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{"id":"https://openalex.org/W2397489994","doi":"https://doi.org/10.1016/j.microrel.2016.05.005","title":"On the series resistance in staggered amorphous thin film transistors","display_name":"On the series resistance in staggered amorphous thin film transistors","publication_year":2016,"publication_date":"2016-05-26","ids":{"openalex":"https://openalex.org/W2397489994","doi":"https://doi.org/10.1016/j.microrel.2016.05.005","mag":"2397489994"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2016.05.005","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043666384","display_name":"A. Cerdeira","orcid":"https://orcid.org/0000-0002-2114-2468"},"institutions":[{"id":"https://openalex.org/I68368234","display_name":"Center for Research and Advanced Studies of the National Polytechnic Institute","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"Antonio Cerdeira","raw_affiliation_strings":["Secci\u00f3n de Electr\u00f3nica del Estado S\u00f3lido, Departamento de Ingenier\u00eda El\u00e9ctrica, CINVESTAV, Mexico City, Mexico"],"affiliations":[{"raw_affiliation_string":"Secci\u00f3n de Electr\u00f3nica del Estado S\u00f3lido, Departamento de Ingenier\u00eda El\u00e9ctrica, CINVESTAV, Mexico City, Mexico","institution_ids":["https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018759282","display_name":"M. Estrada","orcid":"https://orcid.org/0000-0002-6244-6492"},"institutions":[{"id":"https://openalex.org/I68368234","display_name":"Center for Research and Advanced Studies of the National Polytechnic Institute","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Magali Estrada","raw_affiliation_strings":["Secci\u00f3n de Electr\u00f3nica del Estado S\u00f3lido, Departamento de Ingenier\u00eda El\u00e9ctrica, CINVESTAV, Mexico City, Mexico"],"affiliations":[{"raw_affiliation_string":"Secci\u00f3n de Electr\u00f3nica del Estado S\u00f3lido, Departamento de Ingenier\u00eda El\u00e9ctrica, CINVESTAV, Mexico City, Mexico","institution_ids":["https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048949881","display_name":"Llu\u0131\u0301s F. Marsal","orcid":"https://orcid.org/0000-0002-5976-1408"},"institutions":[{"id":"https://openalex.org/I55952717","display_name":"Universitat Rovira i Virgili","ror":"https://ror.org/00g5sqv46","country_code":"ES","type":"funder","lineage":["https://openalex.org/I55952717"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Lluis F. Marsal","raw_affiliation_strings":["Departament d'Enginyeria Electr\u00f2nica, El\u00e8ctrica i Autom\u00e0tica (DEEEA), Universitat Rovira i Virgili, 43007 Tarragona, Spain"],"affiliations":[{"raw_affiliation_string":"Departament d'Enginyeria Electr\u00f2nica, El\u00e8ctrica i Autom\u00e0tica (DEEEA), Universitat Rovira i Virgili, 43007 Tarragona, Spain","institution_ids":["https://openalex.org/I55952717"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040654936","display_name":"J. Pallar\u00e8s","orcid":"https://orcid.org/0000-0001-7221-5383"},"institutions":[{"id":"https://openalex.org/I55952717","display_name":"Universitat Rovira i Virgili","ror":"https://ror.org/00g5sqv46","country_code":"ES","type":"funder","lineage":["https://openalex.org/I55952717"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Josep Pallares","raw_affiliation_strings":["Departament d'Enginyeria Electr\u00f2nica, El\u00e8ctrica i Autom\u00e0tica (DEEEA), Universitat Rovira i Virgili, 43007 Tarragona, Spain"],"affiliations":[{"raw_affiliation_string":"Departament d'Enginyeria Electr\u00f2nica, El\u00e8ctrica i Autom\u00e0tica (DEEEA), Universitat Rovira i Virgili, 43007 Tarragona, Spain","institution_ids":["https://openalex.org/I55952717"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030860440","display_name":"Benjam\u0131\u0301n I\u00f1\u0131\u0301guez","orcid":"https://orcid.org/0000-0002-6504-7980"},"institutions":[{"id":"https://openalex.org/I55952717","display_name":"Universitat Rovira i Virgili","ror":"https://ror.org/00g5sqv46","country_code":"ES","type":"funder","lineage":["https://openalex.org/I55952717"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Benjam\u00edn I\u00f1iguez","raw_affiliation_strings":["Departament d'Enginyeria Electr\u00f2nica, El\u00e8ctrica i Autom\u00e0tica (DEEEA), Universitat Rovira i Virgili, 43007 Tarragona, Spain"],"affiliations":[{"raw_affiliation_string":"Departament d'Enginyeria Electr\u00f2nica, El\u00e8ctrica i Autom\u00e0tica (DEEEA), Universitat Rovira i Virgili, 43007 Tarragona, Spain","institution_ids":["https://openalex.org/I55952717"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5043666384"],"corresponding_institution_ids":["https://openalex.org/I68368234"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.967,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":18,"citation_normalized_percentile":{"value":0.752401,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":91},"biblio":{"volume":"63","issue":null,"first_page":"325","last_page":"335"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9824,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9681,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parasitic-element","display_name":"Parasitic element","score":0.59284544},{"id":"https://openalex.org/keywords/contact-resistance","display_name":"Contact resistance","score":0.59102654},{"id":"https://openalex.org/keywords/equivalent-series-resistance","display_name":"Equivalent series resistance","score":0.57387644},{"id":"https://openalex.org/keywords/value","display_name":"Value (mathematics)","score":0.45995203}],"concepts":[{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.77407926},{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.613025},{"id":"https://openalex.org/C71367568","wikidata":"https://www.wikidata.org/wiki/Q3363655","display_name":"Parasitic element","level":2,"score":0.59284544},{"id":"https://openalex.org/C123671423","wikidata":"https://www.wikidata.org/wiki/Q332329","display_name":"Contact resistance","level":3,"score":0.59102654},{"id":"https://openalex.org/C14485415","wikidata":"https://www.wikidata.org/wiki/Q5384730","display_name":"Equivalent series resistance","level":3,"score":0.57387644},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5242051},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.51897544},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5131195},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.49034858},{"id":"https://openalex.org/C2776291640","wikidata":"https://www.wikidata.org/wiki/Q2912517","display_name":"Value (mathematics)","level":2,"score":0.45995203},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.45299977},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39858153},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32817864},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28214115},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.18562016},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18451881},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.11051941},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.068386525},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.06085816},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0554882},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.04850194},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2016.05.005","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},{"is_oa":false,"landing_page_url":"https://zenodo.org/record/3495534","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":["European Organization for Nuclear Research"],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":78,"referenced_works":["https://openalex.org/W1498188146","https://openalex.org/W1527774293","https://openalex.org/W1662928444","https://openalex.org/W1845479914","https://openalex.org/W1966158975","https://openalex.org/W1966182908","https://openalex.org/W1968558519","https://openalex.org/W1972383150","https://openalex.org/W1973475494","https://openalex.org/W1979270591","https://openalex.org/W1979769291","https://openalex.org/W1980310688","https://openalex.org/W1980658394","https://openalex.org/W1982578218","https://openalex.org/W1983130293","https://openalex.org/W1985936082","https://openalex.org/W1987292005","https://openalex.org/W1998209596","https://openalex.org/W1999589524","https://openalex.org/W2000673128","https://openalex.org/W2001182671","https://openalex.org/W2002804974","https://openalex.org/W2004013435","https://openalex.org/W2008467865","https://openalex.org/W2016152964","https://openalex.org/W2017664626","https://openalex.org/W2020839199","https://openalex.org/W2021788585","https://openalex.org/W2022555030","https://openalex.org/W2028785781","https://openalex.org/W2032438411","https://openalex.org/W2038646603","https://openalex.org/W2038840581","https://openalex.org/W2042633526","https://openalex.org/W2044378865","https://openalex.org/W2048998212","https://openalex.org/W2050332038","https://openalex.org/W2051899103","https://openalex.org/W2053242415","https://openalex.org/W2060671025","https://openalex.org/W2084331264","https://openalex.org/W2084591572","https://openalex.org/W2086103622","https://openalex.org/W2086768276","https://openalex.org/W2090795401","https://openalex.org/W2093759949","https://openalex.org/W2095560520","https://openalex.org/W2102146483","https://openalex.org/W2110327830","https://openalex.org/W2113646703","https://openalex.org/W2114574737","https://openalex.org/W2118183934","https://openalex.org/W2119664742","https://openalex.org/W2121061168","https://openalex.org/W2124648144","https://openalex.org/W2127718543","https://openalex.org/W2133769428","https://openalex.org/W2133791272","https://openalex.org/W2138964810","https://openalex.org/W2140110731","https://openalex.org/W2141167384","https://openalex.org/W2146101168","https://openalex.org/W2146652281","https://openalex.org/W2160247057","https://openalex.org/W2161000114","https://openalex.org/W2163600832","https://openalex.org/W2164014981","https://openalex.org/W2165749190","https://openalex.org/W2168151807","https://openalex.org/W2169260966","https://openalex.org/W2209257567","https://openalex.org/W2300955640","https://openalex.org/W2335198783","https://openalex.org/W2346046415","https://openalex.org/W2470105990","https://openalex.org/W2499844158","https://openalex.org/W2543888027","https://openalex.org/W2916265288"],"related_works":["https://openalex.org/W3107958371","https://openalex.org/W2539846671","https://openalex.org/W2342474890","https://openalex.org/W2167642084","https://openalex.org/W2102146483","https://openalex.org/W1976345907","https://openalex.org/W1970713352","https://openalex.org/W1938027841","https://openalex.org/W1857226691","https://openalex.org/W1632932706"],"abstract_inverted_index":null,"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2397489994","counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2025-04-18T09:36:30.836215","created_date":"2016-06-24"}