{"id":"https://openalex.org/W1966833457","doi":"https://doi.org/10.1007/bf01759033","title":"Partitioning circuits for improved testability","display_name":"Partitioning circuits for improved testability","publication_year":1991,"publication_date":"1991-06-01","ids":{"openalex":"https://openalex.org/W1966833457","doi":"https://doi.org/10.1007/bf01759033","mag":"1966833457"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf01759033","pdf_url":null,"source":{"id":"https://openalex.org/S89324355","display_name":"Algorithmica","issn_l":"0178-4617","issn":["0178-4617","1432-0541"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100878559","display_name":"Sandeep Bhatt","orcid":null},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"funder","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sandeep N. Bhatt","raw_affiliation_strings":["Department of Computer Science, Yale University, New Haven, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Yale University, New Haven, USA","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113657664","display_name":"Fan Chung","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107053","display_name":"Core Competence","ror":"https://ror.org/012cc0c94","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107053"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fan R. K. Chung","raw_affiliation_strings":["Bell Communications Research, Morristown, USA"],"affiliations":[{"raw_affiliation_string":"Bell Communications Research, Morristown, USA","institution_ids":["https://openalex.org/I4210107053"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032954059","display_name":"Arnold L. Rosenberg","orcid":"https://orcid.org/0000-0002-1171-9323"},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"funder","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arnold L. Rosenberg","raw_affiliation_strings":["Department of Computer Science University of Massachusetts Amherst, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science University of Massachusetts Amherst, USA","institution_ids":["https://openalex.org/I24603500"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2290,"currency":"EUR","value_usd":2890},"apc_paid":null,"fwci":3.06,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":35,"citation_normalized_percentile":{"value":0.899052,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":91},"biblio":{"volume":"6","issue":"1-6","first_page":"37","last_page":"48"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12029","display_name":"DNA and Biological Computing","score":0.9934,"subfield":{"id":"https://openalex.org/subfields/1312","display_name":"Molecular Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7736849},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.5808021},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.51559466}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7736849},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.638832},{"id":"https://openalex.org/C42812","wikidata":"https://www.wikidata.org/wiki/Q1082910","display_name":"Partition (number theory)","level":2,"score":0.6216775},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.61425436},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.5808021},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.5425565},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.51559466},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.50644195},{"id":"https://openalex.org/C157922185","wikidata":"https://www.wikidata.org/wiki/Q173198","display_name":"Logic synthesis","level":3,"score":0.49971628},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4935943},{"id":"https://openalex.org/C187455244","wikidata":"https://www.wikidata.org/wiki/Q942353","display_name":"Boolean function","level":2,"score":0.46907088},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.43245798},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.3746966},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.37423936},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.33004954},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.32341874},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.09472713},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf01759033","pdf_url":null,"source":{"id":"https://openalex.org/S89324355","display_name":"Algorithmica","issn_l":"0178-4617","issn":["0178-4617","1432-0541"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.57,"display_name":"Affordable and clean energy"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":15,"referenced_works":["https://openalex.org/W12081373","https://openalex.org/W1979092306","https://openalex.org/W1990311419","https://openalex.org/W1991650763","https://openalex.org/W2004437077","https://openalex.org/W2005196877","https://openalex.org/W2008618370","https://openalex.org/W2011039300","https://openalex.org/W2049664543","https://openalex.org/W2064759901","https://openalex.org/W2100807758","https://openalex.org/W2148631003","https://openalex.org/W3152126650","https://openalex.org/W4234345682","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2388266617","https://openalex.org/W2154273588","https://openalex.org/W2153829730","https://openalex.org/W2104359803","https://openalex.org/W2098419840","https://openalex.org/W2090956884","https://openalex.org/W1966833457","https://openalex.org/W1943249282","https://openalex.org/W1939541994","https://openalex.org/W1875203824"],"abstract_inverted_index":null,"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1966833457","counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-02-22T15:57:07.212585","created_date":"2016-06-24"}