乐胖代购免代理版

{"id":"https://openalex.org/W1969362223","doi":"https://doi.org/10.1002/qre.1051","title":"Process selection for higher production yield based on capability index S_pk","display_name":"Process selection for higher production yield based on capability index S_pk","publication_year":2009,"publication_date":"2009-08-17","ids":{"openalex":"https://openalex.org/W1969362223","doi":"https://doi.org/10.1002/qre.1051","mag":"1969362223"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1002/qre.1051","pdf_url":null,"source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045146838","display_name":"Chen\u2010ju Lin","orcid":"https://orcid.org/0000-0003-3423-4625"},"institutions":[{"id":"https://openalex.org/I99908691","display_name":"Yuan Ze University","ror":"https://ror.org/01fv1ds98","country_code":"TW","type":"education","lineage":["https://openalex.org/I99908691"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chen\u2010ju Lin","raw_affiliation_strings":["Yuan Ze University"],"affiliations":[{"raw_affiliation_string":"Yuan Ze University","institution_ids":["https://openalex.org/I99908691"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111582791","display_name":"W. L. Pearn","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"W. L. Pearn","raw_affiliation_strings":["Department of Industrial Engineering and Management"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Management","institution_ids":[]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":4330,"currency":"USD","value_usd":4330},"apc_paid":null,"fwci":2.263,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":32,"citation_normalized_percentile":{"value":0.915045,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":92},"biblio":{"volume":"26","issue":"3","first_page":"247","last_page":"258"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9867,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11798","display_name":"Optimal Experimental Design Methods","score":0.9818,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/factory","display_name":"Factory (object-oriented programming)","score":0.72678024},{"id":"https://openalex.org/keywords/process-capability-index","display_name":"Process capability index","score":0.50249386},{"id":"https://openalex.org/keywords/process-capability","display_name":"Process capability","score":0.42654786}],"concepts":[{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.79779756},{"id":"https://openalex.org/C40149104","wikidata":"https://www.wikidata.org/wiki/Q5620977","display_name":"Factory (object-oriented programming)","level":2,"score":0.72678024},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.63780355},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.59301007},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5457749},{"id":"https://openalex.org/C2777382242","wikidata":"https://www.wikidata.org/wiki/Q6017816","display_name":"Index (typography)","level":2,"score":0.5152438},{"id":"https://openalex.org/C190190378","wikidata":"https://www.wikidata.org/wiki/Q1192625","display_name":"Process capability index","level":3,"score":0.50249386},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.49183226},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.47230887},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44182706},{"id":"https://openalex.org/C91439571","wikidata":"https://www.wikidata.org/wiki/Q1279773","display_name":"Process capability","level":3,"score":0.42654786},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.4232427},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.42262727},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.35736537},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34984288},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.34131426},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33559895},{"id":"https://openalex.org/C174998907","wikidata":"https://www.wikidata.org/wiki/Q357662","display_name":"Work in process","level":2,"score":0.23513359},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17283794},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.1494545},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.10298884},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.08014032},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1002/qre.1051","pdf_url":null,"source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_indexed_in_scopus":true,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":11,"referenced_works":["https://openalex.org/W152569421","https://openalex.org/W1530884268","https://openalex.org/W1593449005","https://openalex.org/W1964010339","https://openalex.org/W1968822837","https://openalex.org/W1975975526","https://openalex.org/W2039258911","https://openalex.org/W2040672440","https://openalex.org/W2092940801","https://openalex.org/W2738600808","https://openalex.org/W4230917442"],"related_works":["https://openalex.org/W2885310580","https://openalex.org/W2741600983","https://openalex.org/W2391169150","https://openalex.org/W2187065407","https://openalex.org/W2171447504","https://openalex.org/W2128319694","https://openalex.org/W2083138094","https://openalex.org/W2035220179","https://openalex.org/W2015253822","https://openalex.org/W1968597279"],"abstract_inverted_index":{"Abstract":[0],"Process":[1],"selection":[2,27,80,87],"is":[3,53,117],"the":[4,12,25,31,73,79,121,124,132],"problem":[5,28,130],"of":[6,72,123],"comparing":[7,65,106],"two":[8,38,62,66,107],"processes":[9,40,67,116],"and":[10,41,89],"selecting":[11],"one":[13,43],"that":[14,44],"has":[15,45],"a":[16,128],"higher":[17,46],"capability":[18],"value.":[19],"In":[20],"this":[21,57],"paper,":[22],"we":[23],"consider":[24],"process":[26],"by":[29],"using":[30],"yield":[32],"index":[33],"S":[34],"pk":[35],"to":[36,55,77,100,119,127],"compare":[37],"production":[39,47,115],"select":[42],"yield.":[48],"An":[49,102],"analytical":[50],"exact":[51],"approach":[52,126],"proposed":[54,125],"solve":[56],"problem.":[58],"Testing":[59],"hypotheses":[60],"with":[61],"phases":[63],"for":[64,85],"are":[68,75,92],"developed.":[69],"Critical":[70],"values":[71],"test":[74],"obtained":[76],"determine":[78],"decisions.":[81],"Sample":[82],"sizes":[83],"required":[84],"designated":[86],"power":[88],"confidence":[90],"level":[91],"also":[93],"investigated.":[94],"The":[95],"results":[96],"provide":[97],"useful":[98],"information":[99],"practitioners.":[101],"application":[103],"example":[104],"on":[105],"thin\u2010film":[108],"transistor":[109],"(TFT)":[110],"type":[111],"liquid\u2010crystal":[112],"display":[113],"(LCD)":[114],"presented":[118],"illustrate":[120],"practicality":[122],"real":[129],"in":[131],"factory.":[133],"Copyright":[134],"\u00a9":[135],"2009":[136],"John":[137],"Wiley":[138],"&":[139],"Sons,":[140],"Ltd.":[141]},"abstract_inverted_index_v3":null,"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W1969362223","counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":4}],"updated_date":"2025-03-19T06:41:30.823078","created_date":"2016-06-24"}