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{"id":"https://openalex.org/W2066312528","doi":"https://doi.org/10.1016/j.micpro.2013.10.003","title":"Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication","display_name":"Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication","publication_year":2013,"publication_date":"2013-10-28","ids":{"openalex":"https://openalex.org/W2066312528","doi":"https://doi.org/10.1016/j.micpro.2013.10.003","mag":"2066312528"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.micpro.2013.10.003","pdf_url":null,"source":{"id":"https://openalex.org/S195663827","display_name":"Microprocessors and Microsystems","issn_l":"0141-9331","issn":["0141-9331","1872-9436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044495372","display_name":"Juan Antonio Maestro","orcid":"https://orcid.org/0000-0001-7133-9026"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Juan Antonio Maestro","raw_affiliation_strings":["Universidad Antonio de Nebrija, C/Pirineos, 55, 28040 Madrid, Spain#TAB#"],"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, C/Pirineos, 55, 28040 Madrid, Spain#TAB#","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Pedro Reviriego","raw_affiliation_strings":["Universidad Antonio de Nebrija, C/Pirineos, 55, 28040 Madrid, Spain#TAB#"],"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, C/Pirineos, 55, 28040 Madrid, Spain#TAB#","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028169407","display_name":"Sanghyeon Baeg","orcid":"https://orcid.org/0000-0002-6990-1312"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sanghyeon Baeg","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Hanyang University, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Hanyang University, Republic of Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025156540","display_name":"Shi-Jie Wen","orcid":"https://orcid.org/0009-0002-7478-2351"},"institutions":[{"id":"https://openalex.org/I151281966","display_name":"Cisco Systems (China)","ror":"https://ror.org/02qy75381","country_code":"CN","type":"company","lineage":["https://openalex.org/I135428043","https://openalex.org/I151281966"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"ShiJie Wen","raw_affiliation_strings":["Component Engineering Group, Cisco Systems Inc., 170 W. Tasman Dr., San Jose, CA 95134, USA"],"affiliations":[{"raw_affiliation_string":"Component Engineering Group, Cisco Systems Inc., 170 W. Tasman Dr., San Jose, CA 95134, USA","institution_ids":["https://openalex.org/I151281966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079841586","display_name":"Richard Wong","orcid":"https://orcid.org/0000-0002-8040-7083"},"institutions":[{"id":"https://openalex.org/I151281966","display_name":"Cisco Systems (China)","ror":"https://ror.org/02qy75381","country_code":"CN","type":"company","lineage":["https://openalex.org/I135428043","https://openalex.org/I151281966"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Richard Wong","raw_affiliation_strings":["Component Engineering Group, Cisco Systems Inc., 170 W. Tasman Dr., San Jose, CA 95134, USA"],"affiliations":[{"raw_affiliation_string":"Component Engineering Group, Cisco Systems Inc., 170 W. Tasman Dr., San Jose, CA 95134, USA","institution_ids":["https://openalex.org/I151281966"]}]}],"institution_assertions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2200,"currency":"USD","value_usd":2200,"provenance":"doaj"},"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":5,"citation_normalized_percentile":{"value":0.67034,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":80,"max":81},"biblio":{"volume":"37","issue":"8","first_page":"1103","last_page":"1107"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9968,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9962,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.61592066}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.91490155},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.61592066},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.6159116},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.44165045},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.35487944},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.28022826},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.054975867},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.micpro.2013.10.003","pdf_url":null,"source":{"id":"https://openalex.org/S195663827","display_name":"Microprocessors and Microsystems","issn_l":"0141-9331","issn":["0141-9331","1872-9436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.75,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, justice, and strong institutions"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":15,"referenced_works":["https://openalex.org/W160422864","https://openalex.org/W2014466003","https://openalex.org/W2021708499","https://openalex.org/W2033816298","https://openalex.org/W2038394953","https://openalex.org/W2062143991","https://openalex.org/W2110196049","https://openalex.org/W2119216842","https://openalex.org/W2121336078","https://openalex.org/W2125008682","https://openalex.org/W2140025163","https://openalex.org/W2152652532","https://openalex.org/W2160451204","https://openalex.org/W2168793636","https://openalex.org/W2942537621"],"related_works":["https://openalex.org/W975040225","https://openalex.org/W2748952813","https://openalex.org/W2394408226","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2149051075","https://openalex.org/W2141072664","https://openalex.org/W2110991008","https://openalex.org/W2061536619","https://openalex.org/W2041615232"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2066312528","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-01-05T22:57:02.527120","created_date":"2016-06-24"}