{"id":"https://openalex.org/W4401224780","doi":"https://doi.org/10.1007/978-981-97-5597-4_34","title":"Handheld Knife Stick Detection Based on Dual-Path Multi-layer Residuals","display_name":"Handheld Knife Stick Detection Based on Dual-Path Multi-layer Residuals","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401224780","doi":"https://doi.org/10.1007/978-981-97-5597-4_34"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-97-5597-4_34","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"book series"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"book-chapter","type_crossref":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113316593","display_name":"Liuhui Jin","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Liuhui Jin","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068963187","display_name":"Quanli Lu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Quanli Lu","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106217314","display_name":"Chenchen Sui","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chenchen Sui","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081165207","display_name":"Jian\u2010Zhang Chen","orcid":"https://orcid.org/0000-0002-1071-2234"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jiyang Chen","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101927048","display_name":"Changle Yi","orcid":"https://orcid.org/0000-0003-1449-223X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Changle Yi","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101906174","display_name":"Jiaxuan Jiang","orcid":"https://orcid.org/0009-0001-9686-4836"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jiaxuan Jiang","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5010154194","display_name":"Yanhua Shi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yanhua Shi","raw_affiliation_strings":[],"affiliations":[]}],"institution_assertions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392,"provenance":"doaj"},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":84},"biblio":{"volume":null,"issue":null,"first_page":"403","last_page":"415"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9982,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9956,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.85633755},{"id":"https://openalex.org/C186967261","wikidata":"https://www.wikidata.org/wiki/Q5082128","display_name":"Mobile device","level":2,"score":0.6602342},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.5435916},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5348804},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4708559},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.14809844},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.118043035},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-97-5597-4_34","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"book series"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":16,"referenced_works":["https://openalex.org/W2590001609","https://openalex.org/W2618530766","https://openalex.org/W2747355315","https://openalex.org/W2900484583","https://openalex.org/W2963351448","https://openalex.org/W2974320575","https://openalex.org/W3106250896","https://openalex.org/W3107473354","https://openalex.org/W3132626268","https://openalex.org/W3177052299","https://openalex.org/W3195716189","https://openalex.org/W4293721646","https://openalex.org/W4307170964","https://openalex.org/W4312820606","https://openalex.org/W4312977443","https://openalex.org/W4377969678"],"related_works":["https://openalex.org/W4396701345","https://openalex.org/W4396696052","https://openalex.org/W4395014643","https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2382290278","https://openalex.org/W2376932109","https://openalex.org/W2358668433","https://openalex.org/W2001405890"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W4401224780","counts_by_year":[],"updated_date":"2024-12-15T00:55:52.162047","created_date":"2024-08-02"}