乐胖代购免代理版

{"id":"https://openalex.org/W2046277164","doi":"https://doi.org/10.1016/j.microrel.2008.07.031","title":"Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields","display_name":"Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields","publication_year":2008,"publication_date":"2008-08-01","ids":{"openalex":"https://openalex.org/W2046277164","doi":"https://doi.org/10.1016/j.microrel.2008.07.031","mag":"2046277164"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2008.07.031","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017729184","display_name":"Augusto Tazzoli","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Tazzoli","raw_affiliation_strings":["University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101587480","display_name":"Gaudenzio Meneghesso","orcid":"https://orcid.org/0000-0002-6715-4827"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Meneghesso","raw_affiliation_strings":["University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003797022","display_name":"Franco Zanon","orcid":"https://orcid.org/0000-0003-2277-4579"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Zanon","raw_affiliation_strings":["University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057705073","display_name":"Francesca Danesin","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Danesin","raw_affiliation_strings":["University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002653396","display_name":"E. Zanoni","orcid":"https://orcid.org/0000-0001-7349-9656"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"E. Zanoni","raw_affiliation_strings":["University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112264344","display_name":"P. Bove","orcid":null},"institutions":[],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Bove","raw_affiliation_strings":["PICOGIGA International, Place Marcel Rebuffat, Parc de Villejust, 91971 Courtaboeuf Cedex, France"],"affiliations":[{"raw_affiliation_string":"PICOGIGA International, Place Marcel Rebuffat, Parc de Villejust, 91971 Courtaboeuf Cedex, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102992036","display_name":"R. Langer","orcid":"https://orcid.org/0000-0002-1132-3468"},"institutions":[],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R. Langer","raw_affiliation_strings":["PICOGIGA International, Place Marcel Rebuffat, Parc de Villejust, 91971 Courtaboeuf Cedex, France"],"affiliations":[{"raw_affiliation_string":"PICOGIGA International, Place Marcel Rebuffat, Parc de Villejust, 91971 Courtaboeuf Cedex, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041267747","display_name":"J. Thorpe","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123312","display_name":"United Monolithic Semiconductors (Germany)","ror":"https://ror.org/035gava43","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210123312"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. Thorpe","raw_affiliation_strings":["United Monolithic Semiconductors GmbH, Wilhelm-Runge-Strasse 11, 89081 Ulm, Germany"],"affiliations":[{"raw_affiliation_string":"United Monolithic Semiconductors GmbH, Wilhelm-Runge-Strasse 11, 89081 Ulm, Germany","institution_ids":["https://openalex.org/I4210123312"]}]}],"institution_assertions":[],"countries_distinct_count":3,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190,"provenance":"doaj"},"apc_paid":null,"fwci":0.259,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":2,"citation_normalized_percentile":{"value":0.551312,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":70,"max":74},"biblio":{"volume":"48","issue":"8-9","first_page":"1370","last_page":"1374"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization","score":0.5726621},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness","score":0.5620286}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.74472684},{"id":"https://openalex.org/C104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","level":2,"score":0.6453262},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6302897},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6082412},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.59862477},{"id":"https://openalex.org/C2780064504","wikidata":"https://www.wikidata.org/wiki/Q127583","display_name":"Sapphire","level":3,"score":0.5875193},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5726621},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5620286},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.5128498},{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.45542118},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32147434},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.21843532},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19965464},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.19113415},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10965198},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08138138},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07205582},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.06937289},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0671469},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2008.07.031","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.46}],"grants":[{"funder":"https://openalex.org/F4320320300","funder_display_name":"European Commission","award_id":null}],"datasets":[],"versions":[],"referenced_works_count":10,"referenced_works":["https://openalex.org/W1543631479","https://openalex.org/W2087622169","https://openalex.org/W2122464392","https://openalex.org/W2129059628","https://openalex.org/W2141981815","https://openalex.org/W2159824107","https://openalex.org/W2163194368","https://openalex.org/W2608944358","https://openalex.org/W4285719527","https://openalex.org/W4298033106"],"related_works":["https://openalex.org/W4390729576","https://openalex.org/W2598293455","https://openalex.org/W2532810475","https://openalex.org/W2171730916","https://openalex.org/W2162684047","https://openalex.org/W2098291540","https://openalex.org/W2007005446","https://openalex.org/W2002774257","https://openalex.org/W1986136028","https://openalex.org/W1943995216"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2046277164","counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2025-01-19T07:12:58.115425","created_date":"2016-06-24"}