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{"id":"https://openalex.org/W1578473715","doi":"https://doi.org/10.1007/3-540-61772-8_43","title":"Multi-level test generation and fault diagnosis for finite state machines","display_name":"Multi-level test generation and fault diagnosis for finite state machines","publication_year":1996,"publication_date":"1996-01-01","ids":{"openalex":"https://openalex.org/W1578473715","doi":"https://doi.org/10.1007/3-540-61772-8_43","mag":"1578473715"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/3-540-61772-8_43","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"book series"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"book-chapter","type_crossref":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010536057","display_name":"Raimund Ubar","orcid":"https://orcid.org/0000-0001-8186-4385"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"R. Ubar","raw_affiliation_strings":["Tallinn Technical University"],"affiliations":[{"raw_affiliation_string":"Tallinn Technical University","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034963392","display_name":"M. Brik","orcid":null},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"M. Brik","raw_affiliation_strings":["Tallinn Technical University"],"affiliations":[{"raw_affiliation_string":"Tallinn Technical University","institution_ids":["https://openalex.org/I111112146"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392,"provenance":"doaj"},"apc_paid":null,"fwci":1.886,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.652318,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":71,"max":73},"biblio":{"volume":null,"issue":null,"first_page":"264","last_page":"281"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9974,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9962,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/initialization","display_name":"Initialization","score":0.67507863},{"id":"https://openalex.org/keywords/backtracking","display_name":"Backtracking","score":0.5693834},{"id":"https://openalex.org/keywords/extended-finite-state-machine","display_name":"Extended finite-state machine","score":0.49576506},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4539856}],"concepts":[{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7187091},{"id":"https://openalex.org/C114466953","wikidata":"https://www.wikidata.org/wiki/Q6034165","display_name":"Initialization","level":2,"score":0.67507863},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.66987395},{"id":"https://openalex.org/C167822520","wikidata":"https://www.wikidata.org/wiki/Q176452","display_name":"Finite-state machine","level":2,"score":0.63423806},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5752266},{"id":"https://openalex.org/C156884757","wikidata":"https://www.wikidata.org/wiki/Q798554","display_name":"Backtracking","level":2,"score":0.5693834},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.51097},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.50358194},{"id":"https://openalex.org/C181062253","wikidata":"https://www.wikidata.org/wiki/Q5421886","display_name":"Extended finite-state machine","level":3,"score":0.49576506},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.46398357},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4539856},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.43360528},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.39887604},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35674185},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3319713},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.27104968},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09565401},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.059768796},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1007/3-540-61772-8_43","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319965","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Springer Nature","Springer Science+Business Media"],"type":"book series"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":19,"referenced_works":["https://openalex.org/W1531243865","https://openalex.org/W1823755974","https://openalex.org/W192372662","https://openalex.org/W1988556782","https://openalex.org/W2010935983","https://openalex.org/W2047307891","https://openalex.org/W2060953022","https://openalex.org/W2080267935","https://openalex.org/W2128682078","https://openalex.org/W2135931142","https://openalex.org/W2140627345","https://openalex.org/W2147573597","https://openalex.org/W2152040677","https://openalex.org/W2154515346","https://openalex.org/W2154561813","https://openalex.org/W2169762009","https://openalex.org/W42070592","https://openalex.org/W4230177558","https://openalex.org/W4230587734"],"related_works":["https://openalex.org/W4256030018","https://openalex.org/W4252048065","https://openalex.org/W3147038789","https://openalex.org/W2568949342","https://openalex.org/W2340957901","https://openalex.org/W2157154381","https://openalex.org/W2147400189","https://openalex.org/W2031110496","https://openalex.org/W1555400249","https://openalex.org/W1519923721"],"abstract_inverted_index":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1578473715","counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2025-01-22T05:51:20.512063","created_date":"2016-06-24"}