乐胖代购免代理版

{"id":"https://openalex.org/W3016294502","doi":"https://doi.org/10.1109/access.2020.2987651","title":"Study on Composite Electromagnetic Scattering Characteristics of Low-Altitude Target Above Valley Composite Rough Surface Using Hybrid SBR-EEC Method","display_name":"Study on Composite Electromagnetic Scattering Characteristics of Low-Altitude Target Above Valley Composite Rough Surface Using Hybrid SBR-EEC Method","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3016294502","doi":"https://doi.org/10.1109/access.2020.2987651","mag":"3016294502"},"language":"en","primary_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2987651","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09066963.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},"type":"article","type_crossref":"journal-article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09066963.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043489566","display_name":"Gao Xiang Zou","orcid":"https://orcid.org/0000-0003-3578-8726"},"institutions":[{"id":"https://openalex.org/I4210104252","display_name":"Air Force Engineering University","ror":"https://ror.org/00seraz22","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210104252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gaoxiang Zou","raw_affiliation_strings":["Air Force Engineering University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Air Force Engineering University, Xi'an, China","institution_ids":["https://openalex.org/I4210104252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060047479","display_name":"Chuangming Tong","orcid":"https://orcid.org/0000-0002-2379-9682"},"institutions":[{"id":"https://openalex.org/I4210104252","display_name":"Air Force Engineering University","ror":"https://ror.org/00seraz22","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210104252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuangming Tong","raw_affiliation_strings":["Air Force Engineering University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Air Force Engineering University, Xi'an, China","institution_ids":["https://openalex.org/I4210104252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088025801","display_name":"Jian Zhu","orcid":"https://orcid.org/0009-0000-7991-9009"},"institutions":[{"id":"https://openalex.org/I4210105312","display_name":"Shanghai Power Equipment Research Institute","ror":"https://ror.org/01pw44479","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210105312"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Zhu","raw_affiliation_strings":["Shanghai Radio Equipment Research Institute, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Radio Equipment Research Institute, Shanghai, China","institution_ids":["https://openalex.org/I4210105312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068629355","display_name":"Hua Long Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104252","display_name":"Air Force Engineering University","ror":"https://ror.org/00seraz22","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210104252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hualong Sun","raw_affiliation_strings":["Air Force Engineering University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Air Force Engineering University, Xi'an, China","institution_ids":["https://openalex.org/I4210104252"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100416313","display_name":"Peng Peng","orcid":"https://orcid.org/0000-0001-9033-1361"},"institutions":[{"id":"https://openalex.org/I4210104252","display_name":"Air Force Engineering University","ror":"https://ror.org/00seraz22","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210104252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Peng","raw_affiliation_strings":["Air Force Engineering University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"Air Force Engineering University, Xi'an, China","institution_ids":["https://openalex.org/I4210104252"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850,"provenance":"doaj"},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850,"provenance":"doaj"},"fwci":0.391,"has_fulltext":true,"fulltext_origin":"pdf","cited_by_count":9,"citation_normalized_percentile":{"value":0.475961,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":85,"max":86},"biblio":{"volume":"8","issue":null,"first_page":"72298","last_page":"72307"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.9967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9966,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/normalization","display_name":"Normalization","score":0.5900749},{"id":"https://openalex.org/keywords/low-altitude","display_name":"Low altitude","score":0.58339155}],"concepts":[{"id":"https://openalex.org/C104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","level":2,"score":0.8437821},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.7722292},{"id":"https://openalex.org/C136886441","wikidata":"https://www.wikidata.org/wiki/Q926129","display_name":"Normalization (sociology)","level":2,"score":0.5900749},{"id":"https://openalex.org/C2993172488","wikidata":"https://www.wikidata.org/wiki/Q190200","display_name":"Low altitude","level":3,"score":0.58339155},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.54368395},{"id":"https://openalex.org/C6350597","wikidata":"https://www.wikidata.org/wiki/Q339495","display_name":"Altitude (triangle)","level":2,"score":0.51578236},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42002147},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33672968},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.29970253},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.29595393},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19538757},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.07496405},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C19165224","wikidata":"https://www.wikidata.org/wiki/Q23404","display_name":"Anthropology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2987651","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09066963.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},{"is_oa":false,"landing_page_url":"https://doaj.org/article/f9556897e6344677a01c4df4fc09c011","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2020.2987651","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8948470/09066963.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},"sustainable_development_goals":[],"grants":[{"funder":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China","award_id":"61901510"},{"funder":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China","award_id":"61372033"}],"datasets":[],"versions":[],"referenced_works_count":30,"referenced_works":["https://openalex.org/W1536103920","https://openalex.org/W1972678233","https://openalex.org/W1973062110","https://openalex.org/W1974693746","https://openalex.org/W2029751976","https://openalex.org/W2036596753","https://openalex.org/W2054380687","https://openalex.org/W2069756757","https://openalex.org/W2084385130","https://openalex.org/W2099911521","https://openalex.org/W2101081956","https://openalex.org/W2124924538","https://openalex.org/W2126755980","https://openalex.org/W2130082127","https://openalex.org/W2131000883","https://openalex.org/W2131520142","https://openalex.org/W2133399258","https://openalex.org/W2136893829","https://openalex.org/W2137978476","https://openalex.org/W2152328235","https://openalex.org/W2157902891","https://openalex.org/W2200049163","https://openalex.org/W2221402936","https://openalex.org/W2581958513","https://openalex.org/W2757250860","https://openalex.org/W2772885895","https://openalex.org/W2781803013","https://openalex.org/W2902609267","https://openalex.org/W2903919174","https://openalex.org/W44028309"],"related_works":["https://openalex.org/W4237620542","https://openalex.org/W2945563562","https://openalex.org/W2406921723","https://openalex.org/W2386865535","https://openalex.org/W2372292493","https://openalex.org/W2366663192","https://openalex.org/W2361714509","https://openalex.org/W2353302948","https://openalex.org/W2087911195","https://openalex.org/W1510008292"],"abstract_inverted_index":{"The":[0,16],"composite":[1,11,17,40,132],"electromagnetic":[2],"(EM)":[3],"scattering":[4,42,115,128],"characteristics":[5,116],"of":[6,30,102,117,130],"low-altitude":[7,44,118],"target":[8,45,85,119],"above":[9,46,120],"valley":[10,31,47,121],"rough":[12,18],"surface":[13,19],"are":[14,123],"studied.":[15],"modeling":[20],"theory":[21],"is":[22,65,77],"adopted":[23],"to":[24,79,126],"simulate":[25],"the":[26,39,73,81,98,109,113],"natural":[27],"cavity":[28],"structure":[29],"environment.":[32],"Aiming":[33],"at":[34],"efficiently":[35],"and":[36,54,59,86,88,100,134],"accurately":[37],"calculate":[38],"EM":[41,114],"from":[43],"environment,":[48,87],"a":[49],"hybrid":[50,104,110],"method":[51,64,70,90],"combining":[52],"shooting":[53],"bouncing":[55],"ray":[56],"(SBR)":[57],"technique":[58],"equivalent":[60],"edge":[61,93],"currents":[62],"(EEC)":[63],"proposed,":[66],"in":[67],"which":[68],"SBR":[69],"based":[71,107],"on":[72,108],"ray-density":[74],"normalization":[75],"(RDN)":[76],"applied":[78],"consider":[80],"multiple":[82],"interactions":[83],"between":[84],"EEC":[89],"meliorates":[91],"target's":[92],"diffraction.":[94],"Numerical":[95],"examples":[96],"illustrate":[97],"efficiency":[99],"validation":[101],"proposed":[103],"method.":[105],"Finally,":[106],"SBR-EEC":[111],"method,":[112],"environment":[122],"further":[124],"investigated":[125],"show":[127],"mechanisms":[129],"this":[131],"model":[133],"provide":[135],"some":[136],"useful":[137],"conclusions":[138],"through":[139],"physical":[140],"phenomena.":[141]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W3016294502","counts_by_year":[{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1}],"updated_date":"2025-01-20T10:24:34.996819","created_date":"2020-04-24"}