乐胖代购免代理版

{"id":"https://openalex.org/W2092871004","doi":"https://doi.org/10.1007/s10836-005-5285-8","title":"EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement","display_name":"EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement","publication_year":2005,"publication_date":"2005-02-01","ids":{"openalex":"https://openalex.org/W2092871004","doi":"https://doi.org/10.1007/s10836-005-5285-8","mag":"2092871004"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-005-5285-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111841559","display_name":"J.M. Portal","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J. M. Portal","raw_affiliation_strings":["L2MP-Polytech-UMR CNRS 6137, IMT, Technop\u00f4le de Ch\u00e2teau Gombert, France 20#TAB#"],"affiliations":[{"raw_affiliation_string":"L2MP-Polytech-UMR CNRS 6137, IMT, Technop\u00f4le de Ch\u00e2teau Gombert, France 20#TAB#","institution_ids":["https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076568215","display_name":"H. Aziza","orcid":"https://orcid.org/0000-0002-8278-7462"},"institutions":[{"id":"https://openalex.org/I4210135477","display_name":"Arab Foundations Forum","ror":"https://ror.org/03y00r958","country_code":"JO","type":"nonprofit","lineage":["https://openalex.org/I4210135477"]}],"countries":["JO"],"is_corresponding":false,"raw_author_name":"H. Aziza","raw_affiliation_strings":["Aff1 Aff2#TAB#"],"affiliations":[{"raw_affiliation_string":"Aff1 Aff2#TAB#","institution_ids":["https://openalex.org/I4210135477"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027442199","display_name":"D. L. Levi Ne","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"D. N\ufffde","raw_affiliation_strings":["ST-Microelectronics, ZI de Rousset BP 2, France#TAB#"],"affiliations":[{"raw_affiliation_string":"ST-Microelectronics, ZI de Rousset BP 2, France#TAB#","institution_ids":["https://openalex.org/I131827901"]}]}],"institution_assertions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990,"provenance":"doaj"},"apc_paid":null,"fwci":0.587,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":2,"citation_normalized_percentile":{"value":0.557918,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":68,"max":71},"biblio":{"volume":"21","issue":"1","first_page":"33","last_page":"42"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eeprom","display_name":"EEPROM","score":0.98159766},{"id":"https://openalex.org/keywords/eprom","display_name":"EPROM","score":0.58065534},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-Volatile Memory","score":0.5596132},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.4529608}],"concepts":[{"id":"https://openalex.org/C27699510","wikidata":"https://www.wikidata.org/wiki/Q205908","display_name":"EEPROM","level":2,"score":0.98159766},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.7618474},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5905145},{"id":"https://openalex.org/C163980746","wikidata":"https://www.wikidata.org/wiki/Q378210","display_name":"EPROM","level":2,"score":0.58065534},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.5596132},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.53892183},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.51925683},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5036952},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.4529608},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34662554},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33525223},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30648348},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2726221},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.094986945},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-005-5285-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":10,"referenced_works":["https://openalex.org/W1518071943","https://openalex.org/W1565760642","https://openalex.org/W1917000337","https://openalex.org/W1980584607","https://openalex.org/W2111865441","https://openalex.org/W2117314013","https://openalex.org/W2162922645","https://openalex.org/W2181842310","https://openalex.org/W2914223879","https://openalex.org/W4255013851"],"related_works":["https://openalex.org/W2510382096","https://openalex.org/W2142133575","https://openalex.org/W2134529477","https://openalex.org/W2083975737","https://openalex.org/W2053931924","https://openalex.org/W2032705268","https://openalex.org/W2028906339","https://openalex.org/W1910573384","https://openalex.org/W1870416553","https://openalex.org/W1853632475"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2092871004","counts_by_year":[],"updated_date":"2024-12-09T09:41:34.146108","created_date":"2016-06-24"}