{"id":"https://openalex.org/W1538049194","doi":"https://doi.org/10.1109/19.918112","title":"Transport behavior of commercially available 100-\u03a9 standard resistors","display_name":"Transport behavior of commercially available 100-\u03a9 standard resistors","publication_year":2001,"publication_date":"2001-04-01","ids":{"openalex":"https://openalex.org/W1538049194","doi":"https://doi.org/10.1109/19.918112","mag":"1538049194"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/19.918112","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012111964","display_name":"B. Schumacher","orcid":"https://orcid.org/0000-0001-5353-3722"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B. Schumacher","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065586582","display_name":"P. Warnecke","orcid":null},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Warnecke","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080825075","display_name":"W. Poirier","orcid":"https://orcid.org/0000-0001-8006-4853"},"institutions":[],"countries":["FR"],"is_corresponding":false,"raw_author_name":"W. Poirier","raw_affiliation_strings":["Laboratoire Central des Industries Electriques, Paris, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire Central des Industries Electriques, Paris, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045490877","display_name":"Isabella Delgado","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111132","display_name":"Centro Espa\u00f1ol de Metrolog\u00eda","ror":"https://ror.org/022r8xe61","country_code":"ES","type":"other","lineage":["https://openalex.org/I4210111132"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"I. Delgado","raw_affiliation_strings":["Spanish Metrology Centre (CEM), Madrid, Spain"],"affiliations":[{"raw_affiliation_string":"Spanish Metrology Centre (CEM), Madrid, Spain","institution_ids":["https://openalex.org/I4210111132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018770316","display_name":"Z. Msimang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119037","display_name":"National Metrology Institute of South Africa","ror":"https://ror.org/02j01mp63","country_code":"ZA","type":"funder","lineage":["https://openalex.org/I4210119037"]}],"countries":["ZA"],"is_corresponding":false,"raw_author_name":"Z. Msimang","raw_affiliation_strings":["CSIR-National Metrology Laboratory, Pretoria, South Africa"],"affiliations":[{"raw_affiliation_string":"CSIR-National Metrology Laboratory, Pretoria, South Africa","institution_ids":["https://openalex.org/I4210119037"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066939020","display_name":"G. Boella","orcid":null},"institutions":[],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Boella","raw_affiliation_strings":["Istituto Elettrotecnico Nazionale, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Istituto Elettrotecnico Nazionale, Turin, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047716300","display_name":"P O Hetland","orcid":null},"institutions":[{"id":"https://openalex.org/I2801389564","display_name":"Norwegian Metrology Service","ror":"https://ror.org/010jktr86","country_code":"NO","type":"government","lineage":["https://openalex.org/I2801389564","https://openalex.org/I4210116418","https://openalex.org/I4210149801"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"P.O. Hetland","raw_affiliation_strings":["Justervesenet, Kjeller, Norway"],"affiliations":[{"raw_affiliation_string":"Justervesenet, Kjeller, Norway","institution_ids":["https://openalex.org/I2801389564"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055496161","display_name":"Rand Elmquist","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.E. Elmquist","raw_affiliation_strings":["National Institute for Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5116130590","display_name":"J.M. Williams","orcid":"https://orcid.org/0000-0001-6490-4226"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"J. Williams","raw_affiliation_strings":["National Physical Laboratory, Teddington, UK"],"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, UK","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058884526","display_name":"Dave Inglis","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159778","display_name":"National Research Council Canada","ror":"https://ror.org/04mte1k06","country_code":"CA","type":"government","lineage":["https://openalex.org/I4210159778"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"D. Inglis","raw_affiliation_strings":["National Research Council, Ottawa, Canada"],"affiliations":[{"raw_affiliation_string":"National Research Council, Ottawa, Canada","institution_ids":["https://openalex.org/I4210159778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064963746","display_name":"B. Jeckelmann","orcid":"https://orcid.org/0000-0003-0775-3155"},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"B. Jeckelmann","raw_affiliation_strings":["Swiss Federal Office of Metrology, Bern, Switzerland"],"affiliations":[{"raw_affiliation_string":"Swiss Federal Office of Metrology, Bern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027860765","display_name":"Ove Gunnarsson","orcid":null},"institutions":[],"countries":["SE"],"is_corresponding":false,"raw_author_name":"O. Gunnarsson","raw_affiliation_strings":["Swedish National Testing and Research Institute, Boras, Sweden"],"affiliations":[{"raw_affiliation_string":"Swedish National Testing and Research Institute, Boras, Sweden","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077702774","display_name":"A. Satrapinsky","orcid":null},"institutions":[{"id":"https://openalex.org/I133698016","display_name":"National metrology institute VTT MIKES","ror":"https://ror.org/0398a1r53","country_code":"FI","type":"facility","lineage":["https://openalex.org/I133698016","https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"A. Satrapinsky","raw_affiliation_strings":["Center for Metrology and Accreditation, Espoo, Finland"],"affiliations":[{"raw_affiliation_string":"Center for Metrology and Accreditation, Espoo, Finland","institution_ids":["https://openalex.org/I133698016"]}]}],"institution_assertions":[],"countries_distinct_count":12,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":8,"citation_normalized_percentile":{"value":0.746051,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":78,"max":79},"biblio":{"volume":"50","issue":"2","first_page":"242","last_page":"244"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9994,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9994,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9976,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.9823721},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6207289},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5808764},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.45079616},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.4394208},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3329129},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33187425},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10990462},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09019396}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/19.918112","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.71}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":9,"referenced_works":["https://openalex.org/W1506270585","https://openalex.org/W1867672208","https://openalex.org/W2007261492","https://openalex.org/W2038038773","https://openalex.org/W2071597583","https://openalex.org/W2108099920","https://openalex.org/W2171630717","https://openalex.org/W3021958496","https://openalex.org/W4244808674"],"related_works":["https://openalex.org/W4385452214","https://openalex.org/W4366783034","https://openalex.org/W4313221225","https://openalex.org/W3119249758","https://openalex.org/W2922086473","https://openalex.org/W2748952813","https://openalex.org/W2150642609","https://openalex.org/W2034349229","https://openalex.org/W2005410346","https://openalex.org/W1972415042"],"abstract_inverted_index":{"Several":[0],"types":[1,138],"of":[2,42,53,65,69,75,129,139],"commercial":[3],"100-/spl":[4,77],"Omega/":[5,78],"resistors":[6,44,79,100,131,145],"can":[7],"be":[8],"used":[9],"with":[10,148],"the":[11,17,22,39,63,99,117,126,136],"cryogenic":[12],"current":[13],"comparator":[14],"to":[15,28,32,62,87],"maintain":[16],"resistance":[18,34,107],"unit,":[19],"derived":[20],"from":[21,80],"quantized":[23,105],"Hall":[24,106],"effect":[25],"(QHE),":[26],"and":[27,116],"disseminate":[29],"this":[30],"unit":[31],"laboratory":[33],"standards.":[35],"Up":[36],"until":[37],"now,":[38],"transport":[40,127],"behavior":[41],"these":[43,130,144],"has":[45,84,113],"not":[46],"been":[47,85,114],"investigated.":[48],"Such":[49],"an":[50],"investigation":[51],"is":[52],"importance":[54],"for":[55,135],"carrying":[56],"out":[57],"comparisons":[58,147],"that":[59,125],"are":[60,119,132],"close":[61],"level":[64],"a":[66,123],"direct":[67],"comparison":[68],"two":[70],"QHE":[71],"apparatuses.":[72],"A":[73,109],"set":[74],"five":[76],"three":[81],"different":[82,137],"manufacturers":[83],"sent":[86],"11":[88],"participating":[89],"national":[90],"metrological":[91],"institutes.":[92],"All":[93],"laboratories":[94],"but":[95],"one":[96],"have":[97],"measured":[98],"based":[101],"on":[102],"their":[103],"laboratory's":[104],"measurements.":[108],"constant":[110],"drift":[111],"model":[112],"applied,":[115],"results":[118],"evaluated":[120],"in":[121,154],"such":[122],"way":[124],"properties":[128],"treated":[133],"independently":[134],"resistor.":[140],"Under":[141],"certain":[142],"conditions,":[143],"allow":[146],"uncertainties":[149],"better":[150],"than":[151],"1":[152],"part":[153],"10/sup":[155],"8/.":[156]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1538049194","counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-03-18T00:56:37.226148","created_date":"2016-06-24"}