乐胖代购免代理版

{"id":"https://openalex.org/W2095327390","doi":"https://doi.org/10.1016/j.microrel.2007.07.005","title":"Characterization and analysis of trap-related effects in AlGaN\u2013GaN HEMTs","display_name":"Characterization and analysis of trap-related effects in AlGaN\u2013GaN HEMTs","publication_year":2007,"publication_date":"2007-08-14","ids":{"openalex":"https://openalex.org/W2095327390","doi":"https://doi.org/10.1016/j.microrel.2007.07.005","mag":"2095327390"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2007.07.005","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057230896","display_name":"Mustapha Faqir","orcid":"https://orcid.org/0000-0002-2507-6605"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Faqir","raw_affiliation_strings":["Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015072881","display_name":"G. Verzellesi","orcid":"https://orcid.org/0000-0001-5770-6512"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Verzellesi","raw_affiliation_strings":["Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020986556","display_name":"F. Fantini","orcid":"https://orcid.org/0000-0002-9637-9304"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Fantini","raw_affiliation_strings":["Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Modena and Reggio Emilia, Modena, Italy","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057705073","display_name":"Francesca Danesin","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Danesin","raw_affiliation_strings":["Department of Information Engineering; University of Padova; Padova; Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering; University of Padova; Padova; Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044222808","display_name":"F. Rampazzo","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Rampazzo","raw_affiliation_strings":["Department of Information Engineering; University of Padova; Padova; Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering; University of Padova; Padova; Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101587480","display_name":"Gaudenzio Meneghesso","orcid":"https://orcid.org/0000-0002-6715-4827"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Meneghesso","raw_affiliation_strings":["Department of Information Engineering; University of Padova; Padova; Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering; University of Padova; Padova; Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002653396","display_name":"E. Zanoni","orcid":"https://orcid.org/0000-0001-7349-9656"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"E. Zanoni","raw_affiliation_strings":["Department of Information Engineering; University of Padova; Padova; Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering; University of Padova; Padova; Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072887834","display_name":"A. Cavallini","orcid":"https://orcid.org/0000-0003-0442-4567"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Cavallini","raw_affiliation_strings":["Department of Physics, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015605238","display_name":"A. Castaldini","orcid":null},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Castaldini","raw_affiliation_strings":["Department of Physics, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111474938","display_name":"N. Labat","orcid":null},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"N. Labat","raw_affiliation_strings":["IXL Laboratoire, Universit\u00e8 Bordeaux 1, Talence Cedex, France"],"affiliations":[{"raw_affiliation_string":"IXL Laboratoire, Universit\u00e8 Bordeaux 1, Talence Cedex, France","institution_ids":["https://openalex.org/I15057530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071380095","display_name":"A. Touboul","orcid":"https://orcid.org/0000-0003-0089-2216"},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Touboul","raw_affiliation_strings":["IXL Laboratoire, Universit\u00e8 Bordeaux 1, Talence Cedex, France"],"affiliations":[{"raw_affiliation_string":"IXL Laboratoire, Universit\u00e8 Bordeaux 1, Talence Cedex, France","institution_ids":["https://openalex.org/I15057530"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015423378","display_name":"C. Dua","orcid":null},"institutions":[{"id":"https://openalex.org/I4210152719","display_name":"III V Lab","ror":"https://ror.org/0509ggw88","country_code":"FR","type":"facility","lineage":["https://openalex.org/I4210152719"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Dua","raw_affiliation_strings":["Alcatel-THALES III-V Lab/Tiger, Marcoussis, France"],"affiliations":[{"raw_affiliation_string":"Alcatel-THALES III-V Lab/Tiger, Marcoussis, France","institution_ids":["https://openalex.org/I4210152719"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190,"provenance":"doaj"},"apc_paid":null,"fwci":1.81,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":34,"citation_normalized_percentile":{"value":0.91848,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":92},"biblio":{"volume":"47","issue":"9-11","first_page":"1639","last_page":"1642"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.999,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trap","display_name":"Trap (plumbing)","score":0.67399895},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization","score":0.5702446},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation","score":0.5433415}],"concepts":[{"id":"https://openalex.org/C121099081","wikidata":"https://www.wikidata.org/wiki/Q665580","display_name":"Trap (plumbing)","level":2,"score":0.67399895},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6617813},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.64510727},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6080346},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5702446},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5433415},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38022283},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2526589},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.18253735},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1249302},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.118401796},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.06102577},{"id":"https://openalex.org/C87717796","wikidata":"https://www.wikidata.org/wiki/Q146326","display_name":"Environmental engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2007.07.005","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":7,"referenced_works":["https://openalex.org/W1971958003","https://openalex.org/W2044925401","https://openalex.org/W2053222432","https://openalex.org/W2122464392","https://openalex.org/W2126944720","https://openalex.org/W2137778525","https://openalex.org/W2542780027"],"related_works":["https://openalex.org/W4249938786","https://openalex.org/W4247476793","https://openalex.org/W4243387708","https://openalex.org/W2891818966","https://openalex.org/W2737498735","https://openalex.org/W2737492285","https://openalex.org/W2617599841","https://openalex.org/W2469741935","https://openalex.org/W2078639873","https://openalex.org/W2050045653"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2095327390","counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2024-12-14T03:10:48.225773","created_date":"2016-06-24"}