{"id":"https://openalex.org/W1972427965","doi":"https://doi.org/10.1007/s13198-013-0170-9","title":"Flip\u2013flop selection for partial enhance scan chain using DTESFF for high transition delay fault coverage","display_name":"Flip\u2013flop selection for partial enhance scan chain using DTESFF for high transition delay fault coverage","publication_year":2013,"publication_date":"2013-06-22","ids":{"openalex":"https://openalex.org/W1972427965","doi":"https://doi.org/10.1007/s13198-013-0170-9","mag":"1972427965"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-013-0170-9","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0976-4348","issn":["0976-4348","0975-6809"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008000857","display_name":"Ashok Kumar Suhag","orcid":null},"institutions":[{"id":"https://openalex.org/I72769676","display_name":"Gautam Buddha University","ror":"https://ror.org/026cfwd52","country_code":"IN","type":"education","lineage":["https://openalex.org/I72769676"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ashok Kumar Suhag","raw_affiliation_strings":["GAUTAM BUDDHA UNIVERSITY"],"affiliations":[{"raw_affiliation_string":"GAUTAM BUDDHA UNIVERSITY","institution_ids":["https://openalex.org/I72769676"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080942064","display_name":"Vivek Shrivastava","orcid":"https://orcid.org/0000-0003-4300-4784"},"institutions":[{"id":"https://openalex.org/I44635919","display_name":"National Institute of Technology Delhi","ror":"https://ror.org/032twef21","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210152752","https://openalex.org/I44635919"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vivek Shrivastava","raw_affiliation_strings":["National Institute of Technology Delhi"],"affiliations":[{"raw_affiliation_string":"National Institute of Technology Delhi","institution_ids":["https://openalex.org/I44635919"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034337026","display_name":"Nidhi Singh","orcid":"https://orcid.org/0000-0003-0640-4068"},"institutions":[{"id":"https://openalex.org/I72769676","display_name":"Gautam Buddha University","ror":"https://ror.org/026cfwd52","country_code":"IN","type":"education","lineage":["https://openalex.org/I72769676"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Nidhi Singh","raw_affiliation_strings":["GAUTAM BUDDHA UNIVERSITY"],"affiliations":[{"raw_affiliation_string":"GAUTAM BUDDHA UNIVERSITY","institution_ids":["https://openalex.org/I72769676"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990,"provenance":"doaj"},"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":3,"citation_normalized_percentile":{"value":0.62148,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":76,"max":78},"biblio":{"volume":"4","issue":"3","first_page":"303","last_page":"311"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.9183113},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7103774},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.68553346},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.557742},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.5365114},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.49925804},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.49679354},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.47743306},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4374665}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.9183113},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7103774},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6890245},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.68553346},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.65485764},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.557742},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.5365114},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5316608},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.49925804},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.49679354},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48853526},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.47743306},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47137368},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4374665},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.35959142},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3553499},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35471988},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3428979},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.29674166},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.28652024},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.27398056},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.22077739},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.17977273},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08281997},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.07126075},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-013-0170-9","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0976-4348","issn":["0976-4348","0975-6809"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.73}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":28,"referenced_works":["https://openalex.org/W1552321420","https://openalex.org/W1572287951","https://openalex.org/W1581327216","https://openalex.org/W1595368737","https://openalex.org/W1815158991","https://openalex.org/W1975601432","https://openalex.org/W1980985044","https://openalex.org/W1998350348","https://openalex.org/W2005319125","https://openalex.org/W2040178082","https://openalex.org/W2061946964","https://openalex.org/W2101388150","https://openalex.org/W2107203554","https://openalex.org/W2108254527","https://openalex.org/W2112705672","https://openalex.org/W2116874325","https://openalex.org/W2120507587","https://openalex.org/W2122827545","https://openalex.org/W2125424164","https://openalex.org/W2133913685","https://openalex.org/W2134239437","https://openalex.org/W2141985270","https://openalex.org/W2144817027","https://openalex.org/W2147670587","https://openalex.org/W2156577524","https://openalex.org/W2161329778","https://openalex.org/W2161339729","https://openalex.org/W4240724929"],"related_works":["https://openalex.org/W4253246424","https://openalex.org/W2888456858","https://openalex.org/W2160753176","https://openalex.org/W2159919870","https://openalex.org/W2156844409","https://openalex.org/W2152076855","https://openalex.org/W2148192154","https://openalex.org/W2117137640","https://openalex.org/W2098411556","https://openalex.org/W2060366923"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1972427965","counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2024-12-24T16:04:12.881531","created_date":"2016-06-24"}