乐胖代购免代理版

{"id":"https://openalex.org/W2050346765","doi":"https://doi.org/10.1007/s00138-010-0255-2","title":"Automatic multiple view inspection using geometrical tracking and feature analysis in aluminum wheels","display_name":"Automatic multiple view inspection using geometrical tracking and feature analysis in aluminum wheels","publication_year":2010,"publication_date":"2010-03-05","ids":{"openalex":"https://openalex.org/W2050346765","doi":"https://doi.org/10.1007/s00138-010-0255-2","mag":"2050346765"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00138-010-0255-2","pdf_url":null,"source":{"id":"https://openalex.org/S27728525","display_name":"Machine Vision and Applications","issn_l":"0932-8092","issn":["0932-8092","1432-1769"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078288087","display_name":"Miguel Carrasco","orcid":"https://orcid.org/0000-0002-5389-7590"},"institutions":[{"id":"https://openalex.org/I911713783","display_name":"Diego Portales University","ror":"https://ror.org/03gtdcg60","country_code":"CL","type":"education","lineage":["https://openalex.org/I911713783"]}],"countries":["CL"],"is_corresponding":true,"raw_author_name":"Miguel Carrasco","raw_affiliation_strings":["Escuela de Ingenier\u00eda Inform\u00e1tica, Facultad de Ingenier\u00eda, Universidad Diego Portales, Av. Ej\u00e9rcito 441, Santiago, Chile"],"affiliations":[{"raw_affiliation_string":"Escuela de Ingenier\u00eda Inform\u00e1tica, Facultad de Ingenier\u00eda, Universidad Diego Portales, Av. Ej\u00e9rcito 441, Santiago, Chile","institution_ids":["https://openalex.org/I911713783"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018322893","display_name":"Domingo Mery","orcid":"https://orcid.org/0000-0003-4748-3882"},"institutions":[{"id":"https://openalex.org/I162148367","display_name":"Pontificia Universidad Cat\u00f3lica de Chile","ror":"https://ror.org/04teye511","country_code":"CL","type":"funder","lineage":["https://openalex.org/I162148367"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Domingo Mery","raw_affiliation_strings":["Departamento de Ciencia de la Computaci\u00f3n, Pontificia Universidad Cat\u00f3lica de Chile, Av. Vicu\u00f1a Mackenna 4860 (143), Santiago, Chile"],"affiliations":[{"raw_affiliation_string":"Departamento de Ciencia de la Computaci\u00f3n, Pontificia Universidad Cat\u00f3lica de Chile, Av. Vicu\u00f1a Mackenna 4860 (143), Santiago, Chile","institution_ids":["https://openalex.org/I162148367"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5078288087"],"corresponding_institution_ids":["https://openalex.org/I911713783"],"apc_list":{"value":2490,"currency":"EUR","value_usd":3090},"apc_paid":null,"fwci":2.279,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":32,"citation_normalized_percentile":{"value":0.956874,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":92,"max":93},"biblio":{"volume":"22","issue":"1","first_page":"157","last_page":"170"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9982,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9963,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/false-alarm","display_name":"False alarm","score":0.6556625},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.44436485},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.4111635}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.78702164},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7225012},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6930233},{"id":"https://openalex.org/C2776836416","wikidata":"https://www.wikidata.org/wiki/Q1364844","display_name":"False alarm","level":2,"score":0.6556625},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.5745304},{"id":"https://openalex.org/C77052588","wikidata":"https://www.wikidata.org/wiki/Q644307","display_name":"Constant false alarm rate","level":2,"score":0.48559803},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.44436485},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.44278356},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4343322},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.4111635},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.33959597},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00138-010-0255-2","pdf_url":null,"source":{"id":"https://openalex.org/S27728525","display_name":"Machine Vision and Applications","issn_l":"0932-8092","issn":["0932-8092","1432-1769"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.64,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":42,"referenced_works":["https://openalex.org/W1536719366","https://openalex.org/W1540410989","https://openalex.org/W1545559907","https://openalex.org/W1556263490","https://openalex.org/W1564419782","https://openalex.org/W1591376121","https://openalex.org/W1603458042","https://openalex.org/W175299481","https://openalex.org/W1963638909","https://openalex.org/W1965389784","https://openalex.org/W1965696824","https://openalex.org/W2004313226","https://openalex.org/W2024991751","https://openalex.org/W2025220169","https://openalex.org/W2031919959","https://openalex.org/W2032226221","https://openalex.org/W2033819227","https://openalex.org/W2046385538","https://openalex.org/W2063565635","https://openalex.org/W2077172306","https://openalex.org/W2085243278","https://openalex.org/W2091250708","https://openalex.org/W2109925328","https://openalex.org/W2112074894","https://openalex.org/W2116044718","https://openalex.org/W2121159332","https://openalex.org/W2122135003","https://openalex.org/W2123026937","https://openalex.org/W2124614039","https://openalex.org/W2130331473","https://openalex.org/W2131529365","https://openalex.org/W2149052786","https://openalex.org/W2156066794","https://openalex.org/W2157674331","https://openalex.org/W2167917621","https://openalex.org/W235324783","https://openalex.org/W2467209801","https://openalex.org/W2799061466","https://openalex.org/W3016132944","https://openalex.org/W3021282624","https://openalex.org/W4230946174","https://openalex.org/W4237873856"],"related_works":["https://openalex.org/W2998914036","https://openalex.org/W2781569684","https://openalex.org/W2388326001","https://openalex.org/W2165968459","https://openalex.org/W2132174924","https://openalex.org/W2040150569","https://openalex.org/W2013909972","https://openalex.org/W1989866424","https://openalex.org/W1983393909","https://openalex.org/W1911540634"],"abstract_inverted_index":null,"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2050346765","counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2025-03-20T22:32:12.662102","created_date":"2016-06-24"}