":[39,144],"defect":[42],"detection,":[43,133],"extracting":[44],"double":[46,70,182],"edges":[47,71,118,183],"resulting":[51],"from":[52],"special":[54],"structure":[55],"becomes":[56],"indispensable":[58],"pre-work.":[59],"This":[60,74,174],"paper":[61,207],"proposes":[62],"a":[63],"two-step":[64],"Otsu":[65,79],"method":[66,75,80,97,103,140,175,204],"(TT-Otsu)":[67],"to":[68,81,105,115,143,152,172],"extract":[69,116,180],"products.":[73],"adopts":[76],"improved":[78],"process":[82],"image":[85,112],"two":[87],"steps.":[88],"respectively":[90],"combines":[91],"with":[92],"Weighted":[94],"Object":[95],"Variance":[96],"(WOV)":[98],"Neighborhood":[101],"Valley-Emphasis":[102],"(NVE)":[104],"calculate":[106],"optimal":[108],"threshold.":[109],"Then":[110],"segmented":[114],"misclassification":[121],"error":[122],"(ME)":[123],"0.0007.":[125],"ensure":[127],"accuracy":[129],"edge":[132],"neighborhood":[135],"gradient":[136],"extreme":[137],"value":[138],"discrimination":[139],"used":[142],"local":[146],"self-checking":[147],"make":[149],"appropriate":[150],"adjustments":[151],"deviated":[154],"edge.":[155],"false":[157,163],"positive":[158],"rate":[159,165,189],"(FPR)":[160],"negative":[164],"(FNR)":[166],"TT-Otsu":[168],"are":[169],"approximately":[170],"equal":[171],"5%.":[173],"can":[176],"effectively":[177],"clearly":[179],"midsole.":[186],"precision":[188],"95.61%,":[191],"average":[193],"running":[194],"time":[195],"1.8s.":[197],"experiment":[199],"demonstrates":[200],"that":[201],"proposed":[203],"this":[206],"has":[208],"good":[209,213],"detection":[210],"performance":[211],"applicability.":[214]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W3111790011","counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-01-20T11:32:21.437619","created_date":"2020-12-21"}