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{"id":"https://openalex.org/W2153977367","doi":"https://doi.org/10.1016/j.microrel.2010.07.136","title":"Charge carrier recombination and generation analysis in materials and devices by electron and optical beam microscopy","display_name":"Charge carrier recombination and generation analysis in materials and devices by electron and optical beam microscopy","publication_year":2010,"publication_date":"2010-08-23","ids":{"openalex":"https://openalex.org/W2153977367","doi":"https://doi.org/10.1016/j.microrel.2010.07.136","mag":"2153977367"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2010.07.136","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101764281","display_name":"A. Cavallini","orcid":"https://orcid.org/0000-0002-6949-2854"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Anna Cavallini","raw_affiliation_strings":["Department of Physics, Alma Mater Studiorum, University of Bologna, V.le Berti-Pichat 6/2, 40127 Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Physics, Alma Mater Studiorum, University of Bologna, V.le Berti-Pichat 6/2, 40127 Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022431811","display_name":"L. Polenta","orcid":null},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Laura Polenta","raw_affiliation_strings":["Department of Physics, Alma Mater Studiorum, University of Bologna, V.le Berti-Pichat 6/2, 40127 Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Physics, Alma Mater Studiorum, University of Bologna, V.le Berti-Pichat 6/2, 40127 Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015605238","display_name":"A. Castaldini","orcid":null},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Castaldini","raw_affiliation_strings":["Department of Physics, Alma Mater Studiorum, University of Bologna, V.le Berti-Pichat 6/2, 40127 Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Physics, Alma Mater Studiorum, University of Bologna, V.le Berti-Pichat 6/2, 40127 Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190,"provenance":"doaj"},"apc_paid":null,"fwci":0.701,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":10,"citation_normalized_percentile":{"value":0.805164,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":84,"max":85},"biblio":{"volume":"50","issue":"9-11","first_page":"1398","last_page":"1406"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electron-beam-induced-current","display_name":"Electron beam-induced current","score":0.74913687},{"id":"https://openalex.org/keywords/charge-carrier","display_name":"Charge carrier","score":0.68354017},{"id":"https://openalex.org/keywords/carrier-lifetime","display_name":"Carrier lifetime","score":0.6689584}],"concepts":[{"id":"https://openalex.org/C2779162123","wikidata":"https://www.wikidata.org/wiki/Q3717138","display_name":"Electron beam-induced current","level":3,"score":0.74913687},{"id":"https://openalex.org/C104232198","wikidata":"https://www.wikidata.org/wiki/Q865807","display_name":"Charge carrier","level":2,"score":0.68354017},{"id":"https://openalex.org/C198865614","wikidata":"https://www.wikidata.org/wiki/Q5046374","display_name":"Carrier lifetime","level":3,"score":0.6689584},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6666464},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6656835},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.5619432},{"id":"https://openalex.org/C510052550","wikidata":"https://www.wikidata.org/wiki/Q422819","display_name":"Gallium arsenide","level":2,"score":0.54889286},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.4855954},{"id":"https://openalex.org/C2778871202","wikidata":"https://www.wikidata.org/wiki/Q411713","display_name":"Gallium nitride","level":3,"score":0.4752369},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.4617292},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.42624417},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.4178583},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.28359652},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.111876726},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2010.07.136","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":44,"referenced_works":["https://openalex.org/W118148159","https://openalex.org/W1535978437","https://openalex.org/W1655324322","https://openalex.org/W1749212935","https://openalex.org/W1964785079","https://openalex.org/W1965838823","https://openalex.org/W1966149750","https://openalex.org/W1969287161","https://openalex.org/W1969488840","https://openalex.org/W1974384785","https://openalex.org/W1983415616","https://openalex.org/W1986767525","https://openalex.org/W1995288922","https://openalex.org/W1998195519","https://openalex.org/W1999190542","https://openalex.org/W2000377561","https://openalex.org/W2001838614","https://openalex.org/W2002784275","https://openalex.org/W2003152292","https://openalex.org/W2004020496","https://openalex.org/W2021714295","https://openalex.org/W2024153308","https://openalex.org/W2034233574","https://openalex.org/W2045353988","https://openalex.org/W2045718910","https://openalex.org/W2055730155","https://openalex.org/W2058502345","https://openalex.org/W2059060086","https://openalex.org/W2072269978","https://openalex.org/W2073775034","https://openalex.org/W2075045725","https://openalex.org/W2078497380","https://openalex.org/W2080871210","https://openalex.org/W2090648328","https://openalex.org/W2092273541","https://openalex.org/W2093000376","https://openalex.org/W2104953806","https://openalex.org/W2136463779","https://openalex.org/W2145594958","https://openalex.org/W2151775218","https://openalex.org/W2164956051","https://openalex.org/W2509320479","https://openalex.org/W2547656516","https://openalex.org/W305287620"],"related_works":["https://openalex.org/W4290929012","https://openalex.org/W3178857354","https://openalex.org/W304415128","https://openalex.org/W2749413547","https://openalex.org/W23141894","https://openalex.org/W2278437460","https://openalex.org/W2086305812","https://openalex.org/W2076569837","https://openalex.org/W2037853006","https://openalex.org/W2014848987"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2153977367","counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2024-12-10T10:33:53.881306","created_date":"2016-06-24"}