乐胖代购免代理版

{"id":"https://openalex.org/W1990883443","doi":"https://doi.org/10.1016/j.microrel.2010.07.020","title":"Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations","display_name":"Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations","publication_year":2010,"publication_date":"2010-08-22","ids":{"openalex":"https://openalex.org/W1990883443","doi":"https://doi.org/10.1016/j.microrel.2010.07.020","mag":"1990883443"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2010.07.020","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057230896","display_name":"Mustapha Faqir","orcid":"https://orcid.org/0000-0002-2507-6605"},"institutions":[{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["FR","IT"],"is_corresponding":false,"raw_author_name":"M. Faqir","raw_affiliation_strings":["Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy","IMS Laboratory, Universit\u00e9 Bordeaux 1, 351 cours de la lib\u00e9ration, 33405 Talence Cedex, France"],"affiliations":[{"raw_affiliation_string":"IMS Laboratory, Universit\u00e9 Bordeaux 1, 351 cours de la lib\u00e9ration, 33405 Talence Cedex, France","institution_ids":["https://openalex.org/I4210160189","https://openalex.org/I15057530"]},{"raw_affiliation_string":"Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030360541","display_name":"Mohsine Bouya","orcid":"https://orcid.org/0000-0001-6619-3130"},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"M. Bouya","raw_affiliation_strings":["IMS Laboratory, Universit\u00e9 Bordeaux 1, 351 cours de la lib\u00e9ration, 33405 Talence Cedex, France","TRT-France-LATPI, Route d\u00e9partementale 128, 91767 Palaiseau Cedex, France"],"affiliations":[{"raw_affiliation_string":"IMS Laboratory, Universit\u00e9 Bordeaux 1, 351 cours de la lib\u00e9ration, 33405 Talence Cedex, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"TRT-France-LATPI, Route d\u00e9partementale 128, 91767 Palaiseau Cedex, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112907689","display_name":"Nathalie Malbert","orcid":null},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"N. Malbert","raw_affiliation_strings":["IMS Laboratory, Universit\u00e9 Bordeaux 1, 351 cours de la lib\u00e9ration, 33405 Talence Cedex, France"],"affiliations":[{"raw_affiliation_string":"IMS Laboratory, Universit\u00e9 Bordeaux 1, 351 cours de la lib\u00e9ration, 33405 Talence Cedex, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112266615","display_name":"Nathalie Labat","orcid":null},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"N. Labat","raw_affiliation_strings":["IMS Laboratory, Universit\u00e9 Bordeaux 1, 351 cours de la lib\u00e9ration, 33405 Talence Cedex, France"],"affiliations":[{"raw_affiliation_string":"IMS Laboratory, Universit\u00e9 Bordeaux 1, 351 cours de la lib\u00e9ration, 33405 Talence Cedex, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063729352","display_name":"Dominique Carisetti","orcid":null},"institutions":[],"countries":["FR"],"is_corresponding":false,"raw_author_name":"D. Carisetti","raw_affiliation_strings":["TRT-France-LATPI, Route d\u00e9partementale 128, 91767 Palaiseau Cedex, France"],"affiliations":[{"raw_affiliation_string":"TRT-France-LATPI, Route d\u00e9partementale 128, 91767 Palaiseau Cedex, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109583217","display_name":"Beno\u00eet Lambert","orcid":null},"institutions":[],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Lambert","raw_affiliation_strings":["United Monolithic Semiconductors, Domaine de Corbeville, 91404 Orsay Cedex, France"],"affiliations":[{"raw_affiliation_string":"United Monolithic Semiconductors, Domaine de Corbeville, 91404 Orsay Cedex, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015072881","display_name":"G. Verzellesi","orcid":"https://orcid.org/0000-0001-5770-6512"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Verzellesi","raw_affiliation_strings":["Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020986556","display_name":"F. Fantini","orcid":"https://orcid.org/0000-0002-9637-9304"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Fantini","raw_affiliation_strings":["Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy","institution_ids":["https://openalex.org/I122346577"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5030360541"],"corresponding_institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190,"provenance":"doaj"},"apc_paid":null,"fwci":1.397,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":24,"citation_normalized_percentile":{"value":0.879478,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":91},"biblio":{"volume":"50","issue":"9-11","first_page":"1520","last_page":"1522"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9989,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9982,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6613101},{"id":"https://openalex.org/keywords/isothermal-process","display_name":"Isothermal process","score":0.63442916},{"id":"https://openalex.org/keywords/trap","display_name":"Trap (plumbing)","score":0.5301771}],"concepts":[{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.8322952},{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.8199512},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6613101},{"id":"https://openalex.org/C133347239","wikidata":"https://www.wikidata.org/wiki/Q486921","display_name":"Isothermal process","level":2,"score":0.63442916},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6303725},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6060436},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.55718493},{"id":"https://openalex.org/C121099081","wikidata":"https://www.wikidata.org/wiki/Q665580","display_name":"Trap (plumbing)","level":2,"score":0.5301771},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.46686888},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4525775},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.4154884},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.39029723},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.24030754},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23967978},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19011992},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.12347382},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2010.07.020","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},{"is_oa":false,"landing_page_url":"https://hal.science/hal-00585069","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":["Centre National de la Recherche Scientifique"],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.67}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":15,"referenced_works":["https://openalex.org/W1965964764","https://openalex.org/W1971958003","https://openalex.org/W1991451877","https://openalex.org/W2031625458","https://openalex.org/W2063589368","https://openalex.org/W2085100146","https://openalex.org/W2102774840","https://openalex.org/W2106184779","https://openalex.org/W2106907859","https://openalex.org/W2118141990","https://openalex.org/W2124985289","https://openalex.org/W2131877386","https://openalex.org/W2137778525","https://openalex.org/W2147521755","https://openalex.org/W2536413091"],"related_works":["https://openalex.org/W4390729576","https://openalex.org/W2598293455","https://openalex.org/W2532810475","https://openalex.org/W2352770659","https://openalex.org/W2224771577","https://openalex.org/W2171730916","https://openalex.org/W2162684047","https://openalex.org/W2098291540","https://openalex.org/W1986136028","https://openalex.org/W1943995216"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1990883443","counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-01-06T12:26:48.350947","created_date":"2016-06-24"}