{"id":"https://openalex.org/W2087797327","doi":"https://doi.org/10.1016/j.microrel.2008.07.008","title":"Thermal storage effects on AlGaN/GaN HEMT","display_name":"Thermal storage effects on AlGaN/GaN HEMT","publication_year":2008,"publication_date":"2008-08-01","ids":{"openalex":"https://openalex.org/W2087797327","doi":"https://doi.org/10.1016/j.microrel.2008.07.008","mag":"2087797327"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2008.07.008","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057705073","display_name":"Francesca Danesin","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Francesca Danesin","raw_affiliation_strings":["Department of Information Engineering, University of Padova, via Gradenigo 6/b, 35100 Padova, Italy#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Padova, via Gradenigo 6/b, 35100 Padova, Italy#TAB#","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017729184","display_name":"Augusto Tazzoli","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Augusto Tazzoli","raw_affiliation_strings":["Department of Information Engineering, University of Padova, via Gradenigo 6/b, 35100 Padova, Italy#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Padova, via Gradenigo 6/b, 35100 Padova, Italy#TAB#","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003797022","display_name":"Franco Zanon","orcid":"https://orcid.org/0000-0003-2277-4579"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Franco Zanon","raw_affiliation_strings":["Department of Information Engineering, University of Padova, via Gradenigo 6/b, 35100 Padova, Italy#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Padova, via Gradenigo 6/b, 35100 Padova, Italy#TAB#","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101587480","display_name":"Gaudenzio Meneghesso","orcid":"https://orcid.org/0000-0002-6715-4827"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gaudenzio Meneghesso","raw_affiliation_strings":["Department of Information Engineering, University of Padova, via Gradenigo 6/b, 35100 Padova, Italy#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Padova, via Gradenigo 6/b, 35100 Padova, Italy#TAB#","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002653396","display_name":"E. Zanoni","orcid":"https://orcid.org/0000-0001-7349-9656"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Enrico Zanoni","raw_affiliation_strings":["Department of Information Engineering, University of Padova, via Gradenigo 6/b, 35100 Padova, Italy#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Padova, via Gradenigo 6/b, 35100 Padova, Italy#TAB#","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091180500","display_name":"A. Cetronio","orcid":null},"institutions":[{"id":"https://openalex.org/I76806421","display_name":"SELEX Sistemi Integrati","ror":"https://ror.org/02sj0zy88","country_code":"IT","type":"company","lineage":["https://openalex.org/I76806421"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Cetronio","raw_affiliation_strings":["Selex Sistemi Integrati, GaAs Foundry, Via Tiburtina, Km 12.400, 00131 Roma, Italy"],"affiliations":[{"raw_affiliation_string":"Selex Sistemi Integrati, GaAs Foundry, Via Tiburtina, Km 12.400, 00131 Roma, Italy","institution_ids":["https://openalex.org/I76806421"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045487848","display_name":"C. Lanzieri","orcid":null},"institutions":[{"id":"https://openalex.org/I76806421","display_name":"SELEX Sistemi Integrati","ror":"https://ror.org/02sj0zy88","country_code":"IT","type":"company","lineage":["https://openalex.org/I76806421"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Claudio Lanzieri","raw_affiliation_strings":["Selex Sistemi Integrati, GaAs Foundry, Via Tiburtina, Km 12.400, 00131 Roma, Italy"],"affiliations":[{"raw_affiliation_string":"Selex Sistemi Integrati, GaAs Foundry, Via Tiburtina, Km 12.400, 00131 Roma, Italy","institution_ids":["https://openalex.org/I76806421"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083631612","display_name":"S. Lavanga","orcid":null},"institutions":[{"id":"https://openalex.org/I76806421","display_name":"SELEX Sistemi Integrati","ror":"https://ror.org/02sj0zy88","country_code":"IT","type":"company","lineage":["https://openalex.org/I76806421"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Simone Lavanga","raw_affiliation_strings":["Selex Sistemi Integrati, GaAs Foundry, Via Tiburtina, Km 12.400, 00131 Roma, Italy"],"affiliations":[{"raw_affiliation_string":"Selex Sistemi Integrati, GaAs Foundry, Via Tiburtina, Km 12.400, 00131 Roma, Italy","institution_ids":["https://openalex.org/I76806421"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037707769","display_name":"M. Peroni","orcid":"https://orcid.org/0000-0003-0812-457X"},"institutions":[{"id":"https://openalex.org/I76806421","display_name":"SELEX Sistemi Integrati","ror":"https://ror.org/02sj0zy88","country_code":"IT","type":"company","lineage":["https://openalex.org/I76806421"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Peroni","raw_affiliation_strings":["Selex Sistemi Integrati, GaAs Foundry, Via Tiburtina, Km 12.400, 00131 Roma, Italy"],"affiliations":[{"raw_affiliation_string":"Selex Sistemi Integrati, GaAs Foundry, Via Tiburtina, Km 12.400, 00131 Roma, Italy","institution_ids":["https://openalex.org/I76806421"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042390279","display_name":"P. Romanini","orcid":null},"institutions":[{"id":"https://openalex.org/I76806421","display_name":"SELEX Sistemi Integrati","ror":"https://ror.org/02sj0zy88","country_code":"IT","type":"company","lineage":["https://openalex.org/I76806421"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Paolo Romanini","raw_affiliation_strings":["Selex Sistemi Integrati, GaAs Foundry, Via Tiburtina, Km 12.400, 00131 Roma, Italy"],"affiliations":[{"raw_affiliation_string":"Selex Sistemi Integrati, GaAs Foundry, Via Tiburtina, Km 12.400, 00131 Roma, Italy","institution_ids":["https://openalex.org/I76806421"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190,"provenance":"doaj"},"apc_paid":null,"fwci":0.645,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":14,"citation_normalized_percentile":{"value":0.738683,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":85,"max":86},"biblio":{"volume":"48","issue":"8-9","first_page":"1361","last_page":"1365"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/passivation","display_name":"Passivation","score":0.8663661},{"id":"https://openalex.org/keywords/saturation-current","display_name":"Saturation current","score":0.6819227},{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.64600474}],"concepts":[{"id":"https://openalex.org/C33574316","wikidata":"https://www.wikidata.org/wiki/Q917260","display_name":"Passivation","level":3,"score":0.8663661},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7823513},{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.7594758},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.73171526},{"id":"https://openalex.org/C155891486","wikidata":"https://www.wikidata.org/wiki/Q3694418","display_name":"Saturation current","level":3,"score":0.6819227},{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.64600474},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.46581507},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4019292},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2631095},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.19849911},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.19551334},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.19409528},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2008.07.008","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":13,"referenced_works":["https://openalex.org/W1543631479","https://openalex.org/W1790655889","https://openalex.org/W1950898365","https://openalex.org/W1976881370","https://openalex.org/W2000215363","https://openalex.org/W2053222432","https://openalex.org/W2059794210","https://openalex.org/W2087622169","https://openalex.org/W2122464392","https://openalex.org/W2141981815","https://openalex.org/W2163194368","https://openalex.org/W2542780027","https://openalex.org/W4298033106"],"related_works":["https://openalex.org/W3158277807","https://openalex.org/W3126073919","https://openalex.org/W3063337879","https://openalex.org/W2389330181","https://openalex.org/W2249766267","https://openalex.org/W2102640583","https://openalex.org/W2066729282","https://openalex.org/W2030723586","https://openalex.org/W1964679965","https://openalex.org/W1902923516"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2087797327","counts_by_year":[{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2024-12-11T11:31:29.573507","created_date":"2016-06-24"}