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{"id":"https://openalex.org/W2041601246","doi":"https://doi.org/10.1016/0165-6074(94)90068-x","title":"An efficient critical path tracing algorithm for sequential circuits","display_name":"An efficient critical path tracing algorithm for sequential circuits","publication_year":1994,"publication_date":"1994-12-01","ids":{"openalex":"https://openalex.org/W2041601246","doi":"https://doi.org/10.1016/0165-6074(94)90068-x","mag":"2041601246"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/0165-6074(94)90068-x","pdf_url":null,"source":{"id":"https://openalex.org/S92214702","display_name":"Microprocessing and Microprogramming","issn_l":"0165-6074","issn":["0165-6074","1878-7061"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109438440","display_name":"Hoon Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"funder","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoon Chang","raw_affiliation_strings":["Dept. of Software Engineering, SoongSil University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Software Engineering, SoongSil University, Seoul, Korea","institution_ids":["https://openalex.org/I141371507"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"funder","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob A. Abraham","raw_affiliation_strings":["Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":53},"biblio":{"volume":"40","issue":"10-12","first_page":"913","last_page":"916"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.81876594},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.68719816},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.6111621},{"id":"https://openalex.org/keywords/tracing","display_name":"Tracing","score":0.59837914}],"concepts":[{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.81876594},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8026699},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.69610256},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.68719816},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.66060656},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6217125},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.6111621},{"id":"https://openalex.org/C138673069","wikidata":"https://www.wikidata.org/wiki/Q322229","display_name":"Tracing","level":2,"score":0.59837914},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.41469675},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3219809},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/0165-6074(94)90068-x","pdf_url":null,"source":{"id":"https://openalex.org/S92214702","display_name":"Microprocessing and Microprogramming","issn_l":"0165-6074","issn":["0165-6074","1878-7061"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":13,"referenced_works":["https://openalex.org/W142798423","https://openalex.org/W1556970628","https://openalex.org/W1964043733","https://openalex.org/W1977294468","https://openalex.org/W2012426329","https://openalex.org/W2036824070","https://openalex.org/W2100196964","https://openalex.org/W2117146149","https://openalex.org/W2135931142","https://openalex.org/W2149107969","https://openalex.org/W2156340730","https://openalex.org/W2911629391","https://openalex.org/W2913252637"],"related_works":["https://openalex.org/W4256668550","https://openalex.org/W2124118389","https://openalex.org/W2102852972","https://openalex.org/W2087755522","https://openalex.org/W2074447985","https://openalex.org/W2041601246","https://openalex.org/W2034067535","https://openalex.org/W1983209177","https://openalex.org/W1558614015","https://openalex.org/W1531179955"],"abstract_inverted_index":null,"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2041601246","counts_by_year":[],"updated_date":"2025-01-27T21:31:34.358493","created_date":"2016-06-24"}