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{"id":"https://openalex.org/W2008617346","doi":"https://doi.org/10.1016/0141-9331(94)90112-0","title":"Investigating the effects of induced faults in transputer systems","display_name":"Investigating the effects of induced faults in transputer systems","publication_year":1994,"publication_date":"1994-04-01","ids":{"openalex":"https://openalex.org/W2008617346","doi":"https://doi.org/10.1016/0141-9331(94)90112-0","mag":"2008617346"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/0141-9331(94)90112-0","pdf_url":null,"source":{"id":"https://openalex.org/S195663827","display_name":"Microprocessors and Microsystems","issn_l":"0141-9331","issn":["0141-9331","1872-9436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004721640","display_name":"Anway Mukherjee","orcid":"https://orcid.org/0000-0002-7071-8742"},"institutions":[{"id":"https://openalex.org/I52099693","display_name":"University of York","ror":"https://ror.org/04m01e293","country_code":"GB","type":"education","lineage":["https://openalex.org/I52099693"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"A.M. Mukherjee","raw_affiliation_strings":["Department of Electronics, University of York, Heslington, York YO1 SDD, UK"],"affiliations":[{"raw_affiliation_string":"Department of Electronics, University of York, Heslington, York YO1 SDD, UK","institution_ids":["https://openalex.org/I52099693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048789717","display_name":"Andy M. Tyrrell","orcid":"https://orcid.org/0000-0002-8533-2404"},"institutions":[{"id":"https://openalex.org/I52099693","display_name":"University of York","ror":"https://ror.org/04m01e293","country_code":"GB","type":"education","lineage":["https://openalex.org/I52099693"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"A.M. Tyrrell","raw_affiliation_strings":["Department of Electronics, University of York, Heslington, York YO1 SDD, UK"],"affiliations":[{"raw_affiliation_string":"Department of Electronics, University of York, Heslington, York YO1 SDD, UK","institution_ids":["https://openalex.org/I52099693"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2200,"currency":"USD","value_usd":2200,"provenance":"doaj"},"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":53},"biblio":{"volume":"18","issue":"3","first_page":"151","last_page":"163"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9989,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9989,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9978,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9974,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transputer","display_name":"Transputer","score":0.59760946}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.87647474},{"id":"https://openalex.org/C2778319340","wikidata":"https://www.wikidata.org/wiki/Q776861","display_name":"Transputer","level":2,"score":0.59760946},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5362776},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5059702},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.49164683},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.45700112},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.45248252},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.42753047},{"id":"https://openalex.org/C489000","wikidata":"https://www.wikidata.org/wiki/Q747385","display_name":"Data flow diagram","level":2,"score":0.4217651},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3659354},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.28669375},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.19482207},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.17387551},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1016/0141-9331(94)90112-0","pdf_url":null,"source":{"id":"https://openalex.org/S195663827","display_name":"Microprocessors and Microsystems","issn_l":"0141-9331","issn":["0141-9331","1872-9436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.81,"display_name":"Peace, justice, and strong institutions"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":17,"referenced_works":["https://openalex.org/W103553595","https://openalex.org/W151836933","https://openalex.org/W1524620946","https://openalex.org/W1595174839","https://openalex.org/W1606900254","https://openalex.org/W1976952503","https://openalex.org/W1979303606","https://openalex.org/W1992782801","https://openalex.org/W1999769418","https://openalex.org/W2015708983","https://openalex.org/W2060387012","https://openalex.org/W2127708558","https://openalex.org/W2129360963","https://openalex.org/W2503009321","https://openalex.org/W2616349605","https://openalex.org/W2912822837","https://openalex.org/W4247166254"],"related_works":["https://openalex.org/W599784109","https://openalex.org/W4234129760","https://openalex.org/W366366381","https://openalex.org/W2797868626","https://openalex.org/W2215847653","https://openalex.org/W2155007862","https://openalex.org/W2071148424","https://openalex.org/W1931008194","https://openalex.org/W142407627","https://openalex.org/W105768848"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2008617346","counts_by_year":[],"updated_date":"2024-12-15T21:06:00.271913","created_date":"2016-06-24"}