{"id":"https://openalex.org/W2084150660","doi":"https://doi.org/10.1016/j.infsof.2007.12.001","title":"Does software reliability growth behavior follow a non-homogeneous Poisson process","display_name":"Does software reliability growth behavior follow a non-homogeneous Poisson process","publication_year":2008,"publication_date":"2008-01-11","ids":{"openalex":"https://openalex.org/W2084150660","doi":"https://doi.org/10.1016/j.infsof.2007.12.001","mag":"2084150660"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.infsof.2007.12.001","pdf_url":null,"source":{"id":"https://openalex.org/S205010575","display_name":"Information and Software Technology","issn_l":"0950-5849","issn":["0950-5849","1873-6025"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103991023","display_name":"Kai\u2010Yuan Cai","orcid":"https://orcid.org/0000-0001-5206-3933"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai-Yuan Cai","raw_affiliation_strings":["Department of Automatic Control,Beijing University of Aeronautics and Astronautics,Beijing 100083,China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Control,Beijing University of Aeronautics and Astronautics,Beijing 100083,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108741969","display_name":"Debin Hu","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"De-Bin Hu","raw_affiliation_strings":["Department of Automatic Control,Beijing University of Aeronautics and Astronautics,Beijing 100083,China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Control,Beijing University of Aeronautics and Astronautics,Beijing 100083,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084051302","display_name":"Chenggang Bai","orcid":"https://orcid.org/0000-0003-2224-2337"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cheng-Gang Bai","raw_affiliation_strings":["Department of Automatic Control,Beijing University of Aeronautics and Astronautics,Beijing 100083,China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Control,Beijing University of Aeronautics and Astronautics,Beijing 100083,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110374578","display_name":"Hai Hu","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hai Hu","raw_affiliation_strings":["Department of Automatic Control,Beijing University of Aeronautics and Astronautics,Beijing 100083,China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Control,Beijing University of Aeronautics and Astronautics,Beijing 100083,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010388548","display_name":"Tao Jing","orcid":"https://orcid.org/0000-0002-6120-9989"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tao Jing","raw_affiliation_strings":["Department of Automatic Control,Beijing University of Aeronautics and Astronautics,Beijing 100083,China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Control,Beijing University of Aeronautics and Astronautics,Beijing 100083,China","institution_ids":["https://openalex.org/I82880672"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3350,"currency":"USD","value_usd":3350,"provenance":"doaj"},"apc_paid":null,"fwci":4.92,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":37,"citation_normalized_percentile":{"value":0.961857,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":92,"max":93},"biblio":{"volume":"50","issue":"12","first_page":"1232","last_page":"1247"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9967,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9821,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.5445564}],"concepts":[{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.6698444},{"id":"https://openalex.org/C166144826","wikidata":"https://www.wikidata.org/wiki/Q1145117","display_name":"Poisson process","level":3,"score":0.6225568},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6047587},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.571842},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.5445564},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5370248},{"id":"https://openalex.org/C135945739","wikidata":"https://www.wikidata.org/wiki/Q1211457","display_name":"Software release life cycle","level":5,"score":0.5353167},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.48866537},{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.47994784},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.43482924},{"id":"https://openalex.org/C100906024","wikidata":"https://www.wikidata.org/wiki/Q205692","display_name":"Poisson distribution","level":2,"score":0.35734412},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3316442},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20046028},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13763586},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.infsof.2007.12.001","pdf_url":null,"source":{"id":"https://openalex.org/S205010575","display_name":"Information and Software Technology","issn_l":"0950-5849","issn":["0950-5849","1873-6025"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":33,"referenced_works":["https://openalex.org/W124052719","https://openalex.org/W1505648523","https://openalex.org/W1522169511","https://openalex.org/W1544461401","https://openalex.org/W1554758995","https://openalex.org/W1560412976","https://openalex.org/W1564722845","https://openalex.org/W1576266525","https://openalex.org/W1965970907","https://openalex.org/W1966017250","https://openalex.org/W1972467266","https://openalex.org/W1976054948","https://openalex.org/W2004165345","https://openalex.org/W2009480997","https://openalex.org/W2019486892","https://openalex.org/W2021948416","https://openalex.org/W2032901416","https://openalex.org/W2036138637","https://openalex.org/W2052009751","https://openalex.org/W2056589095","https://openalex.org/W2110068396","https://openalex.org/W2119610685","https://openalex.org/W2141619592","https://openalex.org/W2164021611","https://openalex.org/W2327443554","https://openalex.org/W2332678043","https://openalex.org/W240225830","https://openalex.org/W2405749968","https://openalex.org/W2505356245","https://openalex.org/W28222485","https://openalex.org/W2914956942","https://openalex.org/W4212991566","https://openalex.org/W656028932"],"related_works":["https://openalex.org/W818155229","https://openalex.org/W4366563794","https://openalex.org/W4303457073","https://openalex.org/W4238386252","https://openalex.org/W2888996107","https://openalex.org/W2188442245","https://openalex.org/W1998377479","https://openalex.org/W1978359496","https://openalex.org/W1533183111","https://openalex.org/W1521772560"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2084150660","counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":1}],"updated_date":"2025-01-21T02:34:39.407748","created_date":"2016-06-24"}