{"id":"https://openalex.org/W2028209961","doi":"https://doi.org/10.1002/scj.4690190103","title":"Reduction of the crosstalk noise with the guard\u2010shielding","display_name":"Reduction of the crosstalk noise with the guard\u2010shielding","publication_year":1988,"publication_date":"1988-01-01","ids":{"openalex":"https://openalex.org/W2028209961","doi":"https://doi.org/10.1002/scj.4690190103","mag":"2028209961"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690190103","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054664904","display_name":"Noboru Schibuya","orcid":null},"institutions":[{"id":"https://openalex.org/I92614990","display_name":"Tokyo University of Agriculture and Technology","ror":"https://ror.org/00qg0kr10","country_code":"JP","type":"education","lineage":["https://openalex.org/I92614990"]},{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]},{"id":"https://openalex.org/I7377986","display_name":"Takushoku University","ror":"https://ror.org/05qh38f12","country_code":"JP","type":"education","lineage":["https://openalex.org/I7377986"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noboru Schibuya","raw_affiliation_strings":["Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Japan 184","Master's program at the same University in 1972. and doctoral program at Osaka Univ. in 1978. From 1978 to 1987 Assistant at Facul. of Engi., Tokyo Univ. of Agriculture & Technology. Since 1987, Associate Professor of Takushoku University. Engaged in research on ultrasonic medical diagnosis systems, medical image processing, and electronic circuits for EMC. Dr. of Science. Studied at Tubingen Univ. from 1972 to 75","Noboru Schibuya graduated from Physics Dept., Facul. of Science, Osaka Univ. in 1970"],"affiliations":[{"raw_affiliation_string":"Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Japan 184","institution_ids":["https://openalex.org/I92614990"]},{"raw_affiliation_string":"Noboru Schibuya graduated from Physics Dept., Facul. of Science, Osaka Univ. in 1970","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"Master's program at the same University in 1972. and doctoral program at Osaka Univ. in 1978. From 1978 to 1987 Assistant at Facul. of Engi., Tokyo Univ. of Agriculture & Technology. Since 1987, Associate Professor of Takushoku University. Engaged in research on ultrasonic medical diagnosis systems, medical image processing, and electronic circuits for EMC. Dr. of Science. Studied at Tubingen Univ. from 1972 to 75","institution_ids":["https://openalex.org/I7377986","https://openalex.org/I92614990","https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007443671","display_name":"Toshio Sakamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I92614990","display_name":"Tokyo University of Agriculture and Technology","ror":"https://ror.org/00qg0kr10","country_code":"JP","type":"education","lineage":["https://openalex.org/I92614990"]},{"id":"https://openalex.org/I87099769","display_name":"Kobe College","ror":"https://ror.org/014phfv49","country_code":"JP","type":"education","lineage":["https://openalex.org/I87099769"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshio Sakamoto","raw_affiliation_strings":["Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Japan 184","Haruo Takagi graduated from Electrical Dept., Kobe College in 1970 and employed by Tateishi Electronic Ltd. nology f o r improving noises, and engineering work stations. in 1986. Now, Managing Director of V-Tech Research Co. Engaged in the development of products using microprocessors, EMC tech Resigned from Tateishi Denki KK"],"affiliations":[{"raw_affiliation_string":"Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Japan 184","institution_ids":["https://openalex.org/I92614990"]},{"raw_affiliation_string":"Haruo Takagi graduated from Electrical Dept., Kobe College in 1970 and employed by Tateishi Electronic Ltd. nology f o r improving noises, and engineering work stations. in 1986. Now, Managing Director of V-Tech Research Co. Engaged in the development of products using microprocessors, EMC tech Resigned from Tateishi Denki KK","institution_ids":["https://openalex.org/I87099769"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020908508","display_name":"Haruo Takagi","orcid":null},"institutions":[{"id":"https://openalex.org/I92614990","display_name":"Tokyo University of Agriculture and Technology","ror":"https://ror.org/00qg0kr10","country_code":"JP","type":"education","lineage":["https://openalex.org/I92614990"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Takagi","raw_affiliation_strings":["Toshio Sakamoto graduated from Ikuei College in 1983, Electronics Dept., Facul. of Engi., Tokyo University of Agriculture & Technology in 1986. Employed by YHP Ltd. in the same year, and works at Customer Engineering Dept.","V-Tech Research Co., Kyoto, Japan 604"],"affiliations":[{"raw_affiliation_string":"V-Tech Research Co., Kyoto, Japan 604","institution_ids":[]},{"raw_affiliation_string":"Toshio Sakamoto graduated from Ikuei College in 1983, Electronics Dept., Facul. of Engi., Tokyo University of Agriculture & Technology in 1986. Employed by YHP Ltd. in the same year, and works at Customer Engineering Dept.","institution_ids":["https://openalex.org/I92614990"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033022631","display_name":"Kayoko Kumamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I146230289","display_name":"Omron (Japan)","ror":"https://ror.org/00q0w1h45","country_code":"JP","type":"company","lineage":["https://openalex.org/I146230289"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kayoko Kumamoto","raw_affiliation_strings":["Central Research Center, Omron Tateishi Electronics, Co., Nagaokakyou, Japan 617","Kayoko Kumamoto graduated from Tonan High School, Kyoto in 1976. Employed by Tateishi Electronics Ltd. in the same year. Engaged in development of APL software, programming of the capacitance calculation for a noise analysis system, and analyses of model circuits. Presently at the First Lab. of System Development Dept., Tateishi Electronics, Research Center."],"affiliations":[{"raw_affiliation_string":"Kayoko Kumamoto graduated from Tonan High School, Kyoto in 1976. Employed by Tateishi Electronics Ltd. in the same year. Engaged in development of APL software, programming of the capacitance calculation for a noise analysis system, and analyses of model circuits. Presently at the First Lab. of System Development Dept., Tateishi Electronics, Research Center.","institution_ids":[]},{"raw_affiliation_string":"Central Research Center, Omron Tateishi Electronics, Co., Nagaokakyou, Japan 617","institution_ids":["https://openalex.org/I146230289"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":53},"biblio":{"volume":"19","issue":"1","first_page":"28","last_page":"36"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9994,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9994,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9971,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9957,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/shielded-cable","display_name":"Shielded cable","score":0.70920545},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.5985459},{"id":"https://openalex.org/keywords/guard","display_name":"Guard (computer science)","score":0.58374524}],"concepts":[{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.7760712},{"id":"https://openalex.org/C77590175","wikidata":"https://www.wikidata.org/wiki/Q3506009","display_name":"Shielded cable","level":2,"score":0.70920545},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.6806873},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.6536247},{"id":"https://openalex.org/C138081364","wikidata":"https://www.wikidata.org/wiki/Q852013","display_name":"Shield","level":2,"score":0.6310449},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.5985459},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.59738266},{"id":"https://openalex.org/C141141315","wikidata":"https://www.wikidata.org/wiki/Q2379942","display_name":"Guard (computer science)","level":2,"score":0.58374524},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5028302},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.48830366},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.45684943},{"id":"https://openalex.org/C168993435","wikidata":"https://www.wikidata.org/wiki/Q6501125","display_name":"Ground","level":2,"score":0.44423205},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4235642},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.41631618},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39298934},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36793453},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34089112},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32527542},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.29909602},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2711333},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.12021613},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.08976728},{"id":"https://openalex.org/C5900021","wikidata":"https://www.wikidata.org/wiki/Q163082","display_name":"Petrology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690190103","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.4,"display_name":"Sustainable cities and communities"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":2,"referenced_works":["https://openalex.org/W2032262967","https://openalex.org/W2145163688"],"related_works":["https://openalex.org/W948881177","https://openalex.org/W4206920939","https://openalex.org/W3211049872","https://openalex.org/W2783787126","https://openalex.org/W27383583","https://openalex.org/W2537540583","https://openalex.org/W2364371960","https://openalex.org/W2156032803","https://openalex.org/W2008962604","https://openalex.org/W1582212326"],"abstract_inverted_index":{"Abstract":[0],"With":[1],"the":[2,27,32,40,52,55,61,89,96,105,108,113,116,120,124,126,132,136,148,155,163,182],"recent":[3],"trends":[4],"of":[5,8,13,29,34,42,54,69,91,107,115,123,147,150],"high\u2010density":[6],"packing":[7],"electronic":[9],"circuits":[10],"and":[11,67,74,101,119],"higher\u2010degree":[12],"integration,":[14],"cross":[15],"talks":[16],"between":[17,154],"signal":[18,156],"lines":[19],"have":[20],"become":[21],"a":[22,79,143,172,175],"problem.":[23],"This":[24],"paper":[25],"describes":[26],"effect":[28,53,106],"guard\u2010shielding":[30,56],"on":[31,112],"reduction":[33],"crosstalk":[35,133],"noises.":[36],"In":[37],"relation":[38],"to":[39,139,161],"development":[41],"our":[43],"noise":[44,137],"evaluation":[45],"system":[46],"for":[47],"printed":[48],"circuit":[49,62],"boards":[50],"NESSY,":[51],"was":[57],"examined":[58],"by":[59,75],"dividing":[60],"substrate":[63],"so":[64],"that":[65],"capacitance":[66],"inductance":[68],"each":[70],"division":[71],"is":[72,128,159],"calculated,":[73],"simulating":[76],"them":[77],"with":[78,88,142,174],"partial":[80],"element":[81],"equivalent":[82],"network.":[83],"The":[84,99],"results":[85,90],"were":[86],"compared":[87],"experiments":[92,100],"carried":[93],"out":[94],"under":[95],"same":[97],"conditions.":[98],"simulations":[102],"show":[103],"that:":[104],"guard\u2010shield":[109,127],"depends":[110],"greatly":[111],"condition":[114],"termination":[117,121],"resistances":[118],"conditions":[122],"shield;":[125],"effective":[129],"in":[130],"reducing":[131],"noises":[134],"(e.g.,":[135],"reduces":[138],"half":[140],"even":[141,180],"thin":[144],"shield":[145,164],"line":[146,165],"order":[149],"0.1":[151],"mm":[152],"set":[153],"lines);":[157],"it":[158],"necessary":[160],"ground":[162],"at":[166],"more":[167],"than":[168],"two":[169],"points,":[170],"since":[171],"guard\u2010line":[173],"single":[176],"grounding":[177],"point":[178],"sometimes":[179],"increases":[181],"noise.":[183]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2028209961","counts_by_year":[],"updated_date":"2024-12-14T06:19:50.013230","created_date":"2016-06-24"}