{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T14:51:31Z","timestamp":1740149491275,"version":"3.37.3"},"reference-count":29,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2021,12,22]],"date-time":"2021-12-22T00:00:00Z","timestamp":1640131200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"The measurement of the phased array antenna (PAA) is completely different from the traditional antenna, due to its multi beam patterns. Usually, each beam pattern of the PAA needs a separate measurement, which makes the overall time extremely long. Thus, the traditional method can no longer meet the efficiency and cost requirements of new PAA measurement. In this paper, a pattern reconstruction method is proposed which significantly reduce the measurement time of multi-beam PAAs. With the known array element patterns (AEP) and theoretical weighted port excitation of the beams, any beam pattern can be predicted by measuring only a certain beam pattern, due to the element excitation coefficient (including the matching, mutual coupling, and manufacturing factors, etc.) of the specific PAA being calculated. The approach has low reconstruction error in term of beam pointing accuracy, side lobe, and co-polar and cross-polar patterns while being validated for large scanning range. Through theoretical derivation and experiments, the effectiveness of the method is verified, and the testing efficiency of the phased array antenna can be improved by 10 times or even more.<\/jats:p>","DOI":"10.3390\/s22010047","type":"journal-article","created":{"date-parts":[[2021,12,23]],"date-time":"2021-12-23T07:02:57Z","timestamp":1640242977000},"page":"47","source":"Crossref","is-referenced-by-count":1,"title":["Rapid Test Method for Multi-Beam Profile of Phased Array Antennas"],"prefix":"10.3390","volume":"22","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2961-3276","authenticated-orcid":false,"given":"Qingchun","family":"Luo","sequence":"first","affiliation":[{"name":"Department of Electrical and Information Engineering, Hunan University, Changsha 410082, China"}]},{"given":"Yantao","family":"Zhou","sequence":"additional","affiliation":[{"name":"Department of Electrical and Information Engineering, Hunan University, Changsha 410082, China"}]},{"given":"Yihong","family":"Qi","sequence":"additional","affiliation":[{"name":"Frontier Academic Center, Pengcheng Laboratory, Shenzhen 518102, China"}]},{"given":"Pu","family":"Ye","sequence":"additional","affiliation":[{"name":"General Test Systems Inc., Shenzhen 518102, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5613-2454","authenticated-orcid":false,"given":"Francesco","family":"de Paulis","sequence":"additional","affiliation":[{"name":"Department of Industrial and Information Engineering and Economics, University of L\u2019Aquila, 64100 L\u2019Aquila, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2428-5827","authenticated-orcid":false,"given":"Lie","family":"Liu","sequence":"additional","affiliation":[{"name":"General Test Systems Inc., Shenzhen 518102, China"}]}],"member":"1968","published-online":{"date-parts":[[2021,12,22]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Anim, K., Lee, J.-N., and Jung, Y.-B. 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