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{"id":"https://openalex.org/W2082460353","doi":"https://doi.org/10.1007/bf00996439","title":"Universal test set generation for CMOS circuits","display_name":"Universal test set generation for CMOS circuits","publication_year":1995,"publication_date":"1995-06-01","ids":{"openalex":"https://openalex.org/W2082460353","doi":"https://doi.org/10.1007/bf00996439","mag":"2082460353"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00996439","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060820268","display_name":"Beyin Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]},{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"funder","lineage":["https://openalex.org/I148366613"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"Beyin Chen","raw_affiliation_strings":["Department of Electronic Engineering & Institute of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, Republic of China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering & Institute of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, Republic of China","institution_ids":["https://openalex.org/I4210110458","https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031637850","display_name":"Chung Len Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"funder","lineage":["https://openalex.org/I148366613"]},{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"Chung Len Lee","raw_affiliation_strings":["Department of Electronic Engineering & Institute of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, Republic of China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering & Institute of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, Republic of China","institution_ids":["https://openalex.org/I148366613","https://openalex.org/I4210110458"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":54},"biblio":{"volume":"6","issue":"3","first_page":"313","last_page":"323"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9992,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/truth-table","display_name":"Truth table","score":0.43441278}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5967806},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.58966696},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5840738},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5227597},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.49196216},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4785443},{"id":"https://openalex.org/C56949724","wikidata":"https://www.wikidata.org/wiki/Q219079","display_name":"Truth table","level":2,"score":0.43441278},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.41588035},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.41486204},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3216248},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28133464},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.15008986},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1124475},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.095354706},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07305178},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00996439","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7,"display_name":"Affordable and clean energy"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":26,"referenced_works":["https://openalex.org/W110116753","https://openalex.org/W1980561377","https://openalex.org/W1983731190","https://openalex.org/W1983881446","https://openalex.org/W1984660625","https://openalex.org/W1996682897","https://openalex.org/W2043905562","https://openalex.org/W2045122863","https://openalex.org/W2046817879","https://openalex.org/W2079723798","https://openalex.org/W2105761964","https://openalex.org/W2107468605","https://openalex.org/W2112206779","https://openalex.org/W2122687310","https://openalex.org/W2132533180","https://openalex.org/W2135410752","https://openalex.org/W2167622257","https://openalex.org/W2170668119","https://openalex.org/W33238586","https://openalex.org/W4206163962","https://openalex.org/W4235228648","https://openalex.org/W4243437748","https://openalex.org/W4246189507","https://openalex.org/W4247592337","https://openalex.org/W67803044","https://openalex.org/W97180957"],"related_works":["https://openalex.org/W4233815414","https://openalex.org/W2502560717","https://openalex.org/W2372170743","https://openalex.org/W2358725432","https://openalex.org/W2355215981","https://openalex.org/W2134239377","https://openalex.org/W2117014006","https://openalex.org/W1984303163","https://openalex.org/W1558545464","https://openalex.org/W1509211761"],"abstract_inverted_index":null,"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2082460353","counts_by_year":[],"updated_date":"2025-02-09T12:23:51.833043","created_date":"2016-06-24"}