乐胖代购免代理版

{"id":"https://openalex.org/W2036673119","doi":"https://doi.org/10.1109/10.43616","title":"Errors due to measuring voltage on current-carrying electrodes in electric current computed tomography","display_name":"Errors due to measuring voltage on current-carrying electrodes in electric current computed tomography","publication_year":1990,"publication_date":"1990-01-01","ids":{"openalex":"https://openalex.org/W2036673119","doi":"https://doi.org/10.1109/10.43616","mag":"2036673119","pmid":"https://pubmed.ncbi.nlm.nih.gov/2303271"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/10.43616","pdf_url":null,"source":{"id":"https://openalex.org/S5240358","display_name":"IEEE Transactions on Biomedical Engineering","issn_l":"0018-9294","issn":["0018-9294","1558-2531"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041186211","display_name":"Kuo\u2010Sheng Cheng","orcid":"https://orcid.org/0000-0002-0913-246X"},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"funder","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.-S. Cheng","raw_affiliation_strings":["Rensselaer, Polytech. Inst., Troy, NY, USA"],"affiliations":[{"raw_affiliation_string":"Rensselaer, Polytech. Inst., Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022519243","display_name":"Steven J. Simske","orcid":null},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"funder","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.J. Simske","raw_affiliation_strings":["Rensselaer, Polytech. Inst., Troy, NY, USA"],"affiliations":[{"raw_affiliation_string":"Rensselaer, Polytech. Inst., Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017322317","display_name":"David Isaacson","orcid":null},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"funder","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Isaacson","raw_affiliation_strings":["Rensselaer, Polytech. Inst., Troy, NY, USA"],"affiliations":[{"raw_affiliation_string":"Rensselaer, Polytech. Inst., Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020130465","display_name":"J.C. Newell","orcid":"https://orcid.org/0000-0002-3742-2640"},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"funder","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.C. Newell","raw_affiliation_strings":["Rensselaer, Polytech. Inst., Troy, NY, USA"],"affiliations":[{"raw_affiliation_string":"Rensselaer, Polytech. Inst., Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043312961","display_name":"D.G. Gisser","orcid":null},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"funder","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.G. Gisser","raw_affiliation_strings":["Rensselaer, Polytech. Inst., Troy, NY, USA"],"affiliations":[{"raw_affiliation_string":"Rensselaer, Polytech. Inst., Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.916,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":42,"citation_normalized_percentile":{"value":0.910548,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":92},"biblio":{"volume":"37","issue":"1","first_page":"60","last_page":"65"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9857,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9569,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electric-current","display_name":"Electric current","score":0.50090194}],"concepts":[{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.7135975},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5942491},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.566275},{"id":"https://openalex.org/C116468062","wikidata":"https://www.wikidata.org/wiki/Q11651","display_name":"Electric current","level":2,"score":0.50090194},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4627016},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.45072085},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44470912},{"id":"https://openalex.org/C58570533","wikidata":"https://www.wikidata.org/wiki/Q55451","display_name":"Electric potential","level":3,"score":0.43086985},{"id":"https://openalex.org/C544519230","wikidata":"https://www.wikidata.org/wiki/Q32566","display_name":"Computed tomography","level":2,"score":0.41666523},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24815163},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24388471},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23563224},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.109686315},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D004553","descriptor_name":"Electric Conductivity","qualifier_ui":"","qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D007091","descriptor_name":"Image Processing, Computer-Assisted","qualifier_ui":"","qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":"","qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":"","qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D008961","descriptor_name":"Models, Structural","qualifier_ui":"","qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"","qualifier_name":null,"is_major_topic":false}],"locations_count":2,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/10.43616","pdf_url":null,"source":{"id":"https://openalex.org/S5240358","display_name":"IEEE Transactions on Biomedical Engineering","issn_l":"0018-9294","issn":["0018-9294","1558-2531"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},{"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/2303271","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":["National Institutes of Health"],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.71,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":8,"referenced_works":["https://openalex.org/W2017029788","https://openalex.org/W2021847672","https://openalex.org/W2033119851","https://openalex.org/W2045301133","https://openalex.org/W2056443691","https://openalex.org/W2058666998","https://openalex.org/W2077204104","https://openalex.org/W2278331350"],"related_works":["https://openalex.org/W4281855154","https://openalex.org/W2569225917","https://openalex.org/W2504555271","https://openalex.org/W2384114511","https://openalex.org/W2375347859","https://openalex.org/W2314712569","https://openalex.org/W1984642543","https://openalex.org/W1983617443","https://openalex.org/W1976899356","https://openalex.org/W1973417125"],"abstract_inverted_index":{"Electric":[0],"current":[1,23,39,118,122,203,206],"computed":[2,204],"tomography":[3],"is":[4,87,103],"a":[5,15,50,57,127],"process":[6],"for":[7,35,117,201],"determining":[8],"the":[9,26,36,41,60,71,90,99,141,148,160,166],"distribution":[10],"of":[11,20,38,43,52,92,95,129],"electrical":[12],"conductivity":[13],"inside":[14],"body":[16],"based":[17],"upon":[18],"measurements":[19],"voltage":[21,61,176,211],"or":[22],"made":[24,174],"at":[25,98,126],"body's":[27,58,72],"surface.":[28],"Most":[29],"such":[30],"systems":[31,200],"use":[32],"different":[33],"electrodes":[34,53,116,181],"application":[37],"and":[40,107,119,186,210],"measurement":[42],"voltage.":[44,120],"This":[45,85,101],"paper":[46],"shows":[47],"that":[48,196],"when":[49,74],"multiplicity":[51],"are":[54,63,76],"attached":[55],"to":[56,66,190],"surface,":[59],"data":[62,143,162,177],"most":[64],"sensitive":[65],"changes":[67],"in":[68,70,197],"resistivity":[69],"interior":[73],"voltages":[75,132,169],"measured":[77,133,168,214],"from":[78,147,175,215],"all":[79,115,135,216],"electrodes,":[80,130],"including":[81],"those":[82],"carrying":[83],"current.":[84],"assertion":[86],"true":[88],"despite":[89],"presence":[91],"significant":[93],"levels":[94,185],"skin":[96],"impedance":[97],"electrodes.":[100,137,172,218],"conclusion":[102],"supported":[104],"both":[105],"theoretically":[106],"by":[108,145,158,164],"experiment.":[109],"Data":[110],"were":[111,187],"first":[112],"taken":[113],"using":[114,159,165,178],"Then":[121],"was":[123],"applied":[124,209],"only":[125,179],"pair":[128],"with":[131,154],"on":[134,170],"other":[136],"We":[138,194],"then":[139],"constructed":[140],"second":[142],"set":[144],"calculation":[146],"first.":[149],"Targets":[150],"could":[151],"be":[152,208,213],"detected":[153],"better":[155],"signal-to-noise":[156],"ratio":[157],"reconstructed":[161],"than":[163],"directly":[167],"noncurrent-carrying":[171,180],"Images":[173],"had":[182],"higher":[183],"noise":[184],"less":[188],"able":[189],"accurately":[191],"locate":[192],"targets.":[193],"conclude":[195],"multiple":[198],"electrode":[199],"electric":[202],"tomography,":[205],"should":[207,212],"available":[217]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2036673119","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":3}],"updated_date":"2025-04-22T00:46:27.124467","created_date":"2016-06-24"}