{"id":"https://openalex.org/W2946513868","doi":"https://doi.org/10.1049/iet-cds.2018.5261","title":"Analytical modelling and simulation of drain doping engineered splitted drain structured TFET and its improved performance in subduing ambipolar effect","display_name":"Analytical modelling and simulation of drain doping engineered splitted drain structured TFET and its improved performance in subduing ambipolar effect","publication_year":2019,"publication_date":"2019-05-15","ids":{"openalex":"https://openalex.org/W2946513868","doi":"https://doi.org/10.1049/iet-cds.2018.5261","mag":"2946513868"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cds.2018.5261","pdf_url":null,"source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":true,"is_in_doaj":true,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028008410","display_name":"Disha Bhattacharjee","orcid":null},"institutions":[{"id":"https://openalex.org/I170979836","display_name":"Jadavpur University","ror":"https://ror.org/02af4h012","country_code":"IN","type":"funder","lineage":["https://openalex.org/I170979836"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Disha Bhattacharjee","raw_affiliation_strings":["Department of ETCE, Jadavpur University, Kolkata, 700032 India"],"affiliations":[{"raw_affiliation_string":"Department of ETCE, Jadavpur University, Kolkata, 700032 India","institution_ids":["https://openalex.org/I170979836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029415692","display_name":"Bijoy Goswami","orcid":"https://orcid.org/0000-0001-6885-8220"},"institutions":[{"id":"https://openalex.org/I170979836","display_name":"Jadavpur University","ror":"https://ror.org/02af4h012","country_code":"IN","type":"funder","lineage":["https://openalex.org/I170979836"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Bijoy Goswami","raw_affiliation_strings":["Department of ETCE, Jadavpur University, Kolkata, 700032 India"],"affiliations":[{"raw_affiliation_string":"Department of ETCE, Jadavpur University, Kolkata, 700032 India","institution_ids":["https://openalex.org/I170979836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008642712","display_name":"Dinesh Kumar Dash","orcid":"https://orcid.org/0000-0002-6606-1004"},"institutions":[{"id":"https://openalex.org/I170979836","display_name":"Jadavpur University","ror":"https://ror.org/02af4h012","country_code":"IN","type":"funder","lineage":["https://openalex.org/I170979836"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Dinesh Kumar Dash","raw_affiliation_strings":["Department of ETCE, Jadavpur University, Kolkata, 700032 India"],"affiliations":[{"raw_affiliation_string":"Department of ETCE, Jadavpur University, Kolkata, 700032 India","institution_ids":["https://openalex.org/I170979836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064928540","display_name":"Ayan Bhattacharya","orcid":null},"institutions":[{"id":"https://openalex.org/I170979836","display_name":"Jadavpur University","ror":"https://ror.org/02af4h012","country_code":"IN","type":"funder","lineage":["https://openalex.org/I170979836"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ayan Bhattacharya","raw_affiliation_strings":["Department of ETCE, Jadavpur University, Kolkata, 700032 India"],"affiliations":[{"raw_affiliation_string":"Department of ETCE, Jadavpur University, Kolkata, 700032 India","institution_ids":["https://openalex.org/I170979836"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031054602","display_name":"Subir Kumar Sarkar","orcid":"https://orcid.org/0000-0002-1155-8400"},"institutions":[{"id":"https://openalex.org/I170979836","display_name":"Jadavpur University","ror":"https://ror.org/02af4h012","country_code":"IN","type":"funder","lineage":["https://openalex.org/I170979836"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Subir Kumar Sarkar","raw_affiliation_strings":["Department of ETCE, Jadavpur University, Kolkata, 700032 India"],"affiliations":[{"raw_affiliation_string":"Department of ETCE, Jadavpur University, Kolkata, 700032 India","institution_ids":["https://openalex.org/I170979836"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5028008410"],"corresponding_institution_ids":["https://openalex.org/I170979836"],"apc_list":{"value":2000,"currency":"EUR","value_usd":2200},"apc_paid":null,"fwci":0.821,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.697084,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":85,"max":86},"biblio":{"volume":"13","issue":"6","first_page":"888","last_page":"895"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9986,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ambipolar-diffusion","display_name":"Ambipolar diffusion","score":0.9331622}],"concepts":[{"id":"https://openalex.org/C25621703","wikidata":"https://www.wikidata.org/wiki/Q2658857","display_name":"Ambipolar diffusion","level":3,"score":0.9331622},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.6893599},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5694435},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.44206014},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3984686},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.35266605},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2616619},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18644819},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cds.2018.5261","pdf_url":null,"source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":true,"is_in_doaj":true,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/6","score":0.46,"display_name":"Clean water and sanitation"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":30,"referenced_works":["https://openalex.org/W1499524727","https://openalex.org/W1929448489","https://openalex.org/W1975037717","https://openalex.org/W1991353080","https://openalex.org/W1991815100","https://openalex.org/W1997219567","https://openalex.org/W2005375718","https://openalex.org/W2009624223","https://openalex.org/W2018292887","https://openalex.org/W2030768861","https://openalex.org/W2032197740","https://openalex.org/W2049360386","https://openalex.org/W2072122246","https://openalex.org/W2092377085","https://openalex.org/W2101317125","https://openalex.org/W2110584581","https://openalex.org/W2111959064","https://openalex.org/W2129599852","https://openalex.org/W2129680670","https://openalex.org/W2131862714","https://openalex.org/W2149800702","https://openalex.org/W2161273685","https://openalex.org/W2168137928","https://openalex.org/W2172125869","https://openalex.org/W2288355003","https://openalex.org/W2328805309","https://openalex.org/W2529534050","https://openalex.org/W2565824260","https://openalex.org/W2739233858","https://openalex.org/W2786990501"],"related_works":["https://openalex.org/W3104452292","https://openalex.org/W3005033026","https://openalex.org/W2802925087","https://openalex.org/W2585238015","https://openalex.org/W2054259982","https://openalex.org/W2053393604","https://openalex.org/W2000792039","https://openalex.org/W1995418911","https://openalex.org/W1976086231","https://openalex.org/W1495510678"],"abstract_inverted_index":{"The":[0,95],"study":[1,37],"presents":[2],"an":[3],"analytical":[4],"model":[5],"for":[6,153,165],"the":[7,36,39,67,71,80,101,105,145,155,174,191],"potential":[8,33],"distribution":[9],"of":[10,41,50,66,75,79,83,104,170],"a":[11,51],"drain":[12,23,27,42,55,85,113],"doping":[13,43,91],"engineered":[14],"2D":[15],"tunnelling":[16,26,68],"field":[17],"effect":[18],"transistor":[19],"(TFET)":[20],"with":[21,87,180],"splitted":[22,84],"structure.":[24,172],"Hence,":[25],"current":[28],"is":[29,93,114],"derived":[30],"using":[31],"this":[32],"distribution.":[34],"Further,":[35],"analyses":[38],"influence":[40],"engineering":[44],"on":[45],"all":[46,154],"characteristics":[47,148],"and":[48,90,134,149,158,161,168,184],"parameters":[49,150],"TFET":[52,109,118,127,137],"model.":[53],"Splitted":[54],"structure":[56],"exhibits":[57],"major":[58],"reduction":[59],"in":[60,122,131,141,195],"ambipolar":[61],"conduction":[62],"due":[63],"to":[64,100],"increase":[65],"width":[69],"at":[70],"channel-drain":[72],"junction.":[73],"Simulation":[74],"four":[76,156],"different":[77],"structures":[78,96,176],"device":[81,147],"consisting":[82],"region":[86],"relative":[88,102],"location":[89],"concentration":[92],"executed.":[94],"are":[97,151,163,193],"named":[98],"according":[99],"position":[103],"drain:":[106],"splitted-drain":[107,121,130,140],"single-gate":[108,117,126,136],"(SD-SG":[110],"TFET:":[111,120,129,139],"total":[112],"splitted),":[115],"top-splitted-drain":[116],"(TSD-SG":[119],"upper":[123],"location),":[124,133],"Mesial-splitted-drain":[125],"(MSD-SG":[128],"middle":[132],"basal-splitted-drain":[135],"(BSD-SG":[138],"bottom":[142],"location).":[143],"All":[144,173,190],"fundamental":[146],"analysed":[152],"structures,":[157],"their":[159],"merits":[160],"drawback":[162],"recorded":[164],"optimal":[166],"valuation":[167],"detection":[169],"better":[171],"proposed":[175],"show":[177],"improved":[178],"performance":[179],"suppressed":[181],"gate":[182],"leakage":[183],"ambipolarity":[185],"than":[186],"conventional":[187],"planar":[188],"TFET.":[189],"simulations":[192],"done":[194],"Silvaco,":[196],"Atlas.":[197]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2946513868","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2}],"updated_date":"2025-04-17T06:12:25.030825","created_date":"2019-05-29"}