{"id":"https://openalex.org/W2005256130","doi":"https://doi.org/10.1002/scj.4690191209","title":"Design of a Fault-Tolerant System Based on Knowledge-Engineering Approach and Its Application to a Digital Control System","display_name":"Design of a Fault-Tolerant System Based on Knowledge-Engineering Approach and Its Application to a Digital Control System","publication_year":1988,"publication_date":"1988-01-01","ids":{"openalex":"https://openalex.org/W2005256130","doi":"https://doi.org/10.1002/scj.4690191209","mag":"2005256130"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690191209","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037191455","display_name":"Michitaka Kameyama","orcid":"https://orcid.org/0000-0002-4245-9907"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"funder","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Michitaka Kameyama","raw_affiliation_strings":["Faculty of Engineering, Tohoku University, Sendai, Japan 980","Michitaka Kameyama obtained a Dr. of Engineering degree from Tohoku University in 1978, and appointed a Research Associate there the same year. In 1981 he was appointed Associate Professor. He has been engaged in research on multiple-valued information processing systems, highly reliable systems, VLSI processors, and robotics. Recipient of the Award for Excellence at I.E.E.E. ISMVL in 1984 and 1986","the Technically Excellent Award from the Society of Instrument and Control Engineers of Japan, in 1986. He is a member of I.E.E.E."],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Tohoku University, Sendai, Japan 980","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Michitaka Kameyama obtained a Dr. of Engineering degree from Tohoku University in 1978, and appointed a Research Associate there the same year. In 1981 he was appointed Associate Professor. He has been engaged in research on multiple-valued information processing systems, highly reliable systems, VLSI processors, and robotics. Recipient of the Award for Excellence at I.E.E.E. ISMVL in 1984 and 1986","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"the Technically Excellent Award from the Society of Instrument and Control Engineers of Japan, in 1986. He is a member of I.E.E.E.","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100423650","display_name":"Zheng Li","orcid":"https://orcid.org/0000-0001-5772-0189"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"funder","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"funder","lineage":["https://openalex.org/I204983213"]},{"id":"https://openalex.org/I4387154772","display_name":"Changcheng Institute of Metrology & Measurement","ror":"https://ror.org/045yf3k41","country_code":null,"type":"government","lineage":["https://openalex.org/I4387154772"]}],"countries":["CN","JP"],"is_corresponding":false,"raw_author_name":"Li Zheng","raw_affiliation_strings":["Faculty of Engineering, Tohoku University, Sendai, Japan 980","Li Zheng graduated from Tientsin Light Industrial Institute (China) in 1977, and obtained a Master's degree from Harbin Institute of Technology (China) in 1982. Appointed Engineer in the Changcheng Institute of Metrology and Measurement, Peking. He has been in the graduate school of Tohoku University (Japan) since 1986, engaged in research on highly reliable digital control systems."],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Tohoku University, Sendai, Japan 980","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Li Zheng graduated from Tientsin Light Industrial Institute (China) in 1977, and obtained a Master's degree from Harbin Institute of Technology (China) in 1982. Appointed Engineer in the Changcheng Institute of Metrology and Measurement, Peking. He has been in the graduate school of Tohoku University (Japan) since 1986, engaged in research on highly reliable digital control systems.","institution_ids":["https://openalex.org/I204983213","https://openalex.org/I4387154772"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102183498","display_name":"Tatsuo Higuchi","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"funder","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tatsuo Higuchi","raw_affiliation_strings":["Faculty of Engineering, Tohoku University, Sendai, Japan 980","Tatsuo Higuchi graduated from Electronics Department, Faculty of Engineering, Tohoku University in 1962, and obtained a Dr. of Engineering degree from there in 1967. He was appointed a Research Associate in the Engineering Department the same year, Associate Professor in 1970, and has been a Professor since 1980. He is engaged in research on digital signal processing, notably, unified design theory of digital filters and signal processing processors, and multiple-valued digital systems and their applications. He received the Award for Excellence at I.E.E.E. ISMVL in 1984 and 1986","the Outstanding Transactions Paper Award from the Society of Instrument and Control Engineers of Japan in 1984","the Technically Excellent Award from the same society in 1986. He is a member of I.E.E.E."],"affiliations":[{"raw_affiliation_string":"Tatsuo Higuchi graduated from Electronics Department, Faculty of Engineering, Tohoku University in 1962, and obtained a Dr. of Engineering degree from there in 1967. He was appointed a Research Associate in the Engineering Department the same year, Associate Professor in 1970, and has been a Professor since 1980. He is engaged in research on digital signal processing, notably, unified design theory of digital filters and signal processing processors, and multiple-valued digital systems and their applications. He received the Award for Excellence at I.E.E.E. ISMVL in 1984 and 1986","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Faculty of Engineering, Tohoku University, Sendai, Japan 980","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"the Technically Excellent Award from the same society in 1986. He is a member of I.E.E.E.","institution_ids":[]},{"raw_affiliation_string":"the Outstanding Transactions Paper Award from the Society of Instrument and Control Engineers of Japan in 1984","institution_ids":[]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":3,"citation_normalized_percentile":{"value":0.768009,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":66,"max":69},"biblio":{"volume":"19","issue":"12","first_page":"81","last_page":"91"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9927,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9927,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9891,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9841,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7610834},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.66250455},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.648858},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.5286042},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.50638497},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48154715},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.44857016},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.35783508},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33886102},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.32551366},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.28973347},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.2007792},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10128629},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.08715531},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690191209","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":4,"referenced_works":["https://openalex.org/W1572474464","https://openalex.org/W1899959397","https://openalex.org/W1989875003","https://openalex.org/W563292284"],"related_works":["https://openalex.org/W35519032","https://openalex.org/W3152686072","https://openalex.org/W3129238073","https://openalex.org/W2517044585","https://openalex.org/W2354828774","https://openalex.org/W2077211377","https://openalex.org/W2056274461","https://openalex.org/W1660242800","https://openalex.org/W162527578","https://openalex.org/W1006270037"],"abstract_inverted_index":{"Abstract":[0],"It":[1],"has":[2],"been":[3],"known":[4],"that":[5],"independency":[6],"between":[7],"processings":[8],"for":[9],"replicated":[10,19],"modules":[11],"is":[12,56,134],"the":[13,25,37,71,74,80,89,93,97,108,112,131],"most":[14],"important":[15],"factor":[16],"in":[17,73,96,107],"a":[18,40,45,53],"redundant":[20],"fault\u2010tolerant":[21],"system.":[22],"To":[23],"reduce":[24],"effects":[26],"of":[27,44,82,88,130],"simultaneous":[28,31],"failures":[29],"and/or":[30],"errors":[32,34,72],"including":[33],"caused":[35],"by":[36,103,136],"input":[38,59,113],"itself,":[39],"new":[41],"design":[42],"method":[43,133],"highly":[46],"reliable":[47],"digital":[48],"control":[49,90],"system":[50],"based":[51,139],"on":[52,140],"knowledge\u2010engineering":[54],"approach":[55],"proposed.":[57],"The":[58,128],"signals":[60],"are":[61,77,100,119],"sampled":[62],"at":[63],"different":[64],"sampling":[65,115],"points":[66],"and":[67,85,116,143],"processed":[68,75],"separately.":[69],"If":[70],"results":[76],"detected":[78],"using":[79,104],"knowledge":[81],"erroneous":[83,98],"states":[84,95,106],"dynamic":[86],"characteristics":[87],"system,":[91],"then":[92],"internal":[94],"module":[99],"recovered":[101],"immediately":[102],"correct":[105],"other":[109],"module.":[110],"Since":[111],"signal":[114],"its":[117],"processing":[118],"almost":[120],"independent,":[121],"an":[122],"ultrahigh":[123],"reliability":[124,137],"can":[125],"be":[126],"achieved.":[127],"usefulness":[129],"proposed":[132],"confirmed":[135],"analysis":[138],"Markov":[141],"graphs":[142],"experimental":[144],"measurement.":[145]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2005256130","counts_by_year":[],"updated_date":"2025-03-23T02:59:11.010572","created_date":"2016-06-24"}