{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T03:10:12Z","timestamp":1716952212573},"reference-count":22,"publisher":"MDPI AG","issue":"12","license":[{"start":{"date-parts":[[2009,12,21]],"date-time":"2009-12-21T00:00:00Z","timestamp":1261353600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"This paper describes novel design concepts and some advanced techniques proposed for increasing the accuracy of low cost impedance measuring devices without reduction of operational speed. The proposed structural method for algorithmic error correction and iterating correction method provide linearization of transfer functions of the measuring sensor and signal conditioning converter, which contribute the principal additive and relative measurement errors. Some measuring systems have been implemented in order to estimate in practice the performance of the proposed methods. Particularly, a measuring system for analysis of C-V, G-V characteristics has been designed and constructed. It has been tested during technological process control of charge-coupled device CCD manufacturing. The obtained results are discussed in order to define a reasonable range of applied methods, their utility, and performance.<\/jats:p>","DOI":"10.3390\/s91210341","type":"journal-article","created":{"date-parts":[[2009,12,22]],"date-time":"2009-12-22T15:56:36Z","timestamp":1261497396000},"page":"10341-10355","source":"Crossref","is-referenced-by-count":5,"title":["Algorithmic Error Correction of Impedance Measuring Sensors"],"prefix":"10.3390","volume":"9","author":[{"given":"Oleg","family":"Starostenko","sequence":"first","affiliation":[{"name":"Research Center CENTIA, Department of Computing, Electronics and Mechatronics, Universidad de las Am\u00e9ricas, Puebla, 72820, M\u00e9xico"}]},{"given":"Vicente","family":"Alarcon-Aquino","sequence":"additional","affiliation":[{"name":"Research Center CENTIA, Department of Computing, Electronics and Mechatronics, Universidad de las Am\u00e9ricas, Puebla, 72820, M\u00e9xico"}]},{"given":"Wilmar","family":"Hernandez","sequence":"additional","affiliation":[{"name":"Department of Circuits and Systems in the EUIT de Telecomunicaci\u00f3n, Universidad Polit\u00e9cnica de Madrid, Campus Sur UPM, Ctra. Valencia km 7, 28031, Madrid, Spain"}]},{"given":"Oleg","family":"Sergiyenko","sequence":"additional","affiliation":[{"name":"Engineering Institute, Autonomous University of Baja California, Blvd. Benito Ju\u00e1rez y Calle de la Normal S\/N, col. Insurgentes Este, 21280, Mexicali, Baja California, M\u00e9xico"}]},{"given":"Vira","family":"Tyrsa","sequence":"additional","affiliation":[{"name":"Universidad Polit\u00e9cnica de Baja California, Calle de la Claridad S\/N, Col Plutarco El\u00edas Calles, 21376, Mexicali, Baja California, M\u00e9xico"}]}],"member":"1968","published-online":{"date-parts":[[2009,12,21]]},"reference":[{"key":"ref_1","unstructured":"Bentley, J.P. (2005). Principles of Measurement Systems, Pearson, Prentice Hall. [4th ed.]."},{"key":"ref_2","unstructured":"(2008). 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[2nd ed.]."},{"key":"ref_17","unstructured":"Available online: http:\/\/boontonconnection.com\/ (accessed on 16 November 2009)."},{"key":"ref_18","doi-asserted-by":"crossref","first-page":"57004","DOI":"10.1209\/0295-5075\/83\/57004","article-title":"Point-contact spectroscopy of iron-based layered superconductor LaO0.9F0.1\u2212\u03b4FeAs","volume":"83","author":"Shan","year":"2008","journal-title":"Europhys. Lett."},{"key":"ref_19","unstructured":"Available online: http:\/\/www.ni.com\/gpib\/ (accessed on 30 March 2009)."},{"key":"ref_20","first-page":"136","article-title":"Signal frequency measurement by rational approximations","volume":"42","author":"Sergiyenko","year":"2009","journal-title":"Elsevier Measure."},{"key":"ref_21","unstructured":"Hern\u00e1ndez-Balbuena, D., Sergiyenko, O., Tyrsa, V., and Burtseva, L. (, January June). Frequency measurement method for Mechatronic and Telecommunication applications. Cambridge, UK."},{"key":"ref_22","unstructured":"Hern\u00e1ndez-Balbuena, D., Sergiyenko, O., Tyrsa, V., and Burtseva, L. (, January September). Method for fast and accurate frequency measurement. Florence, Italy."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/9\/12\/10341\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T02:42:30Z","timestamp":1716950550000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/9\/12\/10341"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,12,21]]},"references-count":22,"journal-issue":{"issue":"12","published-online":{"date-parts":[[2009,12]]}},"alternative-id":["s91210341"],"URL":"https:\/\/doi.org\/10.3390\/s91210341","relation":{},"ISSN":["1424-8220"],"issn-type":[{"value":"1424-8220","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,12,21]]}}}